RosettaNet XML Message Guidelines
SemiconductorTestDataNotification
( 03 Dec 2007 13:44:02 )
This document has been prepared by RosettaNet (http://www.rosettanet.org) from requirements gathered during the cluster/segment workshops and in conformance with the RosettaNet methodology.

11SemiconductorTestDataNotification
20..1|-- DocumentHeader
30..1|   |-- CorrelationInformation
40..1|   |   |-- ContractInformation
50..1|   |   |   |-- ContractIdentifier
60..1|   |   |   |-- ContractType
70..1|   |   |-- RequestingDocumentInformation
80..1|   |   |   |-- BusinessProcessInstanceIdentifier
90..1|   |   |   |-- RequestingDocumentCreationDateTime
101|   |   |   |-- RequestingDocumentInstanceIdentifier
110..1|   |   |   |-- ResponseDateTime
121|   |-- DocumentInformation
131|   |   |-- Creation
141|   |   |-- DocumentIdentification
151|   |   |   |-- Identifier
160..1|   |   |   |-- Type
171|   |   |   |-- Choice
181|   |   |   |   |-- StandardDocumentIdentification
190..1|   |   |   |   |   |-- Standard
201|   |   |   |   |   |-- Version
211|   |   |   |   |-- TpirPipIdentification
220..1|   |   |   |   |   |-- FileType
231|   |   |   |   |   |-- PartnerId
241|   |   |   |   |   |-- PipIdentifier
251|   |   |   |   |   |-- PipVersion
260..1|   |   |   |   |   |-- TpirBusinessProcessIdentifier
271|   |   |   |   |   |-- TpirPipVersion
280..1|   |   |   |   |   |-- Uri
290..1|   |   |-- DocumentManifest
301..n|   |   |   |-- ManifestItem
310..1|   |   |   |   |-- Description
320..1|   |   |   |   |-- Language
330..1|   |   |   |   |-- Length
341|   |   |   |   |-- MimeTypeQualifier
351|   |   |   |   |-- UniversalResourceIdentifier
360..1|   |   |   |-- MultipleType
371|   |   |   |-- NumberOfItems
380..1|   |   |-- DocumentSecurity
391|   |   |   |-- NonRepudiableReceipt
401|   |   |   |-- PersistentEncryption
411|   |   |   |-- PersistentSignature
420..1|   |-- HeaderVersion
431|   |-- Receiver
440..1|   |   |-- BusinessServiceInformation
451|   |   |   |-- ActionName
461|   |   |   |-- ProcessIdentifier
470..1|   |   |   |-- ProcessReference
480..1|   |   |   |-- ProcessState
491|   |   |   |-- ServiceName
500..n|   |   |-- ContactInformation
511|   |   |   |-- Contact
520..1|   |   |   |-- Email
530..1|   |   |   |-- Fax
540..1|   |   |   |-- Identifier
550..1|   |   |   |-- Phone
561|   |   |-- PartnerIdentification
570..1|   |   |   |-- PartnerName
581|   |   |   |-- Choice
591..n|   |   |   |   |-- AlternativeIdentifier
601|   |   |   |   |   |-- Authority
611|   |   |   |   |   |-- Identifier
621|   |   |   |   |-- DUNS
631|   |   |   |   |-- DUNSPlus4
641|   |   |   |   |-- GLN
651|   |-- Sender
660..1|   |   |-- BusinessServiceInformation
671|   |   |   |-- ActionName
681|   |   |   |-- ProcessIdentifier
690..1|   |   |   |-- ProcessReference
700..1|   |   |   |-- ProcessState
711|   |   |   |-- ServiceName
720..n|   |   |-- ContactInformation
731|   |   |   |-- Contact
740..1|   |   |   |-- Email
750..1|   |   |   |-- Fax
760..1|   |   |   |-- Identifier
770..1|   |   |   |-- Phone
781|   |   |-- PartnerIdentification
790..1|   |   |   |-- PartnerName
801|   |   |   |-- Choice
811..n|   |   |   |   |-- AlternativeIdentifier
821|   |   |   |   |   |-- Authority
831|   |   |   |   |   |-- Identifier
841|   |   |   |   |-- DUNS
851|   |   |   |   |-- DUNSPlus4
861|   |   |   |   |-- GLN
871..n|-- LotReport
880..1|   |-- BALocation
890..1|   |   |-- GlobalWorkInProcessLocationCode
900..1|   |   |-- Location
911|   |   |   |-- Choice
921..n|   |   |   |   |-- AlternativeIdentifier
931|   |   |   |   |   |-- Authority
941|   |   |   |   |   |-- Identifier
951|   |   |   |   |-- DUNS
961|   |   |   |   |-- DUNSPlus4
971|   |   |   |   |-- GLN
980..1|   |   |-- PhysicalAddress
991|   |   |   |-- AddressLine1
1000..1|   |   |   |-- AddressLine2
1010..1|   |   |   |-- AddressLine3
1020..1|   |   |   |-- AddressLine4
1030..1|   |   |   |-- AddressLine5
1041|   |   |   |-- CityName
1051|   |   |   |-- Country
1060..1|   |   |   |-- CountrySubdivision
1070..1|   |   |   |-- PostalCode
1080..1|   |   |   |-- PostOfficeBox
1090..1|   |   |-- ProprietaryLabel
1100..1|   |-- Confidentiality
1110..1|   |-- FabLocation
1120..1|   |   |-- GlobalWorkInProcessLocationCode
1130..1|   |   |-- Location
1141|   |   |   |-- Choice
1151..n|   |   |   |   |-- AlternativeIdentifier
1161|   |   |   |   |   |-- Authority
1171|   |   |   |   |   |-- Identifier
1181|   |   |   |   |-- DUNS
1191|   |   |   |   |-- DUNSPlus4
1201|   |   |   |   |-- GLN
1210..1|   |   |-- PhysicalAddress
1221|   |   |   |-- AddressLine1
1230..1|   |   |   |-- AddressLine2
1240..1|   |   |   |-- AddressLine3
1250..1|   |   |   |-- AddressLine4
1260..1|   |   |   |-- AddressLine5
1271|   |   |   |-- CityName
1281|   |   |   |-- Country
1290..1|   |   |   |-- CountrySubdivision
1300..1|   |   |   |-- PostalCode
1310..1|   |   |   |-- PostOfficeBox
1320..1|   |   |-- ProprietaryLabel
1330..1|   |-- FileDataVersion
1340..1|   |-- FinalTestLocation
1350..1|   |   |-- GlobalWorkInProcessLocationCode
1360..1|   |   |-- Location
1371|   |   |   |-- Choice
1381..n|   |   |   |   |-- AlternativeIdentifier
1391|   |   |   |   |   |-- Authority
1401|   |   |   |   |   |-- Identifier
1411|   |   |   |   |-- DUNS
1421|   |   |   |   |-- DUNSPlus4
1431|   |   |   |   |-- GLN
1440..1|   |   |-- PhysicalAddress
1451|   |   |   |-- AddressLine1
1460..1|   |   |   |-- AddressLine2
1470..1|   |   |   |-- AddressLine3
1480..1|   |   |   |-- AddressLine4
1490..1|   |   |   |-- AddressLine5
1501|   |   |   |-- CityName
1511|   |   |   |-- Country
1520..1|   |   |   |-- CountrySubdivision
1530..1|   |   |   |-- PostalCode
1540..1|   |   |   |-- PostOfficeBox
1550..1|   |   |-- ProprietaryLabel
1560..1|   |-- GlobalLotStatusCode
1571|   |-- Lot
1580..n|   |   |-- AlternativePN
1590..1|   |   |   |-- ProductName
1600..1|   |   |   |-- Revision
1611|   |   |   |-- Choice
1621..n|   |   |   |   |-- AlternativeIdentifier
1631|   |   |   |   |   |-- Authority
1641|   |   |   |   |   |-- Identifier
1651|   |   |   |   |-- GTIN
1660..n|   |   |-- ContractorLotNumber
1670..1|   |   |   |-- IdSuffix
1680..1|   |   |   |-- ManufacturingID
1690..1|   |   |-- CustomerLotNumber
1700..1|   |   |   |-- IdSuffix
1710..1|   |   |   |-- ManufacturingID
1720..1|   |   |-- CustomerPN
1730..1|   |   |   |-- ProductName
1740..1|   |   |   |-- Revision
1751|   |   |   |-- Choice
1761..n|   |   |   |   |-- AlternativeIdentifier
1771|   |   |   |   |   |-- Authority
1781|   |   |   |   |   |-- Identifier
1791|   |   |   |   |-- GTIN
1800..1|   |   |-- LotType
1810..1|   |   |-- NominalSize
1820..1|   |   |-- ProductName
1830..n|   |   |-- SubLot
1840..1|   |   |   |-- IdSuffix
1850..1|   |   |   |-- ManufacturingID
1860..1|   |   |-- Technology
1870..n|   |-- OtherLocation
1880..1|   |   |-- GlobalWorkInProcessLocationCode
1890..1|   |   |-- Location
1901|   |   |   |-- Choice
1911..n|   |   |   |   |-- AlternativeIdentifier
1921|   |   |   |   |   |-- Authority
1931|   |   |   |   |   |-- Identifier
1941|   |   |   |   |-- DUNS
1951|   |   |   |   |-- DUNSPlus4
1961|   |   |   |   |-- GLN
1970..1|   |   |-- PhysicalAddress
1981|   |   |   |-- AddressLine1
1990..1|   |   |   |-- AddressLine2
2000..1|   |   |   |-- AddressLine3
2010..1|   |   |   |-- AddressLine4
2020..1|   |   |   |-- AddressLine5
2031|   |   |   |-- CityName
2041|   |   |   |-- Country
2050..1|   |   |   |-- CountrySubdivision
2060..1|   |   |   |-- PostalCode
2070..1|   |   |   |-- PostOfficeBox
2080..1|   |   |-- ProprietaryLabel
2090..1|   |-- PartnerSecurityID
2100..n|   |-- Pin
2110..1|   |   |-- Channel
2120..1|   |   |-- ChipPinName
2130..1|   |   |-- ModulePinName
2141|   |   |-- PositionID
2150..1|   |   |-- Signal
2160..1|   |   |-- Type
2170..1|   |-- QualityCode
2180..1|   |-- RetestSorts
2190..1|   |-- RetestType
2200..n|   |-- Sort
2210..1|   |   |-- BinAssignment
2220..1|   |   |-- HardSort
2230..1|   |   |-- HardSortName
2240..1|   |   |-- HardSortSymbol
2250..n|   |   |-- PassVisualInspection
2260..1|   |   |-- RepairableFlag
2270..n|   |   |-- SortCount
2281|   |   |-- SortID
2290..1|   |   |-- SortName
2300..1|   |   |-- SortSymbol
2310..1|   |   |-- SortWeight
2321|   |-- TestOperationDescription
2330..1|   |   |-- LotEndDateTime
2340..1|   |   |-- LotStartDateTime
2350..1|   |   |-- LotStatusCompletion
2361..n|   |   |-- TestOpIdentification
2371..n|   |   |   |-- SetupReport
2380..n|   |   |   |   |-- ChipPeriodicity
2390..1|   |   |   |   |   |-- Description
2401|   |   |   |   |   |-- FloatCoordinate
2410..1|   |   |   |   |   |   |-- X
2420..1|   |   |   |   |   |   |-- Y
2430..1|   |   |   |   |   |   |-- Z
2440..1|   |   |   |   |-- CoordinateFlag
2451..n|   |   |   |   |-- Dimension
2460..1|   |   |   |   |   |-- Axis
2470..1|   |   |   |   |   |-- Maximum
2480..1|   |   |   |   |   |-- Minimum
2490..1|   |   |   |   |-- HeadID
2500..1|   |   |   |   |-- Notch
2510..1|   |   |   |   |-- ParallelTest
2520..1|   |   |   |   |-- ProbeName
2530..1|   |   |   |   |-- Quadrant
2540..1|   |   |   |   |-- SampleRate
2550..n|   |   |   |   |-- SoftwareReport
2560..1|   |   |   |   |   |-- BuildID
2570..1|   |   |   |   |   |-- Name
2580..1|   |   |   |   |   |-- Type
2590..1|   |   |   |   |   |-- Version
2601|   |   |   |   |-- Tester
2611|   |   |   |   |   |-- EquipmentID
2620..n|   |   |   |   |   |-- HardwareSets
2630..n|   |   |   |   |   |   |-- TesterAttachment
2640..1|   |   |   |   |   |   |   |-- AttachID
2650..1|   |   |   |   |   |   |   |-- AttachName
2660..n|   |   |   |   |   |   |-- TesterFEH
2670..1|   |   |   |   |   |   |   |-- AttachmentID
2680..1|   |   |   |   |   |   |   |-- Name
2690..1|   |   |   |   |   |   |   |-- TestingPeriod
2700..1|   |   |   |   |   |   |   |   |-- End
2710..1|   |   |   |   |   |   |   |   |-- Start
2720..1|   |   |   |   |   |   |   |-- Type
2731|   |   |   |   |-- TestSetup
2740..1|   |   |   |   |   |-- CustomerTestProgramEC
2750..1|   |   |   |   |   |-- CustomerTestProgramName
2760..1|   |   |   |   |   |-- PrimaryIdentifier
2770..1|   |   |   |   |   |-- SetupName
2780..1|   |   |   |   |   |-- SetupVersion
2790..1|   |   |   |   |   |-- TesterControlSoftware
2800..1|   |   |   |   |   |-- TesterType
2810..1|   |   |   |   |   |-- TestProgEC
2821|   |   |   |   |   |-- TestProgramName
2830..1|   |   |   |   |   |-- TestTemperature
2841|   |   |   |   |   |   |-- TargetTestTemperature
2851|   |   |   |   |   |   |-- UnitOfMeasure
2860..1|   |   |   |-- SlotID
2870..1|   |   |   |-- TestLevel
2881|   |   |   |-- TestMode
2890..1|   |   |   |-- WaferShortID
2900..1|   |   |   |-- WaferTestingPeriod
2910..1|   |   |   |   |-- End
2920..1|   |   |   |   |-- Start
2930..1|   |   |   |-- WaferUniqueID
2941|   |   |   |-- Choice
2951|   |   |   |   |-- FinalTest
2961..n|   |   |   |   |   |-- Die
2970..1|   |   |   |   |   |   |-- ChipPN
2980..1|   |   |   |   |   |   |-- DieReticlePN
2990..1|   |   |   |   |   |   |-- PackageDescription
3000..1|   |   |   |   |   |   |-- PartText
3010..1|   |   |   |   |   |   |-- SerialNumber
3021..n|   |   |   |   |   |   |-- TestReport
3030..n|   |   |   |   |   |   |   |-- BuildInfoReport
3040..1|   |   |   |   |   |   |   |   |-- ComponentDescription
3050..1|   |   |   |   |   |   |   |   |-- ComponentID
3060..1|   |   |   |   |   |   |   |   |-- ComponentLocation
3071|   |   |   |   |   |   |   |   |-- ComponentNumber
3080..1|   |   |   |   |   |   |   |   |-- ComponentParentNumber
3090..1|   |   |   |   |   |   |   |   |-- ComponentSerialNumber
3100..1|   |   |   |   |   |   |   |   |-- ComponentType
3110..1|   |   |   |   |   |   |   |   |-- UserSite
3120..n|   |   |   |   |   |   |   |-- CalcFailReport
3130..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3141|   |   |   |   |   |   |   |   |-- ErrorCode
3150..1|   |   |   |   |   |   |   |   |-- FailValue
3161|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3170..1|   |   |   |   |   |   |   |   |-- Sequence
3180..1|   |   |   |   |   |   |   |   |-- UserSite
3190..n|   |   |   |   |   |   |   |-- DieReport
3200..1|   |   |   |   |   |   |   |   |-- CharFlag
3210..1|   |   |   |   |   |   |   |   |-- CompositeFailSort
3220..1|   |   |   |   |   |   |   |   |-- DieTestingPeriod
3230..1|   |   |   |   |   |   |   |   |   |-- End
3240..1|   |   |   |   |   |   |   |   |   |-- Start
3250..1|   |   |   |   |   |   |   |   |-- FirstFailSort
3260..1|   |   |   |   |   |   |   |   |-- GangTest
3270..1|   |   |   |   |   |   |   |   |   |-- IntCoordinate
3280..1|   |   |   |   |   |   |   |   |   |   |-- X
3290..1|   |   |   |   |   |   |   |   |   |   |-- Y
3300..1|   |   |   |   |   |   |   |   |   |   |-- Z
3311|   |   |   |   |   |   |   |   |   |-- StripTestID
3321|   |   |   |   |   |   |   |   |   |-- StripTestOrientation
3330..1|   |   |   |   |   |   |   |   |-- IntCoordinate
3340..1|   |   |   |   |   |   |   |   |   |-- X
3350..1|   |   |   |   |   |   |   |   |   |-- Y
3360..1|   |   |   |   |   |   |   |   |   |-- Z
3370..1|   |   |   |   |   |   |   |   |-- UserSite
3380..n|   |   |   |   |   |   |   |-- ECIDReport
3390..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3400..1|   |   |   |   |   |   |   |   |-- DecodedID
3410..1|   |   |   |   |   |   |   |   |-- Decoder
3420..1|   |   |   |   |   |   |   |   |-- ECIDType
3431|   |   |   |   |   |   |   |   |-- IntCoordinate
3440..1|   |   |   |   |   |   |   |   |   |-- X
3450..1|   |   |   |   |   |   |   |   |   |-- Y
3460..1|   |   |   |   |   |   |   |   |   |-- Z
3470..1|   |   |   |   |   |   |   |   |-- RawBits
3480..n|   |   |   |   |   |   |   |-- FPReport
3490..1|   |   |   |   |   |   |   |   |-- BufferNumber
3500..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3510..1|   |   |   |   |   |   |   |   |-- FailLimExceeded
3521|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3530..1|   |   |   |   |   |   |   |   |-- TestResult
3540..1|   |   |   |   |   |   |   |   |-- UserSite
3550..1|   |   |   |   |   |   |   |   |-- UsingPatternCnts
3560..1|   |   |   |   |   |   |   |   |-- VectorReport
3570..1|   |   |   |   |   |   |   |   |   |-- Address1
3580..1|   |   |   |   |   |   |   |   |   |-- Address2
3590..1|   |   |   |   |   |   |   |   |   |-- CycleCnt
3601|   |   |   |   |   |   |   |   |   |-- Pins
3611|   |   |   |   |   |   |   |   |   |-- Status
3620..1|   |   |   |   |   |   |   |   |   |-- VectorLabel
3630..n|   |   |   |   |   |   |   |-- FunctionalPinReport
3640..1|   |   |   |   |   |   |   |   |-- Bits
3650..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3661|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3670..1|   |   |   |   |   |   |   |   |-- TestResult
3680..1|   |   |   |   |   |   |   |   |-- UserSite
3690..n|   |   |   |   |   |   |   |-- PPReport
3700..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3710..n|   |   |   |   |   |   |   |   |-- PPResult
3721|   |   |   |   |   |   |   |   |   |-- Measurement
3731|   |   |   |   |   |   |   |   |   |-- Pin
3740..1|   |   |   |   |   |   |   |   |   |-- TestResult
3751|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3760..1|   |   |   |   |   |   |   |   |-- UserSite
3770..n|   |   |   |   |   |   |   |-- PRReport
3780..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3791|   |   |   |   |   |   |   |   |-- Measurement
3801|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3810..1|   |   |   |   |   |   |   |   |-- TesterAlarm
3820..1|   |   |   |   |   |   |   |   |-- TestResult
3830..1|   |   |   |   |   |   |   |   |-- UserSite
3840..n|   |   |   |   |   |   |   |-- StringReport
3850..1|   |   |   |   |   |   |   |   |-- ComponentNumber
3860..1|   |   |   |   |   |   |   |   |-- Keyword
3870..1|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
3880..1|   |   |   |   |   |   |   |   |-- UserSite
3890..1|   |   |   |   |   |   |   |   |-- Value
3900..n|   |   |   |   |   |   |   |-- TestMap
3910..1|   |   |   |   |   |   |   |   |-- CenterX
3920..1|   |   |   |   |   |   |   |   |-- CenterY
3930..1|   |   |   |   |   |   |   |   |-- LogicalMax
3940..1|   |   |   |   |   |   |   |   |-- LogicalMin
3950..1|   |   |   |   |   |   |   |   |-- MeasurementUnit
3961|   |   |   |   |   |   |   |   |   |-- Choice
3971|   |   |   |   |   |   |   |   |   |   |-- ProprietaryUnits
3981|   |   |   |   |   |   |   |   |   |   |   |-- Units
3991|   |   |   |   |   |   |   |   |   |   |-- UnitOfMeasure
4000..1|   |   |   |   |   |   |   |   |-- PosDirX
4010..1|   |   |   |   |   |   |   |   |-- PosDirY
4020..1|   |   |   |   |   |   |   |   |-- RetDieRelationX
4030..1|   |   |   |   |   |   |   |   |-- RetDieRelationY
4040..1|   |   |   |   |   |   |   |   |-- RetDimensionX
4050..1|   |   |   |   |   |   |   |   |-- RetDimensionY
4060..1|   |   |   |   |   |   |   |   |-- WaferCoordinate
4070..1|   |   |   |   |   |   |   |   |   |-- MaxX
4080..1|   |   |   |   |   |   |   |   |   |-- MaxY
4090..1|   |   |   |   |   |   |   |   |   |-- MinX
4100..1|   |   |   |   |   |   |   |   |   |-- MinY
4110..n|   |   |   |   |   |-- YieldReport
4120..1|   |   |   |   |   |   |-- GoodDieQuantity
4130..1|   |   |   |   |   |   |-- GrossDiePerWafer
4140..1|   |   |   |   |   |   |-- OtherDefectQuantity
4150..1|   |   |   |   |   |   |-- TestQty
4160..1|   |   |   |   |   |   |-- TestYld
4170..1|   |   |   |   |   |   |-- TotalFunctionalDie
4181|   |   |   |   |-- PCM
4191..n|   |   |   |   |   |-- Die
4200..1|   |   |   |   |   |   |-- ChipPN
4210..1|   |   |   |   |   |   |-- DieReticlePN
4220..1|   |   |   |   |   |   |-- PackageDescription
4230..1|   |   |   |   |   |   |-- PartText
4240..1|   |   |   |   |   |   |-- SerialNumber
4251..n|   |   |   |   |   |   |-- TestReport
4260..n|   |   |   |   |   |   |   |-- BuildInfoReport
4270..1|   |   |   |   |   |   |   |   |-- ComponentDescription
4280..1|   |   |   |   |   |   |   |   |-- ComponentID
4290..1|   |   |   |   |   |   |   |   |-- ComponentLocation
4301|   |   |   |   |   |   |   |   |-- ComponentNumber
4310..1|   |   |   |   |   |   |   |   |-- ComponentParentNumber
4320..1|   |   |   |   |   |   |   |   |-- ComponentSerialNumber
4330..1|   |   |   |   |   |   |   |   |-- ComponentType
4340..1|   |   |   |   |   |   |   |   |-- UserSite
4350..n|   |   |   |   |   |   |   |-- CalcFailReport
4360..1|   |   |   |   |   |   |   |   |-- ComponentNumber
4371|   |   |   |   |   |   |   |   |-- ErrorCode
4380..1|   |   |   |   |   |   |   |   |-- FailValue
4391|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
4400..1|   |   |   |   |   |   |   |   |-- Sequence
4410..1|   |   |   |   |   |   |   |   |-- UserSite
4420..n|   |   |   |   |   |   |   |-- DieReport
4430..1|   |   |   |   |   |   |   |   |-- CharFlag
4440..1|   |   |   |   |   |   |   |   |-- CompositeFailSort
4450..1|   |   |   |   |   |   |   |   |-- DieTestingPeriod
4460..1|   |   |   |   |   |   |   |   |   |-- End
4470..1|   |   |   |   |   |   |   |   |   |-- Start
4480..1|   |   |   |   |   |   |   |   |-- FirstFailSort
4490..1|   |   |   |   |   |   |   |   |-- GangTest
4500..1|   |   |   |   |   |   |   |   |   |-- IntCoordinate
4510..1|   |   |   |   |   |   |   |   |   |   |-- X
4520..1|   |   |   |   |   |   |   |   |   |   |-- Y
4530..1|   |   |   |   |   |   |   |   |   |   |-- Z
4541|   |   |   |   |   |   |   |   |   |-- StripTestID
4551|   |   |   |   |   |   |   |   |   |-- StripTestOrientation
4560..1|   |   |   |   |   |   |   |   |-- IntCoordinate
4570..1|   |   |   |   |   |   |   |   |   |-- X
4580..1|   |   |   |   |   |   |   |   |   |-- Y
4590..1|   |   |   |   |   |   |   |   |   |-- Z
4600..1|   |   |   |   |   |   |   |   |-- UserSite
4610..n|   |   |   |   |   |   |   |-- ECIDReport
4620..1|   |   |   |   |   |   |   |   |-- ComponentNumber
4630..1|   |   |   |   |   |   |   |   |-- DecodedID
4640..1|   |   |   |   |   |   |   |   |-- Decoder
4650..1|   |   |   |   |   |   |   |   |-- ECIDType
4661|   |   |   |   |   |   |   |   |-- IntCoordinate
4670..1|   |   |   |   |   |   |   |   |   |-- X
4680..1|   |   |   |   |   |   |   |   |   |-- Y
4690..1|   |   |   |   |   |   |   |   |   |-- Z
4700..1|   |   |   |   |   |   |   |   |-- RawBits
4710..n|   |   |   |   |   |   |   |-- FPReport
4720..1|   |   |   |   |   |   |   |   |-- BufferNumber
4730..1|   |   |   |   |   |   |   |   |-- ComponentNumber
4740..1|   |   |   |   |   |   |   |   |-- FailLimExceeded
4751|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
4760..1|   |   |   |   |   |   |   |   |-- TestResult
4770..1|   |   |   |   |   |   |   |   |-- UserSite
4780..1|   |   |   |   |   |   |   |   |-- UsingPatternCnts
4790..1|   |   |   |   |   |   |   |   |-- VectorReport
4800..1|   |   |   |   |   |   |   |   |   |-- Address1
4810..1|   |   |   |   |   |   |   |   |   |-- Address2
4820..1|   |   |   |   |   |   |   |   |   |-- CycleCnt
4831|   |   |   |   |   |   |   |   |   |-- Pins
4841|   |   |   |   |   |   |   |   |   |-- Status
4850..1|   |   |   |   |   |   |   |   |   |-- VectorLabel
4860..n|   |   |   |   |   |   |   |-- FunctionalPinReport
4870..1|   |   |   |   |   |   |   |   |-- Bits
4880..1|   |   |   |   |   |   |   |   |-- ComponentNumber
4891|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
4900..1|   |   |   |   |   |   |   |   |-- TestResult
4910..1|   |   |   |   |   |   |   |   |-- UserSite
4920..n|   |   |   |   |   |   |   |-- PPReport
4930..1|   |   |   |   |   |   |   |   |-- ComponentNumber
4940..n|   |   |   |   |   |   |   |   |-- PPResult
4951|   |   |   |   |   |   |   |   |   |-- Measurement
4961|   |   |   |   |   |   |   |   |   |-- Pin
4970..1|   |   |   |   |   |   |   |   |   |-- TestResult
4981|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
4990..1|   |   |   |   |   |   |   |   |-- UserSite
5000..n|   |   |   |   |   |   |   |-- PRReport
5010..1|   |   |   |   |   |   |   |   |-- ComponentNumber
5021|   |   |   |   |   |   |   |   |-- Measurement
5031|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
5040..1|   |   |   |   |   |   |   |   |-- TesterAlarm
5050..1|   |   |   |   |   |   |   |   |-- TestResult
5060..1|   |   |   |   |   |   |   |   |-- UserSite
5070..n|   |   |   |   |   |   |   |-- StringReport
5080..1|   |   |   |   |   |   |   |   |-- ComponentNumber
5090..1|   |   |   |   |   |   |   |   |-- Keyword
5100..1|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
5110..1|   |   |   |   |   |   |   |   |-- UserSite
5120..1|   |   |   |   |   |   |   |   |-- Value
5130..n|   |   |   |   |   |   |   |-- TestMap
5140..1|   |   |   |   |   |   |   |   |-- CenterX
5150..1|   |   |   |   |   |   |   |   |-- CenterY
5160..1|   |   |   |   |   |   |   |   |-- LogicalMax
5170..1|   |   |   |   |   |   |   |   |-- LogicalMin
5180..1|   |   |   |   |   |   |   |   |-- MeasurementUnit
5191|   |   |   |   |   |   |   |   |   |-- Choice
5201|   |   |   |   |   |   |   |   |   |   |-- ProprietaryUnits
5211|   |   |   |   |   |   |   |   |   |   |   |-- Units
5221|   |   |   |   |   |   |   |   |   |   |-- UnitOfMeasure
5230..1|   |   |   |   |   |   |   |   |-- PosDirX
5240..1|   |   |   |   |   |   |   |   |-- PosDirY
5250..1|   |   |   |   |   |   |   |   |-- RetDieRelationX
5260..1|   |   |   |   |   |   |   |   |-- RetDieRelationY
5270..1|   |   |   |   |   |   |   |   |-- RetDimensionX
5280..1|   |   |   |   |   |   |   |   |-- RetDimensionY
5290..1|   |   |   |   |   |   |   |   |-- WaferCoordinate
5300..1|   |   |   |   |   |   |   |   |   |-- MaxX
5310..1|   |   |   |   |   |   |   |   |   |-- MaxY
5320..1|   |   |   |   |   |   |   |   |   |-- MinX
5330..1|   |   |   |   |   |   |   |   |   |-- MinY
5341|   |   |   |   |-- WaferSort
5351..n|   |   |   |   |   |-- Die
5360..1|   |   |   |   |   |   |-- ChipPN
5370..1|   |   |   |   |   |   |-- DieReticlePN
5380..1|   |   |   |   |   |   |-- PackageDescription
5390..1|   |   |   |   |   |   |-- PartText
5400..1|   |   |   |   |   |   |-- SerialNumber
5411..n|   |   |   |   |   |   |-- TestReport
5420..n|   |   |   |   |   |   |   |-- BuildInfoReport
5430..1|   |   |   |   |   |   |   |   |-- ComponentDescription
5440..1|   |   |   |   |   |   |   |   |-- ComponentID
5450..1|   |   |   |   |   |   |   |   |-- ComponentLocation
5461|   |   |   |   |   |   |   |   |-- ComponentNumber
5470..1|   |   |   |   |   |   |   |   |-- ComponentParentNumber
5480..1|   |   |   |   |   |   |   |   |-- ComponentSerialNumber
5490..1|   |   |   |   |   |   |   |   |-- ComponentType
5500..1|   |   |   |   |   |   |   |   |-- UserSite
5510..n|   |   |   |   |   |   |   |-- CalcFailReport
5520..1|   |   |   |   |   |   |   |   |-- ComponentNumber
5531|   |   |   |   |   |   |   |   |-- ErrorCode
5540..1|   |   |   |   |   |   |   |   |-- FailValue
5551|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
5560..1|   |   |   |   |   |   |   |   |-- Sequence
5570..1|   |   |   |   |   |   |   |   |-- UserSite
5580..n|   |   |   |   |   |   |   |-- DieReport
5590..1|   |   |   |   |   |   |   |   |-- CharFlag
5600..1|   |   |   |   |   |   |   |   |-- CompositeFailSort
5610..1|   |   |   |   |   |   |   |   |-- DieTestingPeriod
5620..1|   |   |   |   |   |   |   |   |   |-- End
5630..1|   |   |   |   |   |   |   |   |   |-- Start
5640..1|   |   |   |   |   |   |   |   |-- FirstFailSort
5650..1|   |   |   |   |   |   |   |   |-- GangTest
5660..1|   |   |   |   |   |   |   |   |   |-- IntCoordinate
5670..1|   |   |   |   |   |   |   |   |   |   |-- X
5680..1|   |   |   |   |   |   |   |   |   |   |-- Y
5690..1|   |   |   |   |   |   |   |   |   |   |-- Z
5701|   |   |   |   |   |   |   |   |   |-- StripTestID
5711|   |   |   |   |   |   |   |   |   |-- StripTestOrientation
5720..1|   |   |   |   |   |   |   |   |-- IntCoordinate
5730..1|   |   |   |   |   |   |   |   |   |-- X
5740..1|   |   |   |   |   |   |   |   |   |-- Y
5750..1|   |   |   |   |   |   |   |   |   |-- Z
5760..1|   |   |   |   |   |   |   |   |-- UserSite
5770..n|   |   |   |   |   |   |   |-- ECIDReport
5780..1|   |   |   |   |   |   |   |   |-- ComponentNumber
5790..1|   |   |   |   |   |   |   |   |-- DecodedID
5800..1|   |   |   |   |   |   |   |   |-- Decoder
5810..1|   |   |   |   |   |   |   |   |-- ECIDType
5821|   |   |   |   |   |   |   |   |-- IntCoordinate
5830..1|   |   |   |   |   |   |   |   |   |-- X
5840..1|   |   |   |   |   |   |   |   |   |-- Y
5850..1|   |   |   |   |   |   |   |   |   |-- Z
5860..1|   |   |   |   |   |   |   |   |-- RawBits
5870..n|   |   |   |   |   |   |   |-- FPReport
5880..1|   |   |   |   |   |   |   |   |-- BufferNumber
5890..1|   |   |   |   |   |   |   |   |-- ComponentNumber
5900..1|   |   |   |   |   |   |   |   |-- FailLimExceeded
5911|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
5920..1|   |   |   |   |   |   |   |   |-- TestResult
5930..1|   |   |   |   |   |   |   |   |-- UserSite
5940..1|   |   |   |   |   |   |   |   |-- UsingPatternCnts
5950..1|   |   |   |   |   |   |   |   |-- VectorReport
5960..1|   |   |   |   |   |   |   |   |   |-- Address1
5970..1|   |   |   |   |   |   |   |   |   |-- Address2
5980..1|   |   |   |   |   |   |   |   |   |-- CycleCnt
5991|   |   |   |   |   |   |   |   |   |-- Pins
6001|   |   |   |   |   |   |   |   |   |-- Status
6010..1|   |   |   |   |   |   |   |   |   |-- VectorLabel
6020..n|   |   |   |   |   |   |   |-- FunctionalPinReport
6030..1|   |   |   |   |   |   |   |   |-- Bits
6040..1|   |   |   |   |   |   |   |   |-- ComponentNumber
6051|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
6060..1|   |   |   |   |   |   |   |   |-- TestResult
6070..1|   |   |   |   |   |   |   |   |-- UserSite
6080..n|   |   |   |   |   |   |   |-- PPReport
6090..1|   |   |   |   |   |   |   |   |-- ComponentNumber
6100..n|   |   |   |   |   |   |   |   |-- PPResult
6111|   |   |   |   |   |   |   |   |   |-- Measurement
6121|   |   |   |   |   |   |   |   |   |-- Pin
6130..1|   |   |   |   |   |   |   |   |   |-- TestResult
6141|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
6150..1|   |   |   |   |   |   |   |   |-- UserSite
6160..n|   |   |   |   |   |   |   |-- PRReport
6170..1|   |   |   |   |   |   |   |   |-- ComponentNumber
6181|   |   |   |   |   |   |   |   |-- Measurement
6191|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
6200..1|   |   |   |   |   |   |   |   |-- TesterAlarm
6210..1|   |   |   |   |   |   |   |   |-- TestResult
6220..1|   |   |   |   |   |   |   |   |-- UserSite
6230..n|   |   |   |   |   |   |   |-- StringReport
6240..1|   |   |   |   |   |   |   |   |-- ComponentNumber
6250..1|   |   |   |   |   |   |   |   |-- Keyword
6260..1|   |   |   |   |   |   |   |   |-- PrimaryIdentifier
6270..1|   |   |   |   |   |   |   |   |-- UserSite
6280..1|   |   |   |   |   |   |   |   |-- Value
6290..n|   |   |   |   |   |   |   |-- TestMap
6300..1|   |   |   |   |   |   |   |   |-- CenterX
6310..1|   |   |   |   |   |   |   |   |-- CenterY
6320..1|   |   |   |   |   |   |   |   |-- LogicalMax
6330..1|   |   |   |   |   |   |   |   |-- LogicalMin
6340..1|   |   |   |   |   |   |   |   |-- MeasurementUnit
6351|   |   |   |   |   |   |   |   |   |-- Choice
6361|   |   |   |   |   |   |   |   |   |   |-- ProprietaryUnits
6371|   |   |   |   |   |   |   |   |   |   |   |-- Units
6381|   |   |   |   |   |   |   |   |   |   |-- UnitOfMeasure
6390..1|   |   |   |   |   |   |   |   |-- PosDirX
6400..1|   |   |   |   |   |   |   |   |-- PosDirY
6410..1|   |   |   |   |   |   |   |   |-- RetDieRelationX
6420..1|   |   |   |   |   |   |   |   |-- RetDieRelationY
6430..1|   |   |   |   |   |   |   |   |-- RetDimensionX
6440..1|   |   |   |   |   |   |   |   |-- RetDimensionY
6450..1|   |   |   |   |   |   |   |   |-- WaferCoordinate
6460..1|   |   |   |   |   |   |   |   |   |-- MaxX
6470..1|   |   |   |   |   |   |   |   |   |-- MaxY
6480..1|   |   |   |   |   |   |   |   |   |-- MinX
6490..1|   |   |   |   |   |   |   |   |   |-- MinY
6500..n|   |   |   |   |   |-- YieldReport
6510..1|   |   |   |   |   |   |-- GoodDieQuantity
6520..1|   |   |   |   |   |   |-- GrossDiePerWafer
6530..1|   |   |   |   |   |   |-- OtherDefectQuantity
6540..1|   |   |   |   |   |   |-- TestQty
6550..1|   |   |   |   |   |   |-- TestYld
6560..1|   |   |   |   |   |   |-- TotalFunctionalDie
6570..n|   |   |-- TestPass
6580..n|   |-- TestSpecificationReport
6590..1|   |   |-- Category
6600..1|   |   |-- PassKeyItemDefect
6611|   |   |-- PrimaryIdentifier
6621|   |   |-- TestID
6630..1|   |   |-- TestName
6640..n|   |   |-- TestParameter
6650..1|   |   |   |-- Calculation
6660..1|   |   |   |-- CensorHLim
6670..1|   |   |   |-- CensorLLim
6680..1|   |   |   |-- Condition
6690..1|   |   |   |-- HighLimit
6700..1|   |   |   |-- LowLimit
6710..n|   |   |   |-- MeasurementUnit
6721|   |   |   |   |-- Choice
6731|   |   |   |   |   |-- ProprietaryUnits
6741|   |   |   |   |   |   |-- Units
6751|   |   |   |   |   |-- UnitOfMeasure
6760..1|   |   |   |-- PCMParmType
6770..1|   |   |   |-- Target
6780..1|   |-- WaferSortLocation
6790..1|   |   |-- GlobalWorkInProcessLocationCode
6800..1|   |   |-- Location
6811|   |   |   |-- Choice
6821..n|   |   |   |   |-- AlternativeIdentifier
6831|   |   |   |   |   |-- Authority
6841|   |   |   |   |   |-- Identifier
6851|   |   |   |   |-- DUNS
6861|   |   |   |   |-- DUNSPlus4
6871|   |   |   |   |-- GLN
6880..1|   |   |-- PhysicalAddress
6891|   |   |   |-- AddressLine1
6900..1|   |   |   |-- AddressLine2
6910..1|   |   |   |-- AddressLine3
6920..1|   |   |   |-- AddressLine4
6930..1|   |   |   |-- AddressLine5
6941|   |   |   |-- CityName
6951|   |   |   |-- Country
6960..1|   |   |   |-- CountrySubdivision
6970..1|   |   |   |-- PostalCode
6980..1|   |   |   |-- PostOfficeBox
6990..1|   |   |-- ProprietaryLabel


Classes
NoNameDefinition
1AlternativeIdentifierIdentifies the specified code and the name of the organization that a code is utilized from.
2AlternativePNA user defined string to identify a part number for a wafer or packaged die which is associated with customerPN.
3BALocationDescribes where the wafer was sent for bond and assembly.
4BuildInfoReportOptions of obtaining more build information when building out the package.
5BusinessServiceInformationThe object allows the specification of the business service utilized within the partner company. This may or may not be the same as the information sent by the RNIF.
6CalcFailReportA report that catalogs failing calculations that may be performed in determining the result of a test.
7ChipPeriodicityDimensional. Describes the distance between chips in micron between established reference points in either the x- and or y-direction on a wafer.
8ContactInformationThe business document must allow for the identification of the name of the department, service or individual to be contacted regarding the context of the business document.
9ContractInformationA block of information used to correlate a contract in an executing choreography.
10ContractorLotNumberUser defined alphanumeric string which is associated with customer lot number.
11CorrelationInformationA block of information used to correlate a requesting document to a responding document and to the contract in an executing choreography.
12CustomerLotNumberCustomer defined alphanumeric string used to identify the lot.
13CustomerPNA string which identifies Foundry defined, the Test Services defined or the customer proprietary defined part number for a wafer or packaged die.
14DieReportReferences optional information to further identify a die on a wafer.
15DieTestingPeriodDefines the start and end time for a die being tested.
16DieReference optional data attributes to identify die on a wafer.
17DimensionDescribes the dimensional measurement range in X, Y or Z axis.
18DocumentHeaderThe object allows for the identification of the sender and receiver of the business document.
19DocumentIdentificationThe object specifies all information necessary to identify the business document.
20DocumentInformationThe object specifies information to identify the business document, a summary of attachments, and information about the business document security.
21DocumentManifestThe block provides a brief summary of attachments and Service Content.
22DocumentSecurityThe object provides additional granularity in specifying business document security (this is in addition to the specified PIP security).
23ECIDReportReport to collect electronic chip ID data.
24FPReportA report that collects functional pin test results. Valid status values are Passed, Failed.
25FabLocationDescribes where the wafer was fabricated.
26FinalTestLocationDescribes where the packaged die was sent for final test.
27FinalTestA test for packaged product that determines that the die functions and performs to the specification. This test also includes parametric and quality sort data.
28FloatCoordinateX, Y and Z Coordinate values.
29FunctionalPinReportA Pass/Fail per pin report of data logged bit results. Valid status options are: Passed, Failed High Limit, Fail Low Limit, Failed Screened and Failed Censor.
30GangTestDescribes the test results for a group of die or packaged units, as in strip testing.
31HardwareSetsDescribes the unique attachments, handlers or probers that are associated to the tester.
32IntCoordinateX, Y and Z Coordinate values.
33LocationThe business document must specify a location.
34LotReportA report that is common for reporting data collection for PCM, Wafer Sort and Final Test.
35LotDescribes the lot information.
36ManifestItemThe object provides details about the specific attachment(s).
37MeasurementUnitDescribes the measurement unit.
38OtherLocationDescribes the location where the wafer or packaged die in a lot or sublot was sent for additional fabrication, assembly or testing. This may be indicated by City, State, Country, Zip Code, DUNS, DUNS+4, or by proprietary label.
39PCMProcess Control Monitor: One of the major test modes which collects in-line parametric (electrical) data for the disposition of wafers in the Foundry based on technology criteria.
40PPReportA report for datalogged per pin data. Per pin results relate data for tests which measure multiple pins in parallel such as leakage tests.
41PPResultA mesurement value for each pin in tests which measure multiple pins in parallel such as leakage tests. Valid status options for this report are: Failed High Limit, Failed Low Limit, Passed, Failed, Screened Value, Failed Censor.
42PRReportA report that data logs parametric test results. The report collects non-per-pin data. Valid status options are: Failed High Limit, Failed Low Limit, Passed, Failed, Screened Value, Failed Censor.
43PartnerIdentificationThe business document must allow for the identity of one or more parties to the transaction.
44PhysicalAddressThe business document must provide a physical address for a party to the business transaction.
45PinDescribes the optional attributes that provide additional pin identification information.
46ProprietaryUnitsDescribes a class where the sender defines the units of measure for the test. These units are not listed in code list UnitOfMeasure.
47ReceiverThe object allows the identification of the receiving party of the business message.
48RequestingDocumentInformationA block of information used to correlate a requesting document to a responding document in an executing choreography.
49SemiconductorTestDataNotificationThe message wrapper for SCTDE.
50SenderThe object allows the identification of the initiating party of the business message.
51SetupReportA report that describes setup information for the testing.
52SoftwareReportSoftwareReport describes software type, software name, software version and softwareBuildID.
53SortContains accumulated count for a sort at Wafer Sort and Final Test.
54StandardDocumentIdentificationThe object specifies additional information necessary to identify the standard business document.
55StringReportA report that provides additional, optional information about a tested device. This class supports datalogging of string values based on a key/value pair approach.
56SubLotAlphanumeric string which describes a lot which has been separated from the Lot.
57TestMapDescribes the wafer orientation and configuration used by manufacturing test (metrology) equipment.
58TestOpIdentificationDescribes the manufacturing level of the lot and the test point.
59TestOperationDescriptionInformation that describes the manufacturing operation in further detail.
60TestParameterDescribes optional attributes to provide additional information on the parameters of the test.
61TestReportThe common report for non-pin data collected at PCM, Wafer Sort and Final Test.
62TestSetupDescribes the identification information for tester set-up.
63TestSpecificationReportReport that lists each test and their attributes at PCM, wafer sort and final test. e.g. Test name, electrical conditions, sort number, etc.
64TestTemperatureTemperature value in either Centigrade or Fahrenheit to identify at which a test is performed for lot or sublot.
65TesterAttachmentDescribes the handlers or probers that are attached to the tester.
66TesterFEHDescribes the unique attachments that can be associated to the tester.
67TesterDescribe unique tester information for PCM, Wafer Sort and Final Test.
68TestingPeriodDefines the start and end time for a wafer being tested.
69TpirPipIdentificationThe object specifies all information necessary to uniquely identify a TPIR-PIP within a Registry or trading partner repository.
70VectorReportA report for collecting functional results for a single vector or pattern count. Valid status values are: H=actual H, expect unknown L=actual L, expect unknown Z=actual Z, expected unknown A=actual H, expected L B=actual H, expect Z C=actual Z, expect H D=actual Z, expect L E=actual L, expect H F=actual L, expect Z.
71WaferCoordinateThe collection of business properties that describe the coordinate on a semiconductor wafer..
72WaferSortLocationDescribes where the wafer was sent for wafer sort test.
73WaferSortOne of the major test modes which collects data on the electrical performance of the integrated die. The test results may be shared as either reconciled information at the chip summary level or as raw test data. Test results may include parametric measurements and quality sort and/or pass/fail information.
74WaferTestingPeriodDefines the start and end time for a wafer being tested.
75YieldReportA report defining the yield from tests at Wafer Sort and Final Test.

Attributes
NoNameDefinitionType
1ActionNameThe name of Action. For RosettaNet usually any of Request/Confirm/Notify/Query/Response.string
2Address1Failing tester primary address; integer.integer
3Address2Failing tester secondary address; integer.integer
4AddressLine1The first line of a physical address.string
5AddressLine2The second line of a physical address.string
6AddressLine3The third line of a physical address.string
7AddressLine4The fourth line of a physical address.string
8AddressLine5The fifth line of a physical address.string
9AttachIDA string that defines the prober handler or any physical device/system that can be attached to the tester used in wafer sort or final test.string
10AttachNameA string to identify the tools attached to the tester system. e.g. Schlumberger 3100.string
11AttachmentIDString. A barcode, electronic ID or alphanumeric identifier for the FEHType used on a tester.string
12AuthorityThe name of the organization that a code is utilized from.string
13BinAssignmentA user defined integer designation for hard bins.integer
14BitsDatalog values in series of bits (0s and 1s).string
15BufferNumberPattern buffer number.integer
16BuildIDA string that identifies the build version of the software. Example: BuildID=Java, JDK, 118, o118-199990910.string
17BusinessProcessInstanceIdentifierThe identifier for the public business process instance being sent that both the sender and receiver can identify.string
18CalculationA string describing the mathematical expression to derive a result.string
19CategoryA string that describes a category of tests.string
20CensorHLimFLOAT value for the high boundary for legitimate or valid test data.float
21CensorLLimFLOAT value for the low boundary for legitimate or valid test data.float
22CenterXThe vector in X direction for index units form the (0,0) coordinate to the index containing the physical center of the wafer. For PCM data the index is reticle steps. For Wafer Sort and Final Test data the index is die steps.float
23CenterYThe vector in Y direction for index units form the (0,0) coordinate to the index containing the physical center of the wafer. For PCM data the index is reticle steps. For Wafer Sort and Final Test data the index is die steps.float
24ChannelInteger, tester channel number.integer
25CharFlagUsed as a indicator for the presence of characterization data for a die.boolean
26ChipPNA string that describes the part number for the device.string
27ChipPinNameAlphanumeric string to describe the name of the pin.string
28CityNameThe name of a city.string
29ComponentDescriptionA user defined description of the component.string
30ComponentIDA unique identification of the component per the componentType (e.g. Frame, Card). Note: The ChipID may be identified by waferid/X/Y. This may be an actual component serial number or may be the primary ECID value waferid/X/Y. If there is an invalid ECID read, the value that is typically used is lotnum/seq/bad-waferid/bad-X/bad-Y or equivalent.string
31ComponentLocationThe location of a sub-component on the parent component.string
32ComponentNumberA number associating a CalcFailReport to a specific component in BuildInfoReport.integer
33ComponentNumberA number associating a FPReport to a specific component in BuildInfoReport.integer
34ComponentNumberA number associating a FunctionalPinReport to a specific component in BuildInfoReport.integer
35ComponentNumberA number associating a PPReport to a specific component in BuildInfoReport.integer
36ComponentNumberA number associating a PRReport to a specific component in BuildInfoReport.integer
37ComponentNumberA number associating a key value pair to a specific component in BuildInfoReport.integer
38ComponentNumberA number associating an ECIDReport to a specific component in BuildInfoReport.integer
39ComponentNumberA unique number associated with the component or subcomponent being tested relative to the device. In general the highest level of the componentNumber equals 0 and all identified subcomponents are componentNumber equal 1-n. Subsequent Reports can be associated to the sub-component via the componentNumber.integer
40ComponentParentNumberFor the highest level of packaged component the value is null. For any sub-component, the corresponding componentNumber is from a previous BuildInfoReport.integer
41ComponentSerialNumberA scribed serial number on the component.string
42CompositeFailSortA user initiated failure override of first fail sort to allow for the collection of additional sort fail data. The additional sort fails can be combined in a comma separated list of sort numbers as a composite fail. The compositeFailSort describes the content of the data in the sortID tag.string
43ConditionA string specifying the test parameter. Example: TestTemperature etc.string
44ContactThe name of the department, service or individual to be contacted within the organization.Contact
45ContractIdentifierUnique identification of a contract between the Sender and the Receiverstring
46ContractTypeThe type of the contract: an attribute describing the type of the ContractIndentification. Valid values are URI, URN,ebXMLCPA, or other values defined by partners.string
47CreationThe creation date and time of the specified Business Document (i.e. the Purchase Order date).dateTime
48CustomerTestProgramECCustomer Supplied Test Program EC. In a foundry model, the customer can have a different test program EC than the one used by the test house.string
49CustomerTestProgramNameCustomer Supplied Test Program Name. In a foundry model, the customer can have a different test program name than the one used by the test house.string
50CycleCntInteger, Cycle count for ABIST/LBIST diagnostic data collection or the T0 count for a pattern.integer
51DUNSPlus4A identifier to specify a specific location within a business location.DUNSPlus4
52DUNSA number assigned by Dun and Bradstreet to identify a business location.DUNS
53DecodedIDValue that could represent waferID or lotID.string
54DecoderIdentifies the decoding scheme if ECID is used.string
55DescriptionA description of the attachment.string
56DescriptionA string that describes the kind of chip periodicity is being defined.string
57DieReticlePNA string which defines the unique part numbers for die associated with a multi-project wafer.string
58ECIDTypeWhen multiple types of electronic chip identification can be used, the ECIDTYPE field can be used to determine which type is being logged. e.g. Wafer_X_Y, MAC, GUID.string
59EmailThe electronic mail for the specified contact.string
60EndThe end date time of a period.dateTime
61EquipmentIDAn alphanumeric string to identify the tester used at PCM, wafer sort or final test.string
62ErrorCodeA user defined code for how the calculation failed.integer
63FailLimExceededFlag indicator to whether more fails exists than were datalogged. False = all fails datalogged; True = More fails present.boolean
64FailValueThe resultant failed value from the calculation test.float
65FaxThe fax number for the specified contact.string
66FileDataVersionUser defined changes i.e. rules changes to content of data in the data file transfer. Examples: version update to loaders, parsers, or operating system, specification limits etc.string
67FirstFailSortDescribed the sort ID for the first fail on the device. See content of data in sortID tag .integer
68GLNGlobal Location Number (GLN) - A identifier to identify legal entities, trading parties and location. GLN
69GTINGlobal Trade Identification Number (GTIN).GTIN
70GlobalLotStatusCodeDescribes lot or sublot status.string
71GlobalWorkInProcessLocationCodeReferences where fabrication, bond, assembly, test and related activities were performed on a lot or sublot.string
72GoodDieQuantityInteger that describes the number of die or packages that are functional in a lot or sublot.integer
73GrossDiePerWaferInteger, Describes the number of complete die on a wafer.integer
74HardSortNameRepresents the hard sort name of the Sort Test.string
75HardSortSymbolA user defined grouping of hard sort fails on a wafer map.string
76HardSortRepresents the hard sort ID of the Sort test.string
77HeadIDIdentifies the test head used for wafer sort and final test.string
78HeaderVersionThe UN/CEFACT version of the document header.string
79HighLimitDescribes the high limit value for a test specification.float
80IdSuffixAn alphanumeric string that could be used to identify a lot at a location. The suffix string is user defined. It can be used to identify a lot split, a bond assembly location, wafer sort or final test location.string
81IdentifierIdentifies the role of the contact (i.e. Service Technician, Account Manager) in the Business Process.string
82IdentifierThe specified code to represent an entity (e.g. product, location, partner, etc.).string
83IdentifierThe unique identifier for the document being sent.string
84KeywordAn optional keyword.string
85LengthThe size of the attachment in bytes (i.e. 1 000 000 bytes)positiveInteger
86LogicalMaxThe logiscal maximum dimensions. For PCM data, units are reticle index steps. For Wafer Sort and Final Test data, units are die index steps.float
87LogicalMinThe logiscal minimum dimensions. For PCM data, units are reticle index steps. For Wafer Sort and Final Test data, units are die index steps.float
88LotEndDateTimeDefines the end time of a lot for a test.dateTime
89LotStartDateTimeDefines the start time of the lot for a test.dateTime
90LowLimitDescribes the low limit value for a test specification.float
91ManufacturingIDAlphanumeric string which describes the lot.string
92MaxXThe maximum X coordinate on a semiconductor wafer.float
93MaxYThe maximum Y coodinate on a semiconductor wafer.float
94MaximumDescribes the maximum dimensional measurement for X, Y or Z axis.float
95MeasurementA data measurement that are collected from each pin measured.float
96MeasurementMeasurement in base units.float
97MinXThe minimum X coodinate on a semiconductor wafer.float
98MinYThe minimum Y coodinate on a semiconductor wafer.float
99MinimumDescribes the minimum dimensional measurement for X, Y or Z axis.float
100ModulePinNameAlphanumeric string to describe the package pin name.string
101MultipleTypeIndicates whether the manifest contains documents of multiple types. True if yes, and False if no.boolean
102NameA string that specifically labels the FEH type.string
103NameThe name of software type. Examples: AIX, Windows.string
104NominalSizeDescribes the diameter of the wafer in mm, or inches.float
105NonRepudiableReceiptThe value "true" will indicate that a signed acknowledgement for the business document is necessary.boolean
106NotchDescribes the orientation of the wafer notch in a tester: Valid options are: 12 o’clock; 3 o’clock, 6 o’clock, 9 o’clock, notch up, notch down, notch right or notch left, Up=U, Down=D, Left=L, or Right=R, 0, 90, 180 or 270 degrees. Reference SEMI G81, Appendix 1.string
107NumberOfItemsTotal number of documents in the message. The physical count of the attachments in the payload plus the RosettaNet Business Message (for Service Content). The value of this field will be at least 1.positiveInteger
108OtherDefectQuantityString. User defined Quality Control inspection at wafer sort and final test to identify defects. User defined Valid Values.string
109PackageDescriptionUser definable element for package size (default=mm), package type (string), and pin count (Integer).string
110ParallelTestTthe number of devices or parallel tests for wafer sort.integer
111PartTextString. A user defined comment field to attach additional die information.string
112PartnerIdThe Trading Partner Identification of MNC that is creating this TPIR PIP.DUNSPlus4
113PartnerNameThe name of the partner’s company/business.string
114PartnerSecurityIDAn optional string that would indicate a project name to restrict access to the data to those employees working on that project.string
115PassKeyItemDefectA flag to identify if a failing parameter is PCM or optional.boolean
116PassVisualInspectionA user defined pass/fail quality control inspection flag of wafer after wafer sort.boolean
117PersistentEncryptionThe value "true" will indicate that the Business Document (including the header) needs to be encrypted when stored or transported.boolean
118PersistentSignatureThe value "true" will indicate that a signature is required to be stored with the document while stored or transported. boolean
119PhoneThe telephone number for the specified contact.string
120PinA Pin IDs for each pin measured.integer
121PinsString. Comma separated list of Pin IDs as defined in PinReport.string
122PipIdentifierPIP Identification.[ i.e. PIP3A4]PipIdentifier
123PipVersionPIP version number (i.e. 02.02.00).PipVersion
124PosDirXThe positive direction of the X-axis. Values illustrate Up (U), Down (D), Left (L)and Right (R).float
125PosDirYThe positive direction of the Y-axis. Values illustrate Up (U), Down (D), Left (L)and Right (R).float
126PositionIDInteger to reference ID for pin.integer
127PostOfficeBoxThe Post Office Box identifier used to identify a party's post office box.string
128PostalCodeIdentifying geographic location as specified by a national postal code.string
129PrimaryIdentifierA reference back to TestSpecificationReport. This identifier references the electrical attributes only once per lot.integer
130PrimaryIdentifierAn integer used as a reference back to TestSpecificationReport. This identifier references the electrical attributes only once per lot.integer
131PrimaryIdentifierReference to link the test report for a lot.integer
132PrimaryIdentifierReference to link the test report to a lot.integer
133ProbeNameDescribes the probe recipe or pattern file.string
134ProcessIdentifierThe name of the PIP e.g. Notify of Forecast Reply.string
135ProcessReferenceThe URN for the PIP that includes Cluster/Segment/Process pattern used to identify the interface process (such as PIP3A4) string
136ProcessStateThe business process (or service) state of the sender of a document. When a service receives this document, the receiver may use the state as a precondition.string
137ProductNameA customer defined descriptor or code name for a part being fabricated or tested at a Foundry or Test Service trading partner. Example are Neptune, Big Dog, Antares 6.string
138ProductNameThe name of the product.string
139ProprietaryLabelUser defined label to uniquely identify a facility that is represented in any of the scenarios.string
140QuadrantA user defined division of the wafer into 4 quadrants. Valid values: I, II, III, IV, Q1,Q2, Q3, Q4, Upper Left, Upper Right, Lower Left, Lower Right and User defined labels. Reference SEMI G81, Appendix 1.string
141QualityCodeDesignate a quality condition of a lot. This can be a proprietary label defined by the Foundry of the Test Services trading partner.string
142RawBitsRaw Bits data in hexadecimal format.Hexadecimal
143RepairableFlagA flag to indicate if product (die or module) are repairable based on user definition.boolean
144RequestingDocumentCreationDateTimeThe date-time of the requesting business document.dateTime
145RequestingDocumentInstanceIdentifierThe Business Document identification number that identifies the requesting Business Document.string
146ResponseDateTimeThe expected time to receive the response. This can not be greater than the PIP TimeToPerform.dateTime
147RetDieRelationXThe X coordinate of the center die within the center reticle.float
148RetDieRelationYThe Y coordinate of the center die within the center reticle.float
149RetDimensionXThe size of the reticle in the X direction , expressed in number of die incements.float
150RetDimensionYThe size of the reticle in the Y direction , expressed in number of die incements.float
151RetestSortsA list of sort numbers from prior pass that will be retested in this pass.string
152RetestTypeDescribes how test data should be combined with prior data for the same LotID, test and level. Valid Options are: First: Replace all previous data for test and level; Sorts: Removal of module data from prior pass where sort matches a sort in a prior pass; Chip: Replaces data on a by chip basis; TestReplace: replaces data on a wafer sort test basis (deletes prior data for wafer or parameter having a non-null retest value.string
153RevisionReferenced the specified product revision.string
154SampleRateDescribes the percentage of die in wafer sort that are being tested under a characterization test plan.PercentAmount
155SequenceAn index indicating at which step of the calculation that it failed.integer
156SerialNumberAn alphanumeric string that uniquely defines the numbering of packaged die.string
157ServiceNameThe name of the Business Activity with the "Request/Confirm" part removed. E.g., for the Activity "Request Purchase Order"==> "Purchase Order".string
158SetupNameA string that describes test conditions.string
159SetupVersionDescribes the version for the test conditions specified in setupName.float
160SignalAlphanumeric string to describes name of signal pin.string
161SlotIDSlot Identification Number for a particular wafer. Companies prefer to use a slot id to keep track of which slot in the carrier the wafer is in.string
162SortCountA string that describes the number of counts for each sortID during a test.integer
163SortIDThe sortid represents the sort name of the Sort Test for which the firstFailSort and compositeFailSort are related to this sort identification.string
164SortNameDescribes the test in the SortID.string
165SortSymbolA user defined grouping of fails on a wafer map.string
166StandardIdentifies the standard used to submit the business document. (e.g. RosettaNet).string
167StartThe start date time of a period.dateTime
168StripTestIDIdentify the packaged die numbering on a strip.string
169StripTestOrientationDescribes the orientation by strip test substrate: Valid values: 0, 90, 180, 270 degrees. Reference SEMI G81, Appendix 2.integer
170TargetTestTemperatureThe targeted temperature value in either Centigrade or Fahrenheit at which a test is performed for lot or sublot.float
171TargetDescribes the expected value for the test.float
172TechnologyAn alphanumeric string that is associated with a fabrication technology. Example. CMOS8SF, MOS-11.string
173TestIDAn integer that uniquely identifies a test.integer
174TestLevelA string that describes the test in further detail. Label may change. This is user definable.string
175TestModeA string which is used to identify the type of test: PCM, Wafer Sort or Final Test. Within each major test type their may be multiple tests undertaken for each lot or sublot.string
176TestNameA string that describes the test.string
177TestPassThe number of times a test occurs. The test start and end time needs to be associated with each pass.integer
178TestProgECA string that indicates the version number for the TestProgName (Req. #43) used for testing a lot or sublot.string
179TestProgramNameA string that describes the test program for either a lot or sublot.string
180TestQtyUsed for calculation of yield for die and packaged die for a lot or sublot tested.integer
181TestYldA TPA defined calculation for yield at wafer sort and final test.PercentAmount
182TesterAlarmAn indicator status flag on whether the tester was in alarm during wafer sort or final test.boolean
183TesterControlSoftwareDescribes the software and its version that control the tester.string
184TesterTypeThis object describes the tester model, version and ID number.string
185TotalFunctionalDieString. User defined identifier on the level of functionality of die.string
186TpirBusinessProcessIdentifierA Business Process Identifier to uniquely define the TPIR-PIP 'role' within a Business Scenario at a company or MNC level. The identifier MUST be composed of alphanumeric characters only and its length MUST be between one and twelve characters.BusinessProcessIdentifier
187TpirPipVersionA TPIR-PIP Version Number (i.e., major and minor version number as XX.XX).VersionIdentifier
188TypeA string that describes the type hardware. It can be an Attachment Sets or FEH (Front End Hardware) that is attached to a tester system. Example: Probe Heads, Sockets, BIB, DIB and user definable attachments.string
189TypeAlphanumeric string listing the driver/receiver book types.string
190TypeName of the Action Messagestring
191TypeThe type of software described by this item. Valid examples are: Operating system, OEM tool control, Software system, Local Software and user defined.string
192UnitsSpecial description or code of the units for the measurement value.string
193UniversalResourceIdentifierThe generic set of all names/addresses that are short strings that refer to resources. string
194UriDescribes the destination uri for the TPIR form.anyURI
195UserSiteA user-defined die coordinate represented as an integer which is often associated with the serial number assigned by the tester or prober executive.integer
196UserSiteIdentifies the corresponding device site number (0-1).integer
197UserSiteIdentifies the corresponding device site number.integer
198UsingPatternCntsA flag indicator to whether failing addresses or counts were datalogged. True = using pattern counts; False = datalogging vector addresses.boolean
199ValueAny character string value necessary for defining ASCI test results off card testers.string
200VectorLabelString, Label for failing vector.string
201VersionPIP3A4v01.00string
202VersionThe software version being utilized. Example: 4.1.3.string
203WaferShortIDAlternate identifier for the wafer unique ID. Companies prefer to use a wafer short name as the data key for their data analysis tools versus the wafer unique id.string
204WaferUniqueIDAn alphanumeric string which describes the wafer serial number for traceability in a lot or sublot.string
205XCoordinate value for X-axis.float
206YCoordinate value for Y-axis.float
207ZCoordinate value for Z-axis.float

Code Lists
1AxisLines: 246
Indicate three dimensional direction.
Entity Instances
XX-axis.
YY-axis.
ZZ-axis.

2ComponentTypeLines: 310 433 549
Valid component values are: CAG, CHP, COR, CRD, FRM, MCM, MOD, NOD, SCM.
Entity Instances
CAGA cage containing multiple boards or cards.
CHPA row chip or die.
CORCore, a subcomponent of a chip (e.g. Mult-core processor).
CRDA card or board containing multiple module (MCM or SCM).
FRMA frame containing multiple cages and user definded.
MCMA multi chip module.
MODModule, a single packaged chip (SCM-e.g. Single Chip Module) or set of chips (MCM - e.g. Multi-Chip Module). Use this code when SCM or MCM can not be determined.
NODNode, a grouping of cards within a cage. A node may include cards, memory, and cooling unit systems.
SCMA single chip module.

3ConfidentialityLines: 110
A string which describes the level of security associated with the data, as defined by TPA.
Entity Instances
CONConfidential security level.
NONNo security restriction (None).
RESRestricted security level.

4CoordinateFlagLines: 244
A status flag to indicate the coordinate measurement is for a single die on a reticle or a multi-chip die on a reticle.
Entity Instances
MULMulti-chip die on a reticle.
SINSingle Die on a reticle.

5CountrySubdivisionLines: 106 129 152 205 696
For representation of a Countries subdivisions RosettaNet has adopted ISO 3166-3; 1999. Refer to the following web page to get the latest version of the standard: http://www.iso.ch/iso/en/prods-services/iso3166ma/02iso-3166-code-lists/index.html If you need more information about the ISO standard please contact ISO for more details.

6CountryLines: 105 128 151 204 695
For representation of Country name RosettaNet has adopted ISO 3166-3; 1999. Refer to the following web page to get the latest version of the standard: http://www.iso.ch/iso/en/prods-services/iso3166ma/02iso-3166-code-lists/index.html If you need more information about the ISO standard please contact ISO for more details.

7FileTypeLines: 22
Describes the file type of the TPIR form (PDF, XDP or XML).
Entity Instances
PDFPortable Document Format.
XDPXML Data Package.
XMLeXtensible Markup Language.

8LanguageLines: 32
For representation of Language name RosettaNet has adopted ISO 639-2; 1998. Refer to the following web page to get the latest version of the standard: http://www.loc.gov/standards/iso639-2/iso639jac.html If you need more information about the ISO standard please contact ISO for more details.

9LotStatusCompletionLines: 235
Status completion of lot or sublot at the end of testing.
Entity Instances
ABOAborted: process has been terminated; data is invalid and is purged.
COMCompleted: all process have been completed; data is valid and can be migrated.
SUSSuspend: process is partially done; data is valid and can be migrated.

10LotTypeLines: 180
Describes the mode in which product was tested.
Entity Instances
DEVDevelopment.
ENGEngineering - State where product is made using test processes on non-production tools or equipment.
EUHEUH type.
MFGManufacturing.
NCLNonConformingLot - Lots affected by a nonconformity to preset quality characteristics.
PLTPilot - The first lot of the product (never produced at the dedicated subcontractor).
PPDPre-Production.
PQCProcess Qualification Check - Process to qualify manufacturing processes in preparation for volume manufacturing.
PRDProduction - State where product is made using all production tools, processes, equipment, environment, facility, and cycle time.
RNDResearch and Development - Process for developing prototype products.
RWKRework - Parts sent back from further down the manufacturing line.
SVCService.
TSTTest - The manufacturing stage in which the packaged die is tested.

11MimeTypeQualifierLines: 34
The MIME type as defined by IANA. Please refer to http://www.iana.org/assignments/media-types/ for a list of types.
Entity Instances
application/EDI-Consent[RFC1767]
application/EDI-X12[RFC1767]
application/EDIFACT[RFC1767]
application/activemessage[Shapiro]
application/andrew-inset[Borenstein]
application/applefile[Faltstrom]
application/atomicmail[Borenstein]
application/batch-SMTP[RFC2442]
application/beep+xml[RFC3080]
application/cals-1840[RFC1895]
application/cnrp+xml[RFCCNRP]
application/commonground[Glazer]
application/cpl+xml
application/cybercash[Eastlake]
application/dca-rft[Campbell]
application/dec-dx[Campbell]
application/dicom[RFC3240]
application/dvcs[RFC3029]
application/eshop[Katz]
application/font-tdpfr[RFC3073]
application/http[RFC2616]
application/hyperstudio[Domino]
application/iges[Parks]
application/index[RFC2652]
application/index.cmd[RFC2652]
application/index.obj[RFC2652]
application/index.response[RFC2652]
application/index.vnd[RFC2652]
application/iotp[RFC2935]
application/ipp[RFC2910]
application/isup[RFC3204]
application/mac-binhex40[Faltstrom]
application/macwriteii[Lindner]
application/marc[RFC2220]
application/mathematica[Van Nostern]
application/msword[Lindner]
application/news-message-id[RFC1036,Spencer]
application/news-transmission[RFC1036, Spencer]
application/ocsp-request[RFC2560]
application/ocsp-response[RFC2560]
application/octet-stream[RFC2045,RFC2046]
application/oda[RFC2045,RFC2046]
application/ogg[RFC-walleij-ogg-mediatype-08.txt]
application/parityfec[RFC3009]
application/pdf[Lindner]
application/pgp-encrypted[RFC3156]
application/pgp-keys[RFC3156]
application/pgp-signature[RFC3156]
application/pkcs10[RFC2311]
application/pkcs7-mime[RFC2311]
application/pkcs7-signature[RFC2311]
application/pkix-cert[RFC2585]
application/pkix-crl[RFC2585]
application/pkixcmp[RFC2510]
application/postscript[RFC2045,RFC2046]
application/prs.alvestrand.titrax-sheet[Alvestrand]
application/prs.cww[Rungchavalnont]
application/prs.nprend[Doggett]
application/prs.plucker[Janssen]
application/qsig[RFC3204]
application/reginfo+xml[RFC-ietf-sipping-reg-event-00.txt]
application/remote-printing[RFC1486,Rose]
application/riscos[Smith]
application/rtf[Lindner]
application/sdp[RFC2327]
application/set-payment[Korver]
application/set-payment-initiation[Korver]
application/set-registration[Korver]
application/set-registration-initiation[Korver]
application/sgml[RFC1874]
application/sgml-open-catalog[Grosso]
application/sieve[RFC3028]
application/slate[Crowley]
application/timestamp-query[RFC3161]
application/timestamp-reply[RFC3161]
application/tve-trigger[Welsh]
application/vemmi[RFC2122]
application/vnd.3M.Post-it-Notes[O'Brien]
application/vnd.3gpp.pic-bw-large[Meredith]
application/vnd.3gpp.pic-bw-small[Meredith]
application/vnd.3gpp.pic-bw-var[Meredith]
application/vnd.3gpp.sms[Meredith]
application/vnd.FloGraphIt[Floersch]
application/vnd.Mobius.DAF[Kabayama]
application/vnd.Mobius.DIS[Kabayama]
application/vnd.Mobius.MBK[Devasia]
application/vnd.Mobius.MQY[Devasia]
application/vnd.Mobius.MSL[Kabayama]
application/vnd.Mobius.PLC[Kabayama]
application/vnd.Mobius.TXF[Kabayama]
application/vnd.Quark.QuarkXPress[Scheidler]
application/vnd.accpac.simply.aso[Leow]
application/vnd.accpac.simply.imp[Leow]
application/vnd.acucobol[Lubin]
application/vnd.acucorp[Lubin]
application/vnd.adobe.xfdf[Perelman]
application/vnd.aether.imp[Moskowitz]
application/vnd.amiga.ami[Blumberg]
application/vnd.anser-web-certificate-issue-initiation[Mori]
application/vnd.anser-web-funds-transfer-initiation[Mori]
application/vnd.audiograph[Slusanschi]
application/vnd.blueice.multipass[Holmstrom]
application/vnd.bmi[Gotoh]
application/vnd.businessobjects[Imoucha]
application/vnd.canon-cpdl[Muto]
application/vnd.canon-lips[Muto]
application/vnd.cinderella[Kortenkamp]
application/vnd.claymore[Simpson]
application/vnd.commerce-battelle[Applebaum]
application/vnd.commonspace[Chandhok]
application/vnd.contact.cmsg[Patz]
application/vnd.cosmocaller[Dellutri]
application/vnd.ctc-posml[Kohlhepp]
application/vnd.cups-postscript[Sweet]
application/vnd.cups-raster[Sweet]
application/vnd.cups-raw[Sweet]
application/vnd.curl[Byrnes]
application/vnd.cybank[Helmee]
application/vnd.data-vision.rdz[Fields]
application/vnd.dna[Searcy]
application/vnd.dpgraph[Parker]
application/vnd.dreamfactory[Appleton]
application/vnd.dxr[Duffy]
application/vnd.ecdis-update[Buettgenbach]
application/vnd.ecowin.chart[Olsson]
application/vnd.ecowin.filerequest[Olsson]
application/vnd.ecowin.fileupdate[Olsson]
application/vnd.ecowin.series[Olsson]
application/vnd.ecowin.seriesrequest[Olsson]
application/vnd.ecowin.seriesupdate[Olsson]
application/vnd.enliven[Santinelli]
application/vnd.epson.esf[Hoshina]
application/vnd.epson.msf[Hoshina]
application/vnd.epson.quickanime[Gu]
application/vnd.epson.salt[Nagatomo]
application/vnd.epson.ssf[Hoshina]
application/vnd.ericsson.quickcall[Tidwell]
application/vnd.eudora.data[Resnick]
application/vnd.fdf[Zilles]
application/vnd.ffsns[Holstage]
application/vnd.framemaker[Wexler]
application/vnd.fsc.weblaunch[D.Smith]
application/vnd.fujitsu.oasys[Togashi]
application/vnd.fujitsu.oasys2[Togashi]
application/vnd.fujitsu.oasys3[Okudaira]
application/vnd.fujitsu.oasysgp[Sugimoto]
application/vnd.fujitsu.oasysprs[Ogita]
application/vnd.fujixerox.ddd[Onda]
application/vnd.fujixerox.docuworks[Taguchi]
application/vnd.fujixerox.docuworks.binder[Matsumoto]
application/vnd.fut-misnet[Pruulmann]
application/vnd.grafeq[Tupper]
application/vnd.groove-account[Joseph]
application/vnd.groove-help[Joseph]
application/vnd.groove-identity-message[Joseph]
application/vnd.groove-injector[Joseph]
application/vnd.groove-tool-message[Joseph]
application/vnd.groove-tool-template[Joseph]
application/vnd.groove-vcard[Joseph]
application/vnd.hbci[Hammann]
application/vnd.hhe.lesson-player[Jones]
application/vnd.hp-HPGL[Pentecost]
application/vnd.hp-PCL[Pentecost]
application/vnd.hp-PCLXL[Pentecost]
application/vnd.hp-hpid[Gupta]
application/vnd.hp-hps[Aubrey]
application/vnd.httphone[Lefevre]
application/vnd.hzn-3d-crossword[Minnis]
application/vnd.ibm.MiniPay[Herzberg]
application/vnd.ibm.afplinedata[Buis]
application/vnd.ibm.electronic-media[Tantlinger]
application/vnd.ibm.modcap[Hohensee]
application/vnd.ibm.secure-container[Tantlinger]
application/vnd.informix-visionary[Gales]
application/vnd.intercon.formnet[Gurak]
application/vnd.intertrust.digibox[Tomasello]
application/vnd.intertrust.nncp[Tomasello]
application/vnd.intu.qbo[Scratchley]
application/vnd.intu.qfx[Scratchley]
application/vnd.irepository.package+xml[Knowles]
application/vnd.is-xpr[Natarajan]
application/vnd.japannet-directory-service[Fujii]
application/vnd.japannet-jpnstore-wakeup[Yoshitake]
application/vnd.japannet-payment-wakeup[Fujii]
application/vnd.japannet-registration[Yoshitake]
application/vnd.japannet-registration-wakeup[Fujii]
application/vnd.japannet-setstore-wakeup[Yoshitake]
application/vnd.japannet-verification[Yoshitake]
application/vnd.japannet-verification-wakeup[Fujii]
application/vnd.jisp[Deckers]
application/vnd.kde.karbon[Faure]
application/vnd.kde.kchart[Faure]
application/vnd.kde.kformula[Faure]
application/vnd.kde.kivio[Faure]
application/vnd.kde.kontour[Faure]
application/vnd.kde.kpresenter[Faure]
application/vnd.kde.kspread[Faure]
application/vnd.kde.kword[Faure]
application/vnd.kenameaapp[DiGiorgio-Haag]
application/vnd.koan[Cole]
application/vnd.liberty-request+xml[McDowell]
application/vnd.llamagraphics.life-balance.desktop[White]
application/vnd.lotus-1-2-3[Wattenberger]
application/vnd.lotus-approach[Wattenberger]
application/vnd.lotus-freelance[Wattenberger]
application/vnd.lotus-notes[Laramie]
application/vnd.lotus-organizer[Wattenberger]
application/vnd.lotus-screencam[Wattenberger]
application/vnd.lotus-wordpro[Wattenberger]
application/vnd.mcd[Gotoh]
application/vnd.mediastation.cdkey[Flurry]
application/vnd.meridian-slingshot[Wedel]
application/vnd.micrografx.flo[Prevo]
application/vnd.micrografx.igx[Prevo]
application/vnd.mif[Wexler]
application/vnd.minisoft-hp3000-save[Bartram]
application/vnd.mitsubishi.misty-guard.trustweb[Tanaka]
application/vnd.mophun.application[Wennerstrom]
application/vnd.mophun.certificate[Wennerstrom]
application/vnd.motorola.flexsuite[Patton]
application/vnd.motorola.flexsuite.adsi[Patton]
application/vnd.motorola.flexsuite.fis[Patton]
application/vnd.motorola.flexsuite.gotap[Patton]
application/vnd.motorola.flexsuite.kmr[Patton]
application/vnd.motorola.flexsuite.ttc[Patton]
application/vnd.motorola.flexsuite.wem[Patton]
application/vnd.mozilla.xul+xml[McDaniel]
application/vnd.ms-artgalry[Slawson]
application/vnd.ms-asf[Fleischman]
application/vnd.ms-excel[Gill]
application/vnd.ms-lrm[Ledoux]
application/vnd.ms-powerpoint[Gill]
application/vnd.ms-project[Gill]
application/vnd.ms-tnef[Gill]
application/vnd.ms-works[Gill]
application/vnd.ms-wpl[Plastina]
application/vnd.mseq[Le Bodic]
application/vnd.msign[Borcherding]
application/vnd.music-niff[Butler]
application/vnd.musician[Adams]
application/vnd.netfpx[Mutz]
application/vnd.noblenet-directory[Solomon]
application/vnd.noblenet-sealer[Solomon]
application/vnd.noblenet-web[Solomon]
application/vnd.novadigm.EDM[Swenson]
application/vnd.novadigm.EDX[Swenson]
application/vnd.novadigm.EXT[Swenson]
application/vnd.obn[Hessling]
application/vnd.osa.netdeploy[Klos]
application/vnd.palm[Peacock]
application/vnd.pg.format[Gandert]
application/vnd.pg.osasli[Gandert]
application/vnd.powerbuilder6[Guy]
application/vnd.powerbuilder6-s[Guy]
application/vnd.powerbuilder7[Shilts]
application/vnd.powerbuilder7-s[Shilts]
application/vnd.powerbuilder75[Shilts]
application/vnd.powerbuilder75-s[Shilts]
application/vnd.previewsystems.box[Smolgovsky]
application/vnd.publishare-delta-tree[Ben-Kiki]
application/vnd.pvi.ptid1[Lamb]
application/vnd.pwg-multiplexed[RFC3391]
application/vnd.pwg-xhtml-print+xml[Wright]
application/vnd.rapid[Szekely]
application/vnd.s3sms[Tarkkala]
application/vnd.sealed.net[Lambert]
application/vnd.seemail[Webb]
application/vnd.shana.informed.formdata[Selzler]
application/vnd.shana.informed.formtemplate[Selzler]
application/vnd.shana.informed.interchange[Selzler]
application/vnd.shana.informed.package[Selzler]
application/vnd.smaf[Takahashi]
application/vnd.sss-cod[Dani]
application/vnd.sss-dtf[Bruno]
application/vnd.sss-ntf[Bruno]
application/vnd.street-stream[Levitt]
application/vnd.svd[Becker]
application/vnd.swiftview-ics[Widener]
application/vnd.triscape.mxs[Simonoff]
application/vnd.trueapp[Hepler]
application/vnd.truedoc[Chase]
application/vnd.ufdl[Manning]
application/vnd.uplanet.alert[Martin]
application/vnd.uplanet.alert-wbxml[Martin]
application/vnd.uplanet.bearer-choice[Martin]
application/vnd.uplanet.bearer-choice-wbxml[Martin]
application/vnd.uplanet.cacheop[Martin]
application/vnd.uplanet.cacheop-wbxml[Martin]
application/vnd.uplanet.channel[Martin]
application/vnd.uplanet.channel-wbxml[Martin]
application/vnd.uplanet.list[Martin]
application/vnd.uplanet.list-wbxml[Martin]
application/vnd.uplanet.listcmd[Martin]
application/vnd.uplanet.listcmd-wbxml[Martin]
application/vnd.uplanet.signal[Martin]
application/vnd.vcx[T.Sugimoto]
application/vnd.vectorworks[Pharr]
application/vnd.vidsoft.vidconference[Hess]
application/vnd.visio[Sandal]
application/vnd.visionary[Aravindakumar]
application/vnd.vividence.scriptfile[Risher]
application/vnd.vsf[Rowe]
application/vnd.wap.sic[WAP-Forum]
application/vnd.wap.slc[WAP-Forum]
application/vnd.wap.wbxml[Stark]
application/vnd.wap.wmlc[Stark]
application/vnd.wap.wmlscriptc[Stark]
application/vnd.webturbo[Rehem]
application/vnd.wrq-hp3000-labelled[Bartram]
application/vnd.wt.stf[Wohler]
application/vnd.wv.csp+wbxml[Salmi]
application/vnd.xara[Matthewman]
application/vnd.xfdl[Manning]
application/vnd.yellowriver-custom-menu[Yellow]
application/whoispp-query[RFC2957]
application/whoispp-response[RFC2958]
application/wita[Campbell]
application/wordperfect5.1[Lindner]
application/x400-bp[RFC1494]
application/xhtml+xml[RFC3236]
application/xml[RFC3023]
application/xml-dtd[RFC3023]
application/xml-external-parsed-entity[RFC3023]
application/zip[Lindner]
audio/32kadpcm[RFC2421,RFC2422]
audio/AMR[RFC3267]
audio/AMR-WB[RFC3267]
audio/CN[RFC3389]
audio/DAT12[RFC3190]
audio/DVI4
audio/EVRC[RFC-ietf-avt-evrc-smv-03.txt]
audio/EVRC0[RFC-ietf-avt-evrc-smv-03.txt]
audio/G.722.1[RFC3047]
audio/G722
audio/G723
audio/G726-16
audio/G726-24
audio/G726-32
audio/G726-40
audio/G728
audio/G729
audio/G729D
audio/G729E
audio/GSM
audio/GSM-EFR
audio/L16[RFC2586]
audio/L20[RFC3190]
audio/L24[RFC3190]
audio/L8
audio/LPC
audio/MP4A-LATM[RFC3016]
audio/MPA
audio/PCMA
audio/PCMU
audio/QCELP
audio/RED
audio/SMV[RFC-ietf-avt-evrc-smv-03.txt]
audio/SMV0[RFC-ietf-avt-evrc-smv-03.txt]
audio/VDVI
audio/basic[RFC2045,RFC2046]
audio/mpa-robust[RFC3119]
audio/mpeg[RFC3003]
audio/parityfec[RFC3009]
audio/prs.sid[Walleij]
audio/telephone-event[RFC2833]
audio/tone[RFC2833]
audio/vnd.3gpp.iufp[Belling]
audio/vnd.cisco.nse[Kumar]
audio/vnd.cns.anp1[McLaughlin]
audio/vnd.cns.inf1[McLaughlin]
audio/vnd.digital-winds[Strazds]
audio/vnd.everad.plj[Cicelsky]
audio/vnd.lucent.voice[Vaudreuil]
audio/vnd.nortel.vbk[Parsons]
audio/vnd.nuera.ecelp4800[Fox]
audio/vnd.nuera.ecelp7470[Fox]
audio/vnd.nuera.ecelp9600[Fox]
audio/vnd.octel.sbc[Vaudreuil]
audio/vnd.qcelp[Lundblade]
audio/vnd.rhetorex.32kadpcm[Vaudreuil]
audio/vnd.vmx.cvsd[Vaudreuil]
image/cgmComputer Graphics Metafile
image/g3fax[RFC1494]
image/gif[RFC2045,RFC2046]
image/ief[RFC1314] Image Exchange Format
image/jpeg[RFC2045,RFC2046]
image/naplps[Ferber]
image/png[Randers-Pehrson]
image/prs.btif[Simon]
image/prs.pti[Laun]
image/t38[RFC3362]
image/tiff[RFC3302] Tag Image File Format
image/tiff-fx[RFC3250] Tag Image File Format Fax eXtended
image/vnd.cns.inf2[McLaughlin]
image/vnd.djvu[Bottou]
image/vnd.dwg[Moline]
image/vnd.dxf[Moline]
image/vnd.fastbidsheet[Becker]
image/vnd.fpx[Spencer]
image/vnd.fst[Fuldseth]
image/vnd.fujixerox.edmics-mmr[Onda]
image/vnd.fujixerox.edmics-rlc[Onda]
image/vnd.globalgraphics.pgb[Bailey]
image/vnd.mix[Reddy]
image/vnd.ms-modi[Vaughan]
image/vnd.net-fpx[Spencer]
image/vnd.svf[Moline]
image/vnd.wap.wbmp[Stark]
image/vnd.xiff[S.Martin]
message/delivery-status[RFC1894]
message/disposition-notification[RFC2298]
message/external-body[RFC2045,RFC2046]
message/http[RFC2616]
message/news[RFC 1036, H.Spencer]
message/partial[RFC2045,RFC2046]
message/rfc822[RFC2045,RFC2046]
message/s-http[RFC2660]
message/sip[RFC3261]
message/sipfrag[RFC3420]
model/iges[Parks]
model/mesh[RFC2077]
model/vnd.dwf[Pratt]
model/vnd.flatland.3dml[Powers]
model/vnd.gdl[Babits]
model/vnd.gs-gdl[Babits]
model/vnd.gtw[Ozaki]
model/vnd.mts[Rabinovitch]
model/vnd.parasolid.transmit.binary[Parasolid]
model/vnd.parasolid.transmit.text[Parasolid]
model/vnd.vtu[Rabinovitch]
model/vrml[RFC2077]
multipart/alternative[RFC2045,RFC2046]
multipart/appledouble[Faltstrom]
multipart/byteranges[RFC2068]
multipart/digest[RFC2045,RFC2046]
multipart/encrypted[RFC1847]
multipart/form-data[RFC2388]
multipart/header-set[Crocker]
multipart/mixed[RFC2045,RFC2046]
multipart/parallel[RFC2045,RFC2046]
multipart/related[RFC2387]
multipart/report[RFC1892]
multipart/signed[RFC1847]
multipart/voice-message[RFC2421,RFC2423]
text/calendar[RFC2445]
text/css[RFC2318]
text/directory[RFC2425]
text/enriched[RFC1896]
text/html[RFC2854]
text/parityfec[RFC3009]
text/plain[RFC2646,RFC2046]
text/prs.lines.tag[Lines]
text/rfc822-headers[RFC1892]
text/richtext[RFC2045,RFC2046]
text/rtf[Lindner]
text/sgml[RFC1874]
text/t140[RFC2793]
text/tab-separated-values[Lindner]
text/uri-list[RFC2483]
text/vnd.DMClientScript[Bradley]
text/vnd.IPTC.NITF[IPTC]
text/vnd.IPTC.NewsML[IPTC]
text/vnd.abc[Allen]
text/vnd.curl[Byrnes]
text/vnd.fly[Gurney]
text/vnd.fmi.flexstor[Hurtta]
text/vnd.in3d.3dml[Powers]
text/vnd.in3d.spot[Powers]
text/vnd.latex-z[Lubos]
text/vnd.motorola.reflex[Patton]
text/vnd.ms-mediapackage[Nelson]
text/vnd.net2phone.commcenter.command[Xie]
text/vnd.sun.j2me.app-descriptor[G.Adams]
text/vnd.wap.si[WAP-Forum]
text/vnd.wap.sl[WAP-Forum]
text/vnd.wap.wml[Stark]
text/vnd.wap.wmlscript[Stark]
text/xml[RFC3023]
text/xml-external-parsed-entity[RFC3023]
video/BMPEG
video/BT656
video/CelB
video/DV[RFC3189]
video/H261
video/H263
video/H263-1998
video/H263-2000
video/JPEG
video/MP1S
video/MP2P
video/MP2T
video/MP4V-ES[RFC3016]
video/MPV
video/SMPTE292M[RFC-avt-smpte292-video-08.txt]
video/mpeg[RFC2045,RFC2046]
video/nv
video/parityfec[RFC3009]
video/pointer[RFC2862]
video/quicktime[Lindner]
video/vnd.fvt[Fuldseth]
video/vnd.motorola.video[McGinty]
video/vnd.motorola.videop[McGinty]
video/vnd.mpegurl[Recktenwald]
video/vnd.nokia.interleaved-multimedia[Kangaslampi]
video/vnd.objectvideo[Clark]
video/vnd.vivo[Wolfe]

12PCMParmTypeLines: 676
Used to identify whether a PCM parameter is part of the wafer acceptance test (WAT) or customer specific parameter (CSP) list. The WAT and CSP list is negotiated between the customer and the foundry for a given technology.
Entity Instances
CSPCustomer Specific Parameter.
PSRProduct Specification Limit.
WATWafer Acceptance Test.
WLRWafer Level Reliability.

13SortWeightLines: 231
A relative representation of yield for a device or module.
Entity Instances
0Bad.
100All Good.
251/4 Good.
501/2 Good.
753/4 Good.

14StatusLines: 361 484 600
Describes the Status result for a vector test.
Entity Instances
ATHH=actual H.
EHDexpect H D=actual Z.
EHFexpect H F=actual L.
ELBexpected L B=actual H.
ELEexpect L E=actual L.
EUAexpected unknown A=actual H.
EULexpect unknown L=actual L.
EUZexpect unknown Z=actual Z.
EZCexpect Z C=actual Z.
EZZexpect Z.

15TestResultLines: 353 367 374 382 476 490 497 505 592 606 613 621
Describes the test result for a parametric test.
Entity Instances
FALFailed.
FCSFailed Censor.
FHLFailed High Limit.
FLLFailed Low Limit.
PASPassed.
SCVScreened Valued.

16UnitOfMeasureLines: 285 399 522 638 675
Code identifying a product unit of measure.
Entity Instances
10P10-pack.
1BF100 Board Feet.
1FC20 Foot Container.
1GRGram/Cubic Centimeter.
1GT10,000 Gallon Tankcar.
1KB25 Kilogram Bulk Bag.
1KD10 Kilogram Drum.
1KP1000-pack.
1M21/Square Meter (1/M2).
1PA20-Pack.
1PB50 Pound Bag.
1PD100 Pound Drum.
1PM1/minute (1/min).
22SSquare Millimeter/Second (mm2/s).
2FC40 Foot Container.
2GRGram/square meter.
2GT20,000 Gallon Tankcar.
2KB300 Kilogram Bulk Bag.
2KD15 Kilogram Drum.
2PA100-Pack.
3GRGrams Per 100 Centimeters.
3KB500 Kilogram Bulk Bag.
3KD55 Gallon Drum.
3MHCubic Millimeters/Hour (mm3/hour).
4GRGrams Per 100 Grams.
4KD115 Kilogram Drum.
50P50-pack.
5GRGrams Per Cubic Centimeter.
6GRGrams Per Square Centimeter.
7GRGrams Per Square Meter.
ABCAbsorbance per centimeter (Absorbance per cm).
ABUAbsorbance per Unit (absorbance per unit).
ACCAtoms per Cubic Centimeters (atoms per cu cm).
ACRAcre.
ACSAcidic strength/concentration.
ACTActual Pounds.
ACUActivity unit (Activ.unit).
ALUAluminum Pounds Only.
AM1Ampoule.
AMNÅngstroms/Minute (Ångst/min).
AMPAmpere.
ANGAngstrom (A).
APBAtomic Parts per Billion (atomic ppb).
APGAPI Specific Gravity (API Grav).
APMAtomic Parts per Million (atomic ppm).
APTAtomic Parts per Trillion (atomic ppt).
APUAPHA Units (apha).
ASCAtoms per Square Centimeters (atoms per sq cm).
ASMAngstrom.
ASYAssembly (ASY).
ATGAtmospheric gauge.
ATMAtmosphere absolute.
ATPAtomic %.
ATYActivity.
BABBase Box.
BACBatch.
BAEBale.
BAGBag.
BALBall.
BANBand.
BAPBatting Pound.
BARBar.
BASBasket.
BATBatt.
BAWBase Weight.
BEABeam.
BECBecquerel/kilogram.
BELBelt.
BHPBrake HP.
BILBillet.
BINBin.
BITBit.
BKCBulk Car Load.
BLNBalance.
BLOBlock.
BOABoard.
BOFBoard Feet.
BOLBolt.
BOTBottle.
BOXBox.
BRBBar absolute.
BRDBarrels Per Day.
BREBarrel.
BRIBarrel (Imperial).
BRMBarrels Per Minute.
BTFBritish Thermal Units (BTUs) Per Cubic Foot.
BTPBritish Thermal Units (BTUs) Per Pound.
BTUBritish Thermal Unit (BTU).
BUBBubbler.
BUCBucket.
BUDBushel, Dry Imperial.
BUKBunks.
BULBulk.
BUNBundle.
BUPBulk Pack.
BUSBushel.
BYTBytes.
C0WCounts per Wafer (Counts/wf).
C3MCubic centimeter per minute (cm3/minute).
CAACarat.
CABCarboy.
CACCard.
CADCandela.
CAGCartridge.
CAKCask.
CALCalorie.
CANCan.
CAOCarload.
CARCar.
CASCase.
CATCanister.
CAWCatchweight.
CC2Centipoises per hour per square centimeters (cps per hr per sq cm).
CCCCounts per Square Centimeters (Counts/cm2).
CD3Cubic decimeter (Cubic dec).
CELCell.
CEMCentimeter.
CEPCentipoises (CPS).
CETCentiliter.
CGMCentigram.
CHAChains (Land Survey).
CHEChest.
CM2Square centimeter (cm2).
CMHCentimeter/hour (cm/h).
CMLColony/Milliliter (col/ml).
CMSCentimeter/Second (cm/s).
CNNConnector.
COGCoil Group.
COICoil.
COLCoulomb.
COMComposite Product Pounds (Total Weight).
CONCone.
COTContainer.
COVCover.
CRACrate.
CRTCarton.
CSECassette.
CSTCentistokes.
CUBCubic centimeter.
CUCCubic centimeter/second.
CUFCubic Foot.
CUICubic inch.
CUMCubic meter.
CUPCup.
CUYCubic yard.
CYCCycles.
CYLCylinder.
DALDalton units (dalton).
DAYDay.
DCBDecibels.
DCGDecagram.
DCLDeciliter.
DCMDefects per Square Centimeters (Defects/cm2).
DE1Defects.
DE2Degrees in Angles.
DE3Degree.
DEADeal.
DECDecimeter.
DEFDegree Fahrenheit.
DEGDegree Celsius.
DEPDep. Factor.
DFWDefects per Wafer (Defects/Wafer).
DGMDecigram.
DIEDie.
DILDisplay.
DIPDispenser.
DNCDynes per centimeter (Dynes per cm).
DOZDozen.
DPMParts per Million per Day (ppm per day).
DRADram.
DRUDrum.
DRYDry Pounds.
EACEach.
ELEElectrical Capacitance.
EMLEnzyme Units/Milliliter (Enzyme/ml).
ENUEnzyme Units (Enzy.Units).
EQ2Milliequivalent per 30 Kg (mequ/30Kg).
EQGMilliequivalent per gram (milliequivalent per g).
EQKMilliequivalent per Kilogram (mequ/Kg).
EQMMilliequivalent per Millimeter (milliequivalent per mm).
FARFarads.
FFAFemtofarad.
FIN1/32 inch.
FLOFluid Ounce.
FOIFluid Ounce (Imperial).
FOOFoot.
FOUFluid Ounce US.
FPSFeet per second (Feet/s).
FRHSales FT3 at 60°F per hour (FTR/hour).
FRMSales FT3 at 60°F per minute (FTR/min).
FTRSales FT3 at 60°F, 14.7 psia (SFT3_60F_S).
FTSSales FT3 at 70°F, 14.7 psia (SFT3_70F_S).
FTT1000 FT3 at 60°F, 14.7 psia (KFT3_60F_S).
FTU1000 FT3 at 70°F, 14.7 psia (KFT3_70F_S).
FUUFuel Usage (Gallons).
G2SGram square per second (g²/s).
GAIGram act. ingrd. (g act.ing).
GALGallon.
GASGage Systems.
GAUGram Gold.
GCLGardner Color.
GEGKeim/Gramm (keim/g).
GEQGram per Equivalent (g/Eq).
GGMGram per gram mole (g/gmole).
GHGGram per Hectogram (g/hg).
GIHGigahertz.
GIJGigajoules.
GILGill (Imperial).
GM4Gram per 100 Milliliters (g/100ml).
GMEGram per Mole Equivalent (g/mole Eq).
GMOGram per Mol (g/mol).
GNLGram act.Ingrd per Liter (gai/liter).
GOBGross Barrels.
GOGGross Gallons.
GOHGigaohm (GOhm).
GOKGross Kilogram.
GOTGross Ton.
GOYGross Yard.
GPNUS Gallon per minute (gpm US).
GRAGram.
GRGGreat Gross (Dozen Gross).
GRKGrams Per Kilogram.
GRLGrams Per Liter.
GRMGrams Per Milliliter.
GRNGrain.
GROGross.
GRPGroup.
HAGHalf Gallon.
HAHHalf Hour.
HALHalf Liter.
HANHank.
HEAHeat lots.
HECHectare.
HELHectoliter.
HEPHectopascal.
HERHertz.
HGMHegman.
HNYHenry.
HOSHours.
HOUHour.
HUAHundredth of a Carat.
HUBHundred Boxes.
HUCHundred Count.
HUSHundred Sheets.
HZMHertz per Minute (Hertz per min).
IH2Inches of Water Gauge (inH2O-g).
IHGInches of Mercury Gauge (inHg-g).
ILBInch pounds (in.lb).
IMGImperial Gallons.
INCInch.
IPSInch per second (inch / sec).
JARJar.
JKGJoule/Kilogram (J/kg).
JMOJoule/Mol (J/mol).
JOIJoint.
JOUJoule.
KAIKilogram act. Ingrd. (kg ac.ing.).
KAKkg act.ingrd. / kg (kai/kg).
KBYKilobyte.
KCMKilogram per cm2 gauge (kg/cm2-g).
KD3Kilogram per Cubic Decimeter (kg/dm3).
KEGKeg.
KELKelvin.
KGEContainer Fill Weight in Kg/Ea.
KGHKilogram per Hour (kg/h).
KGLKilograms per Liter (kg/L).
KGMKilogram/Mol (kg/mol).
KGSKilogram per Second (kg/s).
KHOKilometer/hour.
KICKilogram per cubic meter.
KIEKilometer.
KIGKilogram.
KIHKilohertz.
KIKKilobecquerel/Kilogram.
KILKiloampere.
KIMKilogram/square meter.
KIOKiloohm.
KISKilogramm pro Sekunde.
KITKit.
KIVKilovolt.
KIWKilowatt.
KJKKilojoule per kilogram (KJ/kg).
KJLKilojoule.
KJMKilojoule/Mol (KJ/mol).
KKGKilogram/Kilogram.
KMKCubic meter/Cubic meter (m3/m3).
KMNKelvin per Minute (K/min).
KMSKelvin per Second (K/s).
KNMKilonewton per square meter (kN/m2).
KNTKilonewton (ND).
KPAKilopascal (kPa).
KRUKreb Unit.
KTNKilotonne (kt).
KUDKubikdezimeter.
KUMKubikmeter pro Sekunde.
KVAKilovoltampere (kVA).
KWHKilowatt-hour.
KWRKilovolt ampere reactive hours (KVAH reac.).
LBHUS Pound per Hour (lb/hour).
LBMUS Pound per minute (lb/min).
LG2Liter per Gram per Centimeter (l/g/cm).
LGCLiters per Gram-Centimeters (l/g-cm).
LHKLiter per 100 km (l/100 km).
LIFLifts.
LIMLink.
LIQLiquid Pounds.
LITLiter.
LMILiter per Minute (l/min).
LMSLiter per Molsecond (l/mol.s).
LOALoad.
LOTLot.
LPDLight Point Defects per Wafer (LPD/Wafer).
LPHLiter per hour (l/hr).
LUGLug.
M15Micron per 15 Square Millimeters (mu per 15 sq mm).
M20Micron per 20 Square Millimeters (mu per 20 sq mm).
M25Micron per 25 Square Millimeters (mu per 25 sq mm).
M26Micron per 26 by 8 Millimeters (mu per 26 by 8 mm).
M2GMeters square per gram (m sq per gram).
M3ASales m3 at 15 °C, 1 atmos (Sm3_15C_S).
M3BSales m3 at 21 °C, 1 atmos (Sm3_21C_S).
M3CSales m3 at 10 °C, 1 atmos (Sm3_10C_S).
M3DSales m3 at 43 °C, 1 bar (Sm3_43C_D).
M3ESales m3 at 9 °C, 1 bar (Sm3_9C_D).
M3FSales m3 at 15 °C, 1 bar (Sm3_15C_D).
M3GSales m3 at 27 °C, 1 atmos (Sm3_27C_S).
M3HCubic Meter per Hour (m3/h).
M3JSales m3 at 35 °C, 1 atmos (Sm3_35C_S).
M3KCubic Meter/Kilogram (m3/Kg).
M3MMilliliter per Cubic Meter (ml/m3).
M3NMol per Cubic Meter (Mol/m3).
MAMMilliamps/mm.
MATMat.
MBYMegabyte.
MBZMeterbar per Second (m.bar/s).
MC2Millisecond per Centimeter (mS/cm).
MCAMicroampere (µA).
MCGMicrogram.
MCHMicromhos (µmhos).
MCKMicrocuries per Kilogram (µci/kg).
MCLMicrocuries per Gaseous Liter (µc/l).
MCMMilligrams Per Cubic Meter.
MCNMetal Can.
MCPManifolded Cylinder Pack.
MCRMicron.
MEGMegagram.
MEHMegahertz.
MEJMegajoule (MJ).
MEPMegapascal.
METMeter.
MEWMegawatt.
MFDMicrofarad (µF).
MGAMilligram per Amp (mg per amp).
MGFMilligram per Square Centimeter (mg/cm2).
MGGMilligram per Gram (mg/g).
MGLMicrogram per Liter (µg/l).
MGMMilligram.
MGOMegohm (MOhm).
MGRMicrograms per Gram (µg/g).
MGSMilligram per Second (mg per sec).
MH1Millimeter per Hour (mm/h).
MHCMicromhos per Centimeter (µmhos/cm).
MHRMeter per Hour (m/h).
MHVMegavolt.
MIBMillion BTU's.
MICMikrogram/cubic meter.
MIGMicrograms Per Cubic Meter.
MILMile.
MIMMicrometer.
MINMinute.
MIPMillipascal seconds.
MISMicrosecond.
MITMiter.
MIVMillivolt.
MIWMilliwatt.
MJMWobbe Number (MJ/m3).
MJOMillijoule.
MKGMilligrams of KOH per Gram (mg KOH per g).
MKLMillimol per Gram (mmol/g).
ML1Milliliter per Liter (ml/l).
ML2Milliliter per Liter (ml/l).
ML3Mol per Liter (Mol/Liter).
ML4Millimol per Liter (Millimol/l).
MLAMilliampere.
MLBMillibar.
MLCMilligram/cubic meter.
MLGMilliliter per Gallon (ml per gal).
MLIMilliliter.
MLKMilligram/kilogram.
MLLMilligram/Liter.
MLMMole per Mole (mole/mole).
MLPMole Percent (% mole).
MLRMicroliter (µl).
MLSMiles.
MLWMilliliter act. Ingr. (ml act.in.).
MM3Cubic Millimeter (mm3).
MMAMillimeter per Year (mm/a).
MMEMillimeter.
MMGMillimol/gram (mmol/g).
MMHMillimeter H20.
MMKMillimol/kilogram.
MMM 0.000001 meter (1 millionth of a meter). (Micrometer/Micron).
MMNMeter per Minute (m/min).
MMOMillimol.
MMSMillimeter per Second (mm/s).
MNMMillinewton per meter (mN/m).
MNTMeganewton (MN).
MOKMol/kilogram.
MOLMol.
MONMonth.
MPBMass parts per billion (ppb(m)).
MPGMiles per Gallon (US) (Mi/Gal(US)).
MPHMegagrams Per Hour.
MPMMass Parts per Million (ppm(m)).
MPTMass Parts per Trillion (ppt(m)).
MPZMeterpascal per Second (m.Pa/s).
MQGMircoequivalent per Gram (microeq/g).
MRFMillifarad (mF).
MS1MilliSiemen per Centimeter (mS/cm).
MS2Meter per Second Squared (m/s2).
MS3Microsiemens per Centimeter (µS/cm).
MSCMillisecond.
MSMMilligrams Per Square Meter.
MTAMillitesla.
MTQMeter pro Quadratsekunde.
MTRMeter (m).
MTSMeters per second.
MULMultichip - When 2 or more dies (chips) are merged into one package.
MVAMegavoltampere (MVA).
MVSMillivolts.
MVTMillivolt.
MWHMegawatt Hours (mwh).
MWRMegavolt Ampere Reactive Hours (MVAH reac.).
MWTMolecular Weight (mW).
MYSMicro Siemens (mic. Siem.).
N2MNewton/Square millimeter (N/mm2).
NAANanoamps.
NAMNanometer.
NASNanosecond.
NEBNet Barrels.
NEGNet Gallons.
NEINet Imperial Gallons.
NELNet Liters.
NEWNewton.
NM2Newton per Square Meter (N/m²).
NM3Normal m3 at 0°C, 1 atmos (Normal m3).
NMHNewton per Hour (N/h).
NMMNewton per Millimeter (N/mm).
NMRNormal m3 per Hour (Nm3/h).
NOLNormality.
NPKNowpac Container (Nowpac).
NRGBar Gauge.
NRUNanofarad (nF).
NTUNephelometric Turbidity Units (NTU).
NTYEquivalents per Liter (equ/l).
NUMNumbers.
NWMNewton per Meter (N/m).
NXMNewton per 25 mm (N/25mm).
O2PPercent Oxygen (% Oxygen).
OCTOhm/ct.
OHCOhm-Centimeter (ohm cm).
OHMOhm.
OMMOhm/mm.
ONEOne.
OPHOperating hour (Oper. Hour).
OSQOhm/sq.
OTPOne Thousand Pieces.
OUNOunce.
OVIOhm/via.
OZGOunce per Gallon (oz per gal).
PACParcel.
PADPad.
PAGPackage.
PAIPail.
PAKPack (PAK).
PALPallet.
PANPanel.
PARPair.
PASPascal.
PATPacket.
PBAPPBA Silicon (ppba Si).
PBWParts Per Billion by Weight (ppbw).
PC2Parts per Square Centimeters (part per sq cm).
PCAPercent Active (% Active).
PCLPicocuries per Liter (pCi/l).
PECPercent.
PEGPercentage.
PEHPercent Per 1000 Hours.
PENPennyweight.
PERPer Hundred Pieces.
PEWPercent Weight.
PF3Per Cubic Foot (per cu ft).
PF4Particles per Cubic Feet (particles per cu ft).
PFAPercent Failed Area (Failed Area %).
PFRPicofarad.
PHPH Factor (pH).
PI2Parts per Square Inch (part per sq in).
PIDPint U.S. Dry.
PIEPiece.
PILPint - US liquid.
PL1Parts per Liter (parts per l).
PL2Parts per Milliliter (parts per ml).
PL3Part per Millilitre (Part/ml).
PLAPlate.
PLIPounds per Linear Inch (lb/Lin. In).
PLLPallet (Lift).
PLRPer Liter.
PLTPalette.
PLUPallet/Unit Load.
PMAPercent Mass (%(m)).
PMIPer Mille (%0).
PMLParticles per Milliliter (particles/mL).
PMOPer Mille mass (%0(mass)).
PMPParts Per Million Platinum (ppm Pt).
PMVParts Per Million (weight/Vol) (ppm (w/v)).
PMWParts Per Million by Weight (ppmw).
PNJParticles per Injection (particles per inj).
PNTPoints.
POFPounds Per Foot.
POGPounds Per Gallon.
PONPound.
POPPounds Per Piece of Product.
PORPores.
POSPounds Per 1000 Square Feet.
POTPounds Per Thousand.
PP3Parts per Million mole (ppm mole).
PP4Parts per Billion Mole (ppb mole).
PPBParts per billion (US).
PPFParts per Ft3 (Parts/Ft3).
PPHParts Per Hundred (pph).
PPMParts per million.
PPPPounds Per Pound of Product.
PPTParts per Trillion (ppt).
PRSNumber of Persons.
PSAPounds per Square Inch Absolute.
PSCPicosecond.
PSGPound per Square Inch Gauge (psi gauge).
PSIPSI Unit (PSI).
PSSPascal second.
PSVPoise.
PTLParticles per Liter (Part/Liter).
PWFParticles per Wafer (particles/wf).
QMLKilomol (kmol).
QUAQuart - US liquid.
RACRack.
REAReam of 500 Sheets.
REEReel.
RINRing.
RLURelative Light Unit (RLU).
RODRod.
ROLRoll.
RPMRevolutions per Minute (Revs/min).
SACSack.
SBBSuper Bulk Bag.
SCLScales.
SECSecond.
SETSet.
SHESheet.
SHIShipment.
SHMSheet - Metric measure.
SHOShot.
SIDDisk (Disc).
SIESiemens per Meter (Siemens/m).
SKESkein.
SKISkid.
SLESleeve.
SLISlip Sheet.
SMISquare mile.
SMMSquare millimeter.
SPOSpool.
SQFSquare foot.
SQISquare inch.
SQKSquare kilometer.
SQMSquare meter.
SQSSquare meter/second.
SQUSquare.
SQYSquare Yard.
STIStick.
STMStatute Mile.
STPSteps.
STRStrip.
STUStabilizer Units (SU).
SVUSay Bolt Viscosity Units (SVU).
TABTablet.
TANTank.
TARTarget pieces (target).
TATTank Truck.
TESTesla.
THOThousand.
TM31/Cubic Meter (1/m3).
TNNTonne.
TOMTon per Cubic Meter (t/m3).
TONTon.
TORTorr.
TOTTote.
TPTPass Test (Pass).
TRATrain.
TRFTrack Foot.
TRLTrailer.
TROTroy.
TRUTruckload.
TRYTray.
TRZTroy OZ.
TUBTube.
ULUUnitless Unit of Measure.
UNTUnit.
USGUS gallon.
USPUS pound.
USTUS ton.
VALVO mat. (Value).
VAPVoltampere (VA).
VHNVickers Micro-Hardness (VHN10).
VIAVial.
VMPMolar %.
VOLVolt.
VPBVolume Parts per Billion (ppb(V)).
VPCPercent Volume (%(V)).
VPMVolume Parts per Million (ppm(V)).
VPRPer Mille Volume (%O(V)).
VPTVolume parts per Trillion (ppt(V)).
VTAVolts (Alternating Current).
VTDVolts (Direct Current).
VTMVolts Per Meter.
WAFWafer.
WARWatt.
WEEWeek.
WPTParts Per Trillion by Weight (pptw).
WRAWrap.
YARYard.
YEAYear.

Data Types
NoNameFormatData Type
1BusinessProcessIdentifierpattern = [0-9a-zA-Z]{1,12}
string
2Contactstring
3DUNSPlus4pattern = [0-9]{9}[0-9a-zA-Z]{1,4}
string
4DUNSpattern = [0-9]{9}
string
5GLNpattern = [0-9]{13}
string
6GTINpattern = [0-9]{14}
string
7Hexadecimalpattern = [0-9a-fA-F]{1,}
string
8PercentAmounttotalDigits = 6
decimal
9PipIdentifierpattern = PIP\d{1}[A-Z]{1}\d{1,2}
string
10PipVersionpattern = \d{2}\.\d{2}\.\d{2}
string
11VersionIdentifierpattern = \d{2}\.\d{2}
string

XML Data Types
NoNameDefinition
1anyURIRepresents a URI as defined by RFC 2396. An anyURI value can be absolute or relative, and may have an optional fragment identifier.
2booleanRepresents Boolean values, which are either "true" or "false".
3dateTimeRepresents a specific instance of time. The pattern for dateTime is CCYY-MM-DDThh:mm:ss where CC represents the century, YY the year, MM the month, and DD the day, preceded by an optional leading negative (-) character to indicate a negative number. If the negative character is omitted, positive (+) is assumed. The T is the date/time separator and hh, mm, and ss represent hour, minute, and second respectively. Additional digits can be used to increase the precision of fractional seconds if desired. For example, the format ss.ss... with any number of digits after the decimal point is supported. The fractional seconds part is optional.
This representation may be immediately followed by a "Z" to indicate Coordinated Universal Time (UTC) or to indicate the time zone. For example, the difference between the local time and Coordinated Universal Time, immediately followed by a sign, + or -, followed by the difference from UTC represented as hh:mm (minutes is required). If the time zone is included, both hours and minutes must be present.
4decimalA data type that contains decimal numbers scaled by a power of 10.
5floatRepresents single-precision 32-bit floating-point numbers.
6integerRepresents a sequence of decimal digits with an optional leading sign (+ or -). This data type is derived from decimal.
7positiveIntegerRepresents an integer that is greater than zero. This data type is derived from nonNegativeInteger.
8stringRepresents character string.