1 | 1 | SemiconductorTestDataNotification |
2 | 0..1 | |-- DocumentHeader |
3 | 0..1 | | |-- CorrelationInformation |
4 | 0..1 | | | |-- ContractInformation |
5 | 0..1 | | | | |-- ContractIdentifier |
6 | 0..1 | | | | |-- ContractType |
7 | 0..1 | | | |-- RequestingDocumentInformation |
8 | 0..1 | | | | |-- BusinessProcessInstanceIdentifier |
9 | 0..1 | | | | |-- RequestingDocumentCreationDateTime |
10 | 1 | | | | |-- RequestingDocumentInstanceIdentifier |
11 | 0..1 | | | | |-- ResponseDateTime |
12 | 1 | | |-- DocumentInformation |
13 | 1 | | | |-- Creation |
14 | 1 | | | |-- DocumentIdentification |
15 | 1 | | | | |-- Identifier |
16 | 0..1 | | | | |-- Type |
17 | 1 | | | | |-- Choice |
18 | 1 | | | | | |-- StandardDocumentIdentification |
19 | 0..1 | | | | | | |-- Standard |
20 | 1 | | | | | | |-- Version |
21 | 1 | | | | | |-- TpirPipIdentification |
22 | 0..1 | | | | | | |-- FileType |
23 | 1 | | | | | | |-- PartnerId |
24 | 1 | | | | | | |-- PipIdentifier |
25 | 1 | | | | | | |-- PipVersion |
26 | 0..1 | | | | | | |-- TpirBusinessProcessIdentifier |
27 | 1 | | | | | | |-- TpirPipVersion |
28 | 0..1 | | | | | | |-- Uri |
29 | 0..1 | | | |-- DocumentManifest |
30 | 1..n | | | | |-- ManifestItem |
31 | 0..1 | | | | | |-- Description |
32 | 0..1 | | | | | |-- Language |
33 | 0..1 | | | | | |-- Length |
34 | 1 | | | | | |-- MimeTypeQualifier |
35 | 1 | | | | | |-- UniversalResourceIdentifier |
36 | 0..1 | | | | |-- MultipleType |
37 | 1 | | | | |-- NumberOfItems |
38 | 0..1 | | | |-- DocumentSecurity |
39 | 1 | | | | |-- NonRepudiableReceipt |
40 | 1 | | | | |-- PersistentEncryption |
41 | 1 | | | | |-- PersistentSignature |
42 | 0..1 | | |-- HeaderVersion |
43 | 1 | | |-- Receiver |
44 | 0..1 | | | |-- BusinessServiceInformation |
45 | 1 | | | | |-- ActionName |
46 | 1 | | | | |-- ProcessIdentifier |
47 | 0..1 | | | | |-- ProcessReference |
48 | 0..1 | | | | |-- ProcessState |
49 | 1 | | | | |-- ServiceName |
50 | 0..n | | | |-- ContactInformation |
51 | 1 | | | | |-- Contact |
52 | 0..1 | | | | |-- Email |
53 | 0..1 | | | | |-- Fax |
54 | 0..1 | | | | |-- Identifier |
55 | 0..1 | | | | |-- Phone |
56 | 1 | | | |-- PartnerIdentification |
57 | 0..1 | | | | |-- PartnerName |
58 | 1 | | | | |-- Choice |
59 | 1..n | | | | | |-- AlternativeIdentifier |
60 | 1 | | | | | | |-- Authority |
61 | 1 | | | | | | |-- Identifier |
62 | 1 | | | | | |-- DUNS |
63 | 1 | | | | | |-- DUNSPlus4 |
64 | 1 | | | | | |-- GLN |
65 | 1 | | |-- Sender |
66 | 0..1 | | | |-- BusinessServiceInformation |
67 | 1 | | | | |-- ActionName |
68 | 1 | | | | |-- ProcessIdentifier |
69 | 0..1 | | | | |-- ProcessReference |
70 | 0..1 | | | | |-- ProcessState |
71 | 1 | | | | |-- ServiceName |
72 | 0..n | | | |-- ContactInformation |
73 | 1 | | | | |-- Contact |
74 | 0..1 | | | | |-- Email |
75 | 0..1 | | | | |-- Fax |
76 | 0..1 | | | | |-- Identifier |
77 | 0..1 | | | | |-- Phone |
78 | 1 | | | |-- PartnerIdentification |
79 | 0..1 | | | | |-- PartnerName |
80 | 1 | | | | |-- Choice |
81 | 1..n | | | | | |-- AlternativeIdentifier |
82 | 1 | | | | | | |-- Authority |
83 | 1 | | | | | | |-- Identifier |
84 | 1 | | | | | |-- DUNS |
85 | 1 | | | | | |-- DUNSPlus4 |
86 | 1 | | | | | |-- GLN |
87 | 1..n | |-- LotReport |
88 | 0..1 | | |-- BALocation |
89 | 0..1 | | | |-- GlobalWorkInProcessLocationCode |
90 | 0..1 | | | |-- Location |
91 | 1 | | | | |-- Choice |
92 | 1..n | | | | | |-- AlternativeIdentifier |
93 | 1 | | | | | | |-- Authority |
94 | 1 | | | | | | |-- Identifier |
95 | 1 | | | | | |-- DUNS |
96 | 1 | | | | | |-- DUNSPlus4 |
97 | 1 | | | | | |-- GLN |
98 | 0..1 | | | |-- PhysicalAddress |
99 | 1 | | | | |-- AddressLine1 |
100 | 0..1 | | | | |-- AddressLine2 |
101 | 0..1 | | | | |-- AddressLine3 |
102 | 0..1 | | | | |-- AddressLine4 |
103 | 0..1 | | | | |-- AddressLine5 |
104 | 1 | | | | |-- CityName |
105 | 1 | | | | |-- Country |
106 | 0..1 | | | | |-- CountrySubdivision |
107 | 0..1 | | | | |-- PostalCode |
108 | 0..1 | | | | |-- PostOfficeBox |
109 | 0..1 | | | |-- ProprietaryLabel |
110 | 0..1 | | |-- Confidentiality |
111 | 0..1 | | |-- FabLocation |
112 | 0..1 | | | |-- GlobalWorkInProcessLocationCode |
113 | 0..1 | | | |-- Location |
114 | 1 | | | | |-- Choice |
115 | 1..n | | | | | |-- AlternativeIdentifier |
116 | 1 | | | | | | |-- Authority |
117 | 1 | | | | | | |-- Identifier |
118 | 1 | | | | | |-- DUNS |
119 | 1 | | | | | |-- DUNSPlus4 |
120 | 1 | | | | | |-- GLN |
121 | 0..1 | | | |-- PhysicalAddress |
122 | 1 | | | | |-- AddressLine1 |
123 | 0..1 | | | | |-- AddressLine2 |
124 | 0..1 | | | | |-- AddressLine3 |
125 | 0..1 | | | | |-- AddressLine4 |
126 | 0..1 | | | | |-- AddressLine5 |
127 | 1 | | | | |-- CityName |
128 | 1 | | | | |-- Country |
129 | 0..1 | | | | |-- CountrySubdivision |
130 | 0..1 | | | | |-- PostalCode |
131 | 0..1 | | | | |-- PostOfficeBox |
132 | 0..1 | | | |-- ProprietaryLabel |
133 | 0..1 | | |-- FileDataVersion |
134 | 0..1 | | |-- FinalTestLocation |
135 | 0..1 | | | |-- GlobalWorkInProcessLocationCode |
136 | 0..1 | | | |-- Location |
137 | 1 | | | | |-- Choice |
138 | 1..n | | | | | |-- AlternativeIdentifier |
139 | 1 | | | | | | |-- Authority |
140 | 1 | | | | | | |-- Identifier |
141 | 1 | | | | | |-- DUNS |
142 | 1 | | | | | |-- DUNSPlus4 |
143 | 1 | | | | | |-- GLN |
144 | 0..1 | | | |-- PhysicalAddress |
145 | 1 | | | | |-- AddressLine1 |
146 | 0..1 | | | | |-- AddressLine2 |
147 | 0..1 | | | | |-- AddressLine3 |
148 | 0..1 | | | | |-- AddressLine4 |
149 | 0..1 | | | | |-- AddressLine5 |
150 | 1 | | | | |-- CityName |
151 | 1 | | | | |-- Country |
152 | 0..1 | | | | |-- CountrySubdivision |
153 | 0..1 | | | | |-- PostalCode |
154 | 0..1 | | | | |-- PostOfficeBox |
155 | 0..1 | | | |-- ProprietaryLabel |
156 | 0..1 | | |-- GlobalLotStatusCode |
157 | 1 | | |-- Lot |
158 | 0..n | | | |-- AlternativePN |
159 | 0..1 | | | | |-- ProductName |
160 | 0..1 | | | | |-- Revision |
161 | 1 | | | | |-- Choice |
162 | 1..n | | | | | |-- AlternativeIdentifier |
163 | 1 | | | | | | |-- Authority |
164 | 1 | | | | | | |-- Identifier |
165 | 1 | | | | | |-- GTIN |
166 | 0..n | | | |-- ContractorLotNumber |
167 | 0..1 | | | | |-- IdSuffix |
168 | 0..1 | | | | |-- ManufacturingID |
169 | 0..1 | | | |-- CustomerLotNumber |
170 | 0..1 | | | | |-- IdSuffix |
171 | 0..1 | | | | |-- ManufacturingID |
172 | 0..1 | | | |-- CustomerPN |
173 | 0..1 | | | | |-- ProductName |
174 | 0..1 | | | | |-- Revision |
175 | 1 | | | | |-- Choice |
176 | 1..n | | | | | |-- AlternativeIdentifier |
177 | 1 | | | | | | |-- Authority |
178 | 1 | | | | | | |-- Identifier |
179 | 1 | | | | | |-- GTIN |
180 | 0..1 | | | |-- LotType |
181 | 0..1 | | | |-- NominalSize |
182 | 0..1 | | | |-- ProductName |
183 | 0..n | | | |-- SubLot |
184 | 0..1 | | | | |-- IdSuffix |
185 | 0..1 | | | | |-- ManufacturingID |
186 | 0..1 | | | |-- Technology |
187 | 0..n | | |-- OtherLocation |
188 | 0..1 | | | |-- GlobalWorkInProcessLocationCode |
189 | 0..1 | | | |-- Location |
190 | 1 | | | | |-- Choice |
191 | 1..n | | | | | |-- AlternativeIdentifier |
192 | 1 | | | | | | |-- Authority |
193 | 1 | | | | | | |-- Identifier |
194 | 1 | | | | | |-- DUNS |
195 | 1 | | | | | |-- DUNSPlus4 |
196 | 1 | | | | | |-- GLN |
197 | 0..1 | | | |-- PhysicalAddress |
198 | 1 | | | | |-- AddressLine1 |
199 | 0..1 | | | | |-- AddressLine2 |
200 | 0..1 | | | | |-- AddressLine3 |
201 | 0..1 | | | | |-- AddressLine4 |
202 | 0..1 | | | | |-- AddressLine5 |
203 | 1 | | | | |-- CityName |
204 | 1 | | | | |-- Country |
205 | 0..1 | | | | |-- CountrySubdivision |
206 | 0..1 | | | | |-- PostalCode |
207 | 0..1 | | | | |-- PostOfficeBox |
208 | 0..1 | | | |-- ProprietaryLabel |
209 | 0..1 | | |-- PartnerSecurityID |
210 | 0..n | | |-- Pin |
211 | 0..1 | | | |-- Channel |
212 | 0..1 | | | |-- ChipPinName |
213 | 0..1 | | | |-- ModulePinName |
214 | 1 | | | |-- PositionID |
215 | 0..1 | | | |-- Signal |
216 | 0..1 | | | |-- Type |
217 | 0..1 | | |-- QualityCode |
218 | 0..1 | | |-- RetestSorts |
219 | 0..1 | | |-- RetestType |
220 | 0..n | | |-- Sort |
221 | 0..1 | | | |-- BinAssignment |
222 | 0..1 | | | |-- HardSort |
223 | 0..1 | | | |-- HardSortName |
224 | 0..1 | | | |-- HardSortSymbol |
225 | 0..n | | | |-- PassVisualInspection |
226 | 0..1 | | | |-- RepairableFlag |
227 | 0..n | | | |-- SortCount |
228 | 1 | | | |-- SortID |
229 | 0..1 | | | |-- SortName |
230 | 0..1 | | | |-- SortSymbol |
231 | 0..1 | | | |-- SortWeight |
232 | 1 | | |-- TestOperationDescription |
233 | 0..1 | | | |-- LotEndDateTime |
234 | 0..1 | | | |-- LotStartDateTime |
235 | 0..1 | | | |-- LotStatusCompletion |
236 | 1..n | | | |-- TestOpIdentification |
237 | 1..n | | | | |-- SetupReport |
238 | 0..n | | | | | |-- ChipPeriodicity |
239 | 0..1 | | | | | | |-- Description |
240 | 1 | | | | | | |-- FloatCoordinate |
241 | 0..1 | | | | | | | |-- X |
242 | 0..1 | | | | | | | |-- Y |
243 | 0..1 | | | | | | | |-- Z |
244 | 0..1 | | | | | |-- CoordinateFlag |
245 | 1..n | | | | | |-- Dimension |
246 | 0..1 | | | | | | |-- Axis |
247 | 0..1 | | | | | | |-- Maximum |
248 | 0..1 | | | | | | |-- Minimum |
249 | 0..1 | | | | | |-- HeadID |
250 | 0..1 | | | | | |-- Notch |
251 | 0..1 | | | | | |-- ParallelTest |
252 | 0..1 | | | | | |-- ProbeName |
253 | 0..1 | | | | | |-- Quadrant |
254 | 0..1 | | | | | |-- SampleRate |
255 | 0..n | | | | | |-- SoftwareReport |
256 | 0..1 | | | | | | |-- BuildID |
257 | 0..1 | | | | | | |-- Name |
258 | 0..1 | | | | | | |-- Type |
259 | 0..1 | | | | | | |-- Version |
260 | 1 | | | | | |-- Tester |
261 | 1 | | | | | | |-- EquipmentID |
262 | 0..n | | | | | | |-- HardwareSets |
263 | 0..n | | | | | | | |-- TesterAttachment |
264 | 0..1 | | | | | | | | |-- AttachID |
265 | 0..1 | | | | | | | | |-- AttachName |
266 | 0..n | | | | | | | |-- TesterFEH |
267 | 0..1 | | | | | | | | |-- AttachmentID |
268 | 0..1 | | | | | | | | |-- Name |
269 | 0..1 | | | | | | | | |-- TestingPeriod |
270 | 0..1 | | | | | | | | | |-- End |
271 | 0..1 | | | | | | | | | |-- Start |
272 | 0..1 | | | | | | | | |-- Type |
273 | 1 | | | | | |-- TestSetup |
274 | 0..1 | | | | | | |-- CustomerTestProgramEC |
275 | 0..1 | | | | | | |-- CustomerTestProgramName |
276 | 0..1 | | | | | | |-- PrimaryIdentifier |
277 | 0..1 | | | | | | |-- SetupName |
278 | 0..1 | | | | | | |-- SetupVersion |
279 | 0..1 | | | | | | |-- TesterControlSoftware |
280 | 0..1 | | | | | | |-- TesterType |
281 | 0..1 | | | | | | |-- TestProgEC |
282 | 1 | | | | | | |-- TestProgramName |
283 | 0..1 | | | | | | |-- TestTemperature |
284 | 1 | | | | | | | |-- TargetTestTemperature |
285 | 1 | | | | | | | |-- UnitOfMeasure |
286 | 0..1 | | | | |-- SlotID |
287 | 0..1 | | | | |-- TestLevel |
288 | 1 | | | | |-- TestMode |
289 | 0..1 | | | | |-- WaferShortID |
290 | 0..1 | | | | |-- WaferTestingPeriod |
291 | 0..1 | | | | | |-- End |
292 | 0..1 | | | | | |-- Start |
293 | 0..1 | | | | |-- WaferUniqueID |
294 | 1 | | | | |-- Choice |
295 | 1 | | | | | |-- FinalTest |
296 | 1..n | | | | | | |-- Die |
297 | 0..1 | | | | | | | |-- ChipPN |
298 | 0..1 | | | | | | | |-- DieReticlePN |
299 | 0..1 | | | | | | | |-- PackageDescription |
300 | 0..1 | | | | | | | |-- PartText |
301 | 0..1 | | | | | | | |-- SerialNumber |
302 | 1..n | | | | | | | |-- TestReport |
303 | 0..n | | | | | | | | |-- BuildInfoReport |
304 | 0..1 | | | | | | | | | |-- ComponentDescription |
305 | 0..1 | | | | | | | | | |-- ComponentID |
306 | 0..1 | | | | | | | | | |-- ComponentLocation |
307 | 1 | | | | | | | | | |-- ComponentNumber |
308 | 0..1 | | | | | | | | | |-- ComponentParentNumber |
309 | 0..1 | | | | | | | | | |-- ComponentSerialNumber |
310 | 0..1 | | | | | | | | | |-- ComponentType |
311 | 0..1 | | | | | | | | | |-- UserSite |
312 | 0..n | | | | | | | | |-- CalcFailReport |
313 | 0..1 | | | | | | | | | |-- ComponentNumber |
314 | 1 | | | | | | | | | |-- ErrorCode |
315 | 0..1 | | | | | | | | | |-- FailValue |
316 | 1 | | | | | | | | | |-- PrimaryIdentifier |
317 | 0..1 | | | | | | | | | |-- Sequence |
318 | 0..1 | | | | | | | | | |-- UserSite |
319 | 0..n | | | | | | | | |-- DieReport |
320 | 0..1 | | | | | | | | | |-- CharFlag |
321 | 0..1 | | | | | | | | | |-- CompositeFailSort |
322 | 0..1 | | | | | | | | | |-- DieTestingPeriod |
323 | 0..1 | | | | | | | | | | |-- End |
324 | 0..1 | | | | | | | | | | |-- Start |
325 | 0..1 | | | | | | | | | |-- FirstFailSort |
326 | 0..1 | | | | | | | | | |-- GangTest |
327 | 0..1 | | | | | | | | | | |-- IntCoordinate |
328 | 0..1 | | | | | | | | | | | |-- X |
329 | 0..1 | | | | | | | | | | | |-- Y |
330 | 0..1 | | | | | | | | | | | |-- Z |
331 | 1 | | | | | | | | | | |-- StripTestID |
332 | 1 | | | | | | | | | | |-- StripTestOrientation |
333 | 0..1 | | | | | | | | | |-- IntCoordinate |
334 | 0..1 | | | | | | | | | | |-- X |
335 | 0..1 | | | | | | | | | | |-- Y |
336 | 0..1 | | | | | | | | | | |-- Z |
337 | 0..1 | | | | | | | | | |-- UserSite |
338 | 0..n | | | | | | | | |-- ECIDReport |
339 | 0..1 | | | | | | | | | |-- ComponentNumber |
340 | 0..1 | | | | | | | | | |-- DecodedID |
341 | 0..1 | | | | | | | | | |-- Decoder |
342 | 0..1 | | | | | | | | | |-- ECIDType |
343 | 1 | | | | | | | | | |-- IntCoordinate |
344 | 0..1 | | | | | | | | | | |-- X |
345 | 0..1 | | | | | | | | | | |-- Y |
346 | 0..1 | | | | | | | | | | |-- Z |
347 | 0..1 | | | | | | | | | |-- RawBits |
348 | 0..n | | | | | | | | |-- FPReport |
349 | 0..1 | | | | | | | | | |-- BufferNumber |
350 | 0..1 | | | | | | | | | |-- ComponentNumber |
351 | 0..1 | | | | | | | | | |-- FailLimExceeded |
352 | 1 | | | | | | | | | |-- PrimaryIdentifier |
353 | 0..1 | | | | | | | | | |-- TestResult |
354 | 0..1 | | | | | | | | | |-- UserSite |
355 | 0..1 | | | | | | | | | |-- UsingPatternCnts |
356 | 0..1 | | | | | | | | | |-- VectorReport |
357 | 0..1 | | | | | | | | | | |-- Address1 |
358 | 0..1 | | | | | | | | | | |-- Address2 |
359 | 0..1 | | | | | | | | | | |-- CycleCnt |
360 | 1 | | | | | | | | | | |-- Pins |
361 | 1 | | | | | | | | | | |-- Status |
362 | 0..1 | | | | | | | | | | |-- VectorLabel |
363 | 0..n | | | | | | | | |-- FunctionalPinReport |
364 | 0..1 | | | | | | | | | |-- Bits |
365 | 0..1 | | | | | | | | | |-- ComponentNumber |
366 | 1 | | | | | | | | | |-- PrimaryIdentifier |
367 | 0..1 | | | | | | | | | |-- TestResult |
368 | 0..1 | | | | | | | | | |-- UserSite |
369 | 0..n | | | | | | | | |-- PPReport |
370 | 0..1 | | | | | | | | | |-- ComponentNumber |
371 | 0..n | | | | | | | | | |-- PPResult |
372 | 1 | | | | | | | | | | |-- Measurement |
373 | 1 | | | | | | | | | | |-- Pin |
374 | 0..1 | | | | | | | | | | |-- TestResult |
375 | 1 | | | | | | | | | |-- PrimaryIdentifier |
376 | 0..1 | | | | | | | | | |-- UserSite |
377 | 0..n | | | | | | | | |-- PRReport |
378 | 0..1 | | | | | | | | | |-- ComponentNumber |
379 | 1 | | | | | | | | | |-- Measurement |
380 | 1 | | | | | | | | | |-- PrimaryIdentifier |
381 | 0..1 | | | | | | | | | |-- TesterAlarm |
382 | 0..1 | | | | | | | | | |-- TestResult |
383 | 0..1 | | | | | | | | | |-- UserSite |
384 | 0..n | | | | | | | | |-- StringReport |
385 | 0..1 | | | | | | | | | |-- ComponentNumber |
386 | 0..1 | | | | | | | | | |-- Keyword |
387 | 0..1 | | | | | | | | | |-- PrimaryIdentifier |
388 | 0..1 | | | | | | | | | |-- UserSite |
389 | 0..1 | | | | | | | | | |-- Value |
390 | 0..n | | | | | | | | |-- TestMap |
391 | 0..1 | | | | | | | | | |-- CenterX |
392 | 0..1 | | | | | | | | | |-- CenterY |
393 | 0..1 | | | | | | | | | |-- LogicalMax |
394 | 0..1 | | | | | | | | | |-- LogicalMin |
395 | 0..1 | | | | | | | | | |-- MeasurementUnit |
396 | 1 | | | | | | | | | | |-- Choice |
397 | 1 | | | | | | | | | | | |-- ProprietaryUnits |
398 | 1 | | | | | | | | | | | | |-- Units |
399 | 1 | | | | | | | | | | | |-- UnitOfMeasure |
400 | 0..1 | | | | | | | | | |-- PosDirX |
401 | 0..1 | | | | | | | | | |-- PosDirY |
402 | 0..1 | | | | | | | | | |-- RetDieRelationX |
403 | 0..1 | | | | | | | | | |-- RetDieRelationY |
404 | 0..1 | | | | | | | | | |-- RetDimensionX |
405 | 0..1 | | | | | | | | | |-- RetDimensionY |
406 | 0..1 | | | | | | | | | |-- WaferCoordinate |
407 | 0..1 | | | | | | | | | | |-- MaxX |
408 | 0..1 | | | | | | | | | | |-- MaxY |
409 | 0..1 | | | | | | | | | | |-- MinX |
410 | 0..1 | | | | | | | | | | |-- MinY |
411 | 0..n | | | | | | |-- YieldReport |
412 | 0..1 | | | | | | | |-- GoodDieQuantity |
413 | 0..1 | | | | | | | |-- GrossDiePerWafer |
414 | 0..1 | | | | | | | |-- OtherDefectQuantity |
415 | 0..1 | | | | | | | |-- TestQty |
416 | 0..1 | | | | | | | |-- TestYld |
417 | 0..1 | | | | | | | |-- TotalFunctionalDie |
418 | 1 | | | | | |-- PCM |
419 | 1..n | | | | | | |-- Die |
420 | 0..1 | | | | | | | |-- ChipPN |
421 | 0..1 | | | | | | | |-- DieReticlePN |
422 | 0..1 | | | | | | | |-- PackageDescription |
423 | 0..1 | | | | | | | |-- PartText |
424 | 0..1 | | | | | | | |-- SerialNumber |
425 | 1..n | | | | | | | |-- TestReport |
426 | 0..n | | | | | | | | |-- BuildInfoReport |
427 | 0..1 | | | | | | | | | |-- ComponentDescription |
428 | 0..1 | | | | | | | | | |-- ComponentID |
429 | 0..1 | | | | | | | | | |-- ComponentLocation |
430 | 1 | | | | | | | | | |-- ComponentNumber |
431 | 0..1 | | | | | | | | | |-- ComponentParentNumber |
432 | 0..1 | | | | | | | | | |-- ComponentSerialNumber |
433 | 0..1 | | | | | | | | | |-- ComponentType |
434 | 0..1 | | | | | | | | | |-- UserSite |
435 | 0..n | | | | | | | | |-- CalcFailReport |
436 | 0..1 | | | | | | | | | |-- ComponentNumber |
437 | 1 | | | | | | | | | |-- ErrorCode |
438 | 0..1 | | | | | | | | | |-- FailValue |
439 | 1 | | | | | | | | | |-- PrimaryIdentifier |
440 | 0..1 | | | | | | | | | |-- Sequence |
441 | 0..1 | | | | | | | | | |-- UserSite |
442 | 0..n | | | | | | | | |-- DieReport |
443 | 0..1 | | | | | | | | | |-- CharFlag |
444 | 0..1 | | | | | | | | | |-- CompositeFailSort |
445 | 0..1 | | | | | | | | | |-- DieTestingPeriod |
446 | 0..1 | | | | | | | | | | |-- End |
447 | 0..1 | | | | | | | | | | |-- Start |
448 | 0..1 | | | | | | | | | |-- FirstFailSort |
449 | 0..1 | | | | | | | | | |-- GangTest |
450 | 0..1 | | | | | | | | | | |-- IntCoordinate |
451 | 0..1 | | | | | | | | | | | |-- X |
452 | 0..1 | | | | | | | | | | | |-- Y |
453 | 0..1 | | | | | | | | | | | |-- Z |
454 | 1 | | | | | | | | | | |-- StripTestID |
455 | 1 | | | | | | | | | | |-- StripTestOrientation |
456 | 0..1 | | | | | | | | | |-- IntCoordinate |
457 | 0..1 | | | | | | | | | | |-- X |
458 | 0..1 | | | | | | | | | | |-- Y |
459 | 0..1 | | | | | | | | | | |-- Z |
460 | 0..1 | | | | | | | | | |-- UserSite |
461 | 0..n | | | | | | | | |-- ECIDReport |
462 | 0..1 | | | | | | | | | |-- ComponentNumber |
463 | 0..1 | | | | | | | | | |-- DecodedID |
464 | 0..1 | | | | | | | | | |-- Decoder |
465 | 0..1 | | | | | | | | | |-- ECIDType |
466 | 1 | | | | | | | | | |-- IntCoordinate |
467 | 0..1 | | | | | | | | | | |-- X |
468 | 0..1 | | | | | | | | | | |-- Y |
469 | 0..1 | | | | | | | | | | |-- Z |
470 | 0..1 | | | | | | | | | |-- RawBits |
471 | 0..n | | | | | | | | |-- FPReport |
472 | 0..1 | | | | | | | | | |-- BufferNumber |
473 | 0..1 | | | | | | | | | |-- ComponentNumber |
474 | 0..1 | | | | | | | | | |-- FailLimExceeded |
475 | 1 | | | | | | | | | |-- PrimaryIdentifier |
476 | 0..1 | | | | | | | | | |-- TestResult |
477 | 0..1 | | | | | | | | | |-- UserSite |
478 | 0..1 | | | | | | | | | |-- UsingPatternCnts |
479 | 0..1 | | | | | | | | | |-- VectorReport |
480 | 0..1 | | | | | | | | | | |-- Address1 |
481 | 0..1 | | | | | | | | | | |-- Address2 |
482 | 0..1 | | | | | | | | | | |-- CycleCnt |
483 | 1 | | | | | | | | | | |-- Pins |
484 | 1 | | | | | | | | | | |-- Status |
485 | 0..1 | | | | | | | | | | |-- VectorLabel |
486 | 0..n | | | | | | | | |-- FunctionalPinReport |
487 | 0..1 | | | | | | | | | |-- Bits |
488 | 0..1 | | | | | | | | | |-- ComponentNumber |
489 | 1 | | | | | | | | | |-- PrimaryIdentifier |
490 | 0..1 | | | | | | | | | |-- TestResult |
491 | 0..1 | | | | | | | | | |-- UserSite |
492 | 0..n | | | | | | | | |-- PPReport |
493 | 0..1 | | | | | | | | | |-- ComponentNumber |
494 | 0..n | | | | | | | | | |-- PPResult |
495 | 1 | | | | | | | | | | |-- Measurement |
496 | 1 | | | | | | | | | | |-- Pin |
497 | 0..1 | | | | | | | | | | |-- TestResult |
498 | 1 | | | | | | | | | |-- PrimaryIdentifier |
499 | 0..1 | | | | | | | | | |-- UserSite |
500 | 0..n | | | | | | | | |-- PRReport |
501 | 0..1 | | | | | | | | | |-- ComponentNumber |
502 | 1 | | | | | | | | | |-- Measurement |
503 | 1 | | | | | | | | | |-- PrimaryIdentifier |
504 | 0..1 | | | | | | | | | |-- TesterAlarm |
505 | 0..1 | | | | | | | | | |-- TestResult |
506 | 0..1 | | | | | | | | | |-- UserSite |
507 | 0..n | | | | | | | | |-- StringReport |
508 | 0..1 | | | | | | | | | |-- ComponentNumber |
509 | 0..1 | | | | | | | | | |-- Keyword |
510 | 0..1 | | | | | | | | | |-- PrimaryIdentifier |
511 | 0..1 | | | | | | | | | |-- UserSite |
512 | 0..1 | | | | | | | | | |-- Value |
513 | 0..n | | | | | | | | |-- TestMap |
514 | 0..1 | | | | | | | | | |-- CenterX |
515 | 0..1 | | | | | | | | | |-- CenterY |
516 | 0..1 | | | | | | | | | |-- LogicalMax |
517 | 0..1 | | | | | | | | | |-- LogicalMin |
518 | 0..1 | | | | | | | | | |-- MeasurementUnit |
519 | 1 | | | | | | | | | | |-- Choice |
520 | 1 | | | | | | | | | | | |-- ProprietaryUnits |
521 | 1 | | | | | | | | | | | | |-- Units |
522 | 1 | | | | | | | | | | | |-- UnitOfMeasure |
523 | 0..1 | | | | | | | | | |-- PosDirX |
524 | 0..1 | | | | | | | | | |-- PosDirY |
525 | 0..1 | | | | | | | | | |-- RetDieRelationX |
526 | 0..1 | | | | | | | | | |-- RetDieRelationY |
527 | 0..1 | | | | | | | | | |-- RetDimensionX |
528 | 0..1 | | | | | | | | | |-- RetDimensionY |
529 | 0..1 | | | | | | | | | |-- WaferCoordinate |
530 | 0..1 | | | | | | | | | | |-- MaxX |
531 | 0..1 | | | | | | | | | | |-- MaxY |
532 | 0..1 | | | | | | | | | | |-- MinX |
533 | 0..1 | | | | | | | | | | |-- MinY |
534 | 1 | | | | | |-- WaferSort |
535 | 1..n | | | | | | |-- Die |
536 | 0..1 | | | | | | | |-- ChipPN |
537 | 0..1 | | | | | | | |-- DieReticlePN |
538 | 0..1 | | | | | | | |-- PackageDescription |
539 | 0..1 | | | | | | | |-- PartText |
540 | 0..1 | | | | | | | |-- SerialNumber |
541 | 1..n | | | | | | | |-- TestReport |
542 | 0..n | | | | | | | | |-- BuildInfoReport |
543 | 0..1 | | | | | | | | | |-- ComponentDescription |
544 | 0..1 | | | | | | | | | |-- ComponentID |
545 | 0..1 | | | | | | | | | |-- ComponentLocation |
546 | 1 | | | | | | | | | |-- ComponentNumber |
547 | 0..1 | | | | | | | | | |-- ComponentParentNumber |
548 | 0..1 | | | | | | | | | |-- ComponentSerialNumber |
549 | 0..1 | | | | | | | | | |-- ComponentType |
550 | 0..1 | | | | | | | | | |-- UserSite |
551 | 0..n | | | | | | | | |-- CalcFailReport |
552 | 0..1 | | | | | | | | | |-- ComponentNumber |
553 | 1 | | | | | | | | | |-- ErrorCode |
554 | 0..1 | | | | | | | | | |-- FailValue |
555 | 1 | | | | | | | | | |-- PrimaryIdentifier |
556 | 0..1 | | | | | | | | | |-- Sequence |
557 | 0..1 | | | | | | | | | |-- UserSite |
558 | 0..n | | | | | | | | |-- DieReport |
559 | 0..1 | | | | | | | | | |-- CharFlag |
560 | 0..1 | | | | | | | | | |-- CompositeFailSort |
561 | 0..1 | | | | | | | | | |-- DieTestingPeriod |
562 | 0..1 | | | | | | | | | | |-- End |
563 | 0..1 | | | | | | | | | | |-- Start |
564 | 0..1 | | | | | | | | | |-- FirstFailSort |
565 | 0..1 | | | | | | | | | |-- GangTest |
566 | 0..1 | | | | | | | | | | |-- IntCoordinate |
567 | 0..1 | | | | | | | | | | | |-- X |
568 | 0..1 | | | | | | | | | | | |-- Y |
569 | 0..1 | | | | | | | | | | | |-- Z |
570 | 1 | | | | | | | | | | |-- StripTestID |
571 | 1 | | | | | | | | | | |-- StripTestOrientation |
572 | 0..1 | | | | | | | | | |-- IntCoordinate |
573 | 0..1 | | | | | | | | | | |-- X |
574 | 0..1 | | | | | | | | | | |-- Y |
575 | 0..1 | | | | | | | | | | |-- Z |
576 | 0..1 | | | | | | | | | |-- UserSite |
577 | 0..n | | | | | | | | |-- ECIDReport |
578 | 0..1 | | | | | | | | | |-- ComponentNumber |
579 | 0..1 | | | | | | | | | |-- DecodedID |
580 | 0..1 | | | | | | | | | |-- Decoder |
581 | 0..1 | | | | | | | | | |-- ECIDType |
582 | 1 | | | | | | | | | |-- IntCoordinate |
583 | 0..1 | | | | | | | | | | |-- X |
584 | 0..1 | | | | | | | | | | |-- Y |
585 | 0..1 | | | | | | | | | | |-- Z |
586 | 0..1 | | | | | | | | | |-- RawBits |
587 | 0..n | | | | | | | | |-- FPReport |
588 | 0..1 | | | | | | | | | |-- BufferNumber |
589 | 0..1 | | | | | | | | | |-- ComponentNumber |
590 | 0..1 | | | | | | | | | |-- FailLimExceeded |
591 | 1 | | | | | | | | | |-- PrimaryIdentifier |
592 | 0..1 | | | | | | | | | |-- TestResult |
593 | 0..1 | | | | | | | | | |-- UserSite |
594 | 0..1 | | | | | | | | | |-- UsingPatternCnts |
595 | 0..1 | | | | | | | | | |-- VectorReport |
596 | 0..1 | | | | | | | | | | |-- Address1 |
597 | 0..1 | | | | | | | | | | |-- Address2 |
598 | 0..1 | | | | | | | | | | |-- CycleCnt |
599 | 1 | | | | | | | | | | |-- Pins |
600 | 1 | | | | | | | | | | |-- Status |
601 | 0..1 | | | | | | | | | | |-- VectorLabel |
602 | 0..n | | | | | | | | |-- FunctionalPinReport |
603 | 0..1 | | | | | | | | | |-- Bits |
604 | 0..1 | | | | | | | | | |-- ComponentNumber |
605 | 1 | | | | | | | | | |-- PrimaryIdentifier |
606 | 0..1 | | | | | | | | | |-- TestResult |
607 | 0..1 | | | | | | | | | |-- UserSite |
608 | 0..n | | | | | | | | |-- PPReport |
609 | 0..1 | | | | | | | | | |-- ComponentNumber |
610 | 0..n | | | | | | | | | |-- PPResult |
611 | 1 | | | | | | | | | | |-- Measurement |
612 | 1 | | | | | | | | | | |-- Pin |
613 | 0..1 | | | | | | | | | | |-- TestResult |
614 | 1 | | | | | | | | | |-- PrimaryIdentifier |
615 | 0..1 | | | | | | | | | |-- UserSite |
616 | 0..n | | | | | | | | |-- PRReport |
617 | 0..1 | | | | | | | | | |-- ComponentNumber |
618 | 1 | | | | | | | | | |-- Measurement |
619 | 1 | | | | | | | | | |-- PrimaryIdentifier |
620 | 0..1 | | | | | | | | | |-- TesterAlarm |
621 | 0..1 | | | | | | | | | |-- TestResult |
622 | 0..1 | | | | | | | | | |-- UserSite |
623 | 0..n | | | | | | | | |-- StringReport |
624 | 0..1 | | | | | | | | | |-- ComponentNumber |
625 | 0..1 | | | | | | | | | |-- Keyword |
626 | 0..1 | | | | | | | | | |-- PrimaryIdentifier |
627 | 0..1 | | | | | | | | | |-- UserSite |
628 | 0..1 | | | | | | | | | |-- Value |
629 | 0..n | | | | | | | | |-- TestMap |
630 | 0..1 | | | | | | | | | |-- CenterX |
631 | 0..1 | | | | | | | | | |-- CenterY |
632 | 0..1 | | | | | | | | | |-- LogicalMax |
633 | 0..1 | | | | | | | | | |-- LogicalMin |
634 | 0..1 | | | | | | | | | |-- MeasurementUnit |
635 | 1 | | | | | | | | | | |-- Choice |
636 | 1 | | | | | | | | | | | |-- ProprietaryUnits |
637 | 1 | | | | | | | | | | | | |-- Units |
638 | 1 | | | | | | | | | | | |-- UnitOfMeasure |
639 | 0..1 | | | | | | | | | |-- PosDirX |
640 | 0..1 | | | | | | | | | |-- PosDirY |
641 | 0..1 | | | | | | | | | |-- RetDieRelationX |
642 | 0..1 | | | | | | | | | |-- RetDieRelationY |
643 | 0..1 | | | | | | | | | |-- RetDimensionX |
644 | 0..1 | | | | | | | | | |-- RetDimensionY |
645 | 0..1 | | | | | | | | | |-- WaferCoordinate |
646 | 0..1 | | | | | | | | | | |-- MaxX |
647 | 0..1 | | | | | | | | | | |-- MaxY |
648 | 0..1 | | | | | | | | | | |-- MinX |
649 | 0..1 | | | | | | | | | | |-- MinY |
650 | 0..n | | | | | | |-- YieldReport |
651 | 0..1 | | | | | | | |-- GoodDieQuantity |
652 | 0..1 | | | | | | | |-- GrossDiePerWafer |
653 | 0..1 | | | | | | | |-- OtherDefectQuantity |
654 | 0..1 | | | | | | | |-- TestQty |
655 | 0..1 | | | | | | | |-- TestYld |
656 | 0..1 | | | | | | | |-- TotalFunctionalDie |
657 | 0..n | | | |-- TestPass |
658 | 0..n | | |-- TestSpecificationReport |
659 | 0..1 | | | |-- Category |
660 | 0..1 | | | |-- PassKeyItemDefect |
661 | 1 | | | |-- PrimaryIdentifier |
662 | 1 | | | |-- TestID |
663 | 0..1 | | | |-- TestName |
664 | 0..n | | | |-- TestParameter |
665 | 0..1 | | | | |-- Calculation |
666 | 0..1 | | | | |-- CensorHLim |
667 | 0..1 | | | | |-- CensorLLim |
668 | 0..1 | | | | |-- Condition |
669 | 0..1 | | | | |-- HighLimit |
670 | 0..1 | | | | |-- LowLimit |
671 | 0..n | | | | |-- MeasurementUnit |
672 | 1 | | | | | |-- Choice |
673 | 1 | | | | | | |-- ProprietaryUnits |
674 | 1 | | | | | | | |-- Units |
675 | 1 | | | | | | |-- UnitOfMeasure |
676 | 0..1 | | | | |-- PCMParmType |
677 | 0..1 | | | | |-- Target |
678 | 0..1 | | |-- WaferSortLocation |
679 | 0..1 | | | |-- GlobalWorkInProcessLocationCode |
680 | 0..1 | | | |-- Location |
681 | 1 | | | | |-- Choice |
682 | 1..n | | | | | |-- AlternativeIdentifier |
683 | 1 | | | | | | |-- Authority |
684 | 1 | | | | | | |-- Identifier |
685 | 1 | | | | | |-- DUNS |
686 | 1 | | | | | |-- DUNSPlus4 |
687 | 1 | | | | | |-- GLN |
688 | 0..1 | | | |-- PhysicalAddress |
689 | 1 | | | | |-- AddressLine1 |
690 | 0..1 | | | | |-- AddressLine2 |
691 | 0..1 | | | | |-- AddressLine3 |
692 | 0..1 | | | | |-- AddressLine4 |
693 | 0..1 | | | | |-- AddressLine5 |
694 | 1 | | | | |-- CityName |
695 | 1 | | | | |-- Country |
696 | 0..1 | | | | |-- CountrySubdivision |
697 | 0..1 | | | | |-- PostalCode |
698 | 0..1 | | | | |-- PostOfficeBox |
699 | 0..1 | | | |-- ProprietaryLabel |
No | Name | Definition |
---|
1 | AlternativeIdentifier | Identifies the specified code and the name of the organization that a code is utilized from. |
2 | AlternativePN | A user defined string to identify a part number for a wafer or packaged die which is associated with customerPN. |
3 | BALocation | Describes where the wafer was sent for bond and assembly. |
4 | BuildInfoReport | Options of obtaining more build information when building out the package. |
5 | BusinessServiceInformation | The object allows the specification of the business service utilized within the partner company. This may or may not be the same as the information sent by the RNIF. |
6 | CalcFailReport | A report that catalogs failing calculations that may be performed in determining the result of a test. |
7 | ChipPeriodicity | Dimensional. Describes the distance between chips in micron between established reference points in either the x- and or y-direction on a wafer. |
8 | ContactInformation | The business document must allow for the identification of the name of the department, service or individual to be contacted regarding the context of the business document. |
9 | ContractInformation | A block of information used to correlate a contract in an executing choreography. |
10 | ContractorLotNumber | User defined alphanumeric string which is associated with customer lot number. |
11 | CorrelationInformation | A block of information used to correlate a requesting document to a responding document and to the contract in an executing choreography. |
12 | CustomerLotNumber | Customer defined alphanumeric string used to identify the lot. |
13 | CustomerPN | A string which identifies Foundry defined, the Test Services defined or the customer proprietary defined part number for a wafer or packaged die. |
14 | DieReport | References optional information to further identify a die on a wafer. |
15 | DieTestingPeriod | Defines the start and end time for a die being tested. |
16 | Die | Reference optional data attributes to identify die on a wafer. |
17 | Dimension | Describes the dimensional measurement range in X, Y or Z axis. |
18 | DocumentHeader | The object allows for the identification of the sender and receiver of the business document. |
19 | DocumentIdentification | The object specifies all information necessary to identify the business document. |
20 | DocumentInformation | The object specifies information to identify the business document, a summary of attachments, and information about the business document security. |
21 | DocumentManifest | The block provides a brief summary of attachments and Service Content. |
22 | DocumentSecurity | The object provides additional granularity in specifying business document security (this is in addition to the specified PIP security). |
23 | ECIDReport | Report to collect electronic chip ID data. |
24 | FPReport | A report that collects functional pin test results. Valid status values are Passed, Failed. |
25 | FabLocation | Describes where the wafer was fabricated. |
26 | FinalTestLocation | Describes where the packaged die was sent for final test. |
27 | FinalTest | A test for packaged product that determines that the die functions and performs to the specification. This test also includes parametric and quality sort data. |
28 | FloatCoordinate | X, Y and Z Coordinate values. |
29 | FunctionalPinReport | A Pass/Fail per pin report of data logged bit results. Valid status options are: Passed, Failed High Limit, Fail Low Limit, Failed Screened and Failed Censor. |
30 | GangTest | Describes the test results for a group of die or packaged units, as in strip testing. |
31 | HardwareSets | Describes the unique attachments, handlers or probers that are associated to the tester. |
32 | IntCoordinate | X, Y and Z Coordinate values. |
33 | Location | The business document must specify a location. |
34 | LotReport | A report that is common for reporting data collection for PCM, Wafer Sort and Final Test. |
35 | Lot | Describes the lot information. |
36 | ManifestItem | The object provides details about the specific attachment(s). |
37 | MeasurementUnit | Describes the measurement unit. |
38 | OtherLocation | Describes the location where the wafer or packaged die in a lot or sublot was sent for additional fabrication, assembly or testing.
This may be indicated by City, State, Country, Zip Code, DUNS, DUNS+4, or by proprietary label. |
39 | PCM | Process Control Monitor: One of the major test modes which collects in-line parametric (electrical) data for the disposition of wafers in the Foundry based on technology criteria. |
40 | PPReport | A report for datalogged per pin data. Per pin results relate data for tests which measure multiple pins in parallel such as leakage tests. |
41 | PPResult | A mesurement value for each pin in tests which measure multiple pins in parallel such as leakage tests. Valid status options for this report are: Failed High Limit, Failed Low Limit, Passed, Failed, Screened Value, Failed Censor. |
42 | PRReport | A report that data logs parametric test results. The report collects non-per-pin data. Valid status options are: Failed High Limit, Failed Low Limit, Passed, Failed, Screened Value, Failed Censor. |
43 | PartnerIdentification | The business document must allow for the identity of one or more parties to the transaction. |
44 | PhysicalAddress | The business document must provide a physical address for a party to the business transaction. |
45 | Pin | Describes the optional attributes that provide additional pin identification information. |
46 | ProprietaryUnits | Describes a class where the sender defines the units of measure for the test. These units are not listed in code list UnitOfMeasure. |
47 | Receiver | The object allows the identification of the receiving party of the business message. |
48 | RequestingDocumentInformation | A block of information used to correlate a requesting document to a responding document in an executing choreography. |
49 | SemiconductorTestDataNotification | The message wrapper for SCTDE. |
50 | Sender | The object allows the identification of the initiating party of the business message. |
51 | SetupReport | A report that describes setup information for the testing. |
52 | SoftwareReport | SoftwareReport describes software type, software name, software version and softwareBuildID. |
53 | Sort | Contains accumulated count for a sort at Wafer Sort and Final Test. |
54 | StandardDocumentIdentification | The object specifies additional information necessary to identify the standard business document. |
55 | StringReport | A report that provides additional, optional information about a tested device. This class supports datalogging of string values based on a key/value pair approach. |
56 | SubLot | Alphanumeric string which describes a lot which has been separated from the Lot. |
57 | TestMap | Describes the wafer orientation and configuration used by manufacturing test (metrology) equipment. |
58 | TestOpIdentification | Describes the manufacturing level of the lot and the test point. |
59 | TestOperationDescription | Information that describes the manufacturing operation in further detail. |
60 | TestParameter | Describes optional attributes to provide additional information on the parameters of the test. |
61 | TestReport | The common report for non-pin data collected at PCM, Wafer Sort and Final Test. |
62 | TestSetup | Describes the identification information for tester set-up. |
63 | TestSpecificationReport | Report that lists each test and their attributes at PCM, wafer sort and final test. e.g. Test name, electrical conditions, sort number, etc. |
64 | TestTemperature | Temperature value in either Centigrade or Fahrenheit to identify at which a test is performed for lot or sublot. |
65 | TesterAttachment | Describes the handlers or probers that are attached to the tester. |
66 | TesterFEH | Describes the unique attachments that can be associated to the tester. |
67 | Tester | Describe unique tester information for PCM, Wafer Sort and Final Test. |
68 | TestingPeriod | Defines the start and end time for a wafer being tested. |
69 | TpirPipIdentification | The object specifies all information necessary to uniquely identify a TPIR-PIP within a Registry or trading partner repository. |
70 | VectorReport | A report for collecting functional results for a single vector or pattern count. Valid status values are: H=actual H, expect unknown L=actual L, expect unknown Z=actual Z, expected unknown A=actual H, expected L B=actual H, expect Z C=actual Z, expect H D=actual Z, expect L E=actual L, expect H F=actual L, expect Z. |
71 | WaferCoordinate | The collection of business properties that describe the coordinate on a semiconductor wafer.. |
72 | WaferSortLocation | Describes where the wafer was sent for wafer sort test. |
73 | WaferSort | One of the major test modes which collects data on the electrical performance of the integrated die. The test results may be shared as either reconciled information at the chip summary level or as raw test data. Test results may include parametric measurements and quality sort and/or pass/fail information. |
74 | WaferTestingPeriod | Defines the start and end time for a wafer being tested. |
75 | YieldReport | A report defining the yield from tests at Wafer Sort and Final Test. |
No | Name | Definition | Type |
---|
1 | ActionName | The name of Action. For RosettaNet usually any of Request/Confirm/Notify/Query/Response. | string |
2 | Address1 | Failing tester primary address; integer. | integer |
3 | Address2 | Failing tester secondary address; integer. | integer |
4 | AddressLine1 | The first line of a physical address. | string |
5 | AddressLine2 | The second line of a physical address. | string |
6 | AddressLine3 | The third line of a physical address. | string |
7 | AddressLine4 | The fourth line of a physical address. | string |
8 | AddressLine5 | The fifth line of a physical address. | string |
9 | AttachID | A string that defines the prober handler or any physical device/system that can be attached to the tester used in wafer sort or final test. | string |
10 | AttachName | A string to identify the tools attached to the tester system. e.g. Schlumberger 3100. | string |
11 | AttachmentID | String. A barcode, electronic ID or alphanumeric identifier for the FEHType used on a tester. | string |
12 | Authority | The name of the organization that a code is utilized from. | string |
13 | BinAssignment | A user defined integer designation for hard bins. | integer |
14 | Bits | Datalog values in series of bits (0s and 1s). | string |
15 | BufferNumber | Pattern buffer number. | integer |
16 | BuildID | A string that identifies the build version of the software. Example: BuildID=Java, JDK, 118, o118-199990910. | string |
17 | BusinessProcessInstanceIdentifier | The identifier for the public business process instance being sent that both the sender and receiver can identify. | string |
18 | Calculation | A string describing the mathematical expression to derive a result. | string |
19 | Category | A string that describes a category of tests. | string |
20 | CensorHLim | FLOAT value for the high boundary for legitimate or valid test data. | float |
21 | CensorLLim | FLOAT value for the low boundary for legitimate or valid test data. | float |
22 | CenterX | The vector in X direction for index units form the (0,0) coordinate to the index containing the physical center of the wafer. For PCM data the index is reticle steps. For Wafer Sort and Final Test data the index is die steps. | float |
23 | CenterY | The vector in Y direction for index units form the (0,0) coordinate to the index containing the physical center of the wafer. For PCM data the index is reticle steps. For Wafer Sort and Final Test data the index is die steps. | float |
24 | Channel | Integer, tester channel number. | integer |
25 | CharFlag | Used as a indicator for the presence of characterization data for a die. | boolean |
26 | ChipPN | A string that describes the part number for the device. | string |
27 | ChipPinName | Alphanumeric string to describe the name of the pin. | string |
28 | CityName | The name of a city. | string |
29 | ComponentDescription | A user defined description of the component. | string |
30 | ComponentID | A unique identification of the component per the componentType (e.g. Frame, Card). Note: The ChipID may be identified by waferid/X/Y. This may be an actual component serial number or may be the primary ECID value waferid/X/Y. If there is an invalid ECID read, the value that is typically used is lotnum/seq/bad-waferid/bad-X/bad-Y or equivalent. | string |
31 | ComponentLocation | The location of a sub-component on the parent component. | string |
32 | ComponentNumber | A number associating a CalcFailReport to a specific component in BuildInfoReport. | integer |
33 | ComponentNumber | A number associating a FPReport to a specific component in BuildInfoReport. | integer |
34 | ComponentNumber | A number associating a FunctionalPinReport to a specific component in BuildInfoReport. | integer |
35 | ComponentNumber | A number associating a PPReport to a specific component in BuildInfoReport. | integer |
36 | ComponentNumber | A number associating a PRReport to a specific component in BuildInfoReport. | integer |
37 | ComponentNumber | A number associating a key value pair to a specific component in BuildInfoReport. | integer |
38 | ComponentNumber | A number associating an ECIDReport to a specific component in BuildInfoReport. | integer |
39 | ComponentNumber | A unique number associated with the component or subcomponent being tested relative to the device. In general the highest level of the componentNumber equals 0 and all identified subcomponents are componentNumber equal 1-n. Subsequent Reports can be associated to the sub-component via the componentNumber. | integer |
40 | ComponentParentNumber | For the highest level of packaged component the value is null. For any sub-component, the corresponding componentNumber is from a previous BuildInfoReport. | integer |
41 | ComponentSerialNumber | A scribed serial number on the component. | string |
42 | CompositeFailSort | A user initiated failure override of first fail sort to allow for the collection of additional sort fail data. The additional sort fails can be combined in a comma separated list of sort numbers as a composite fail. The compositeFailSort describes the content of the data in the sortID tag. | string |
43 | Condition | A string specifying the test parameter. Example: TestTemperature etc. | string |
44 | Contact | The name of the department, service or individual to be contacted within the organization. | Contact |
45 | ContractIdentifier | Unique identification of a contract between the Sender and the Receiver | string |
46 | ContractType | The type of the contract: an attribute describing the type of the ContractIndentification. Valid values are URI, URN,ebXMLCPA, or other values defined by partners. | string |
47 | Creation | The creation date and time of the specified Business Document (i.e. the Purchase Order date). | dateTime |
48 | CustomerTestProgramEC | Customer Supplied Test Program EC. In a foundry model, the customer can have a different test program EC than the one used by the test house. | string |
49 | CustomerTestProgramName | Customer Supplied Test Program Name. In a foundry model, the customer can have a different test program name than the one used by the test house. | string |
50 | CycleCnt | Integer, Cycle count for ABIST/LBIST diagnostic data collection or the T0 count for a pattern. | integer |
51 | DUNSPlus4 | A identifier to specify a specific location within a business location. | DUNSPlus4 |
52 | DUNS | A number assigned by Dun and Bradstreet to identify a business location. | DUNS |
53 | DecodedID | Value that could represent waferID or lotID. | string |
54 | Decoder | Identifies the decoding scheme if ECID is used. | string |
55 | Description | A description of the attachment. | string |
56 | Description | A string that describes the kind of chip periodicity is being defined. | string |
57 | DieReticlePN | A string which defines the unique part numbers for die associated with a multi-project wafer. | string |
58 | ECIDType | When multiple types of electronic chip identification can be used, the ECIDTYPE field can be used to determine which type is being logged. e.g. Wafer_X_Y, MAC, GUID. | string |
59 | Email | The electronic mail for the specified contact. | string |
60 | End | The end date time of a period. | dateTime |
61 | EquipmentID | An alphanumeric string to identify the tester used at PCM, wafer sort or final test. | string |
62 | ErrorCode | A user defined code for how the calculation failed. | integer |
63 | FailLimExceeded | Flag indicator to whether more fails exists than were datalogged. False = all fails datalogged; True = More fails present. | boolean |
64 | FailValue | The resultant failed value from the calculation test. | float |
65 | Fax | The fax number for the specified contact. | string |
66 | FileDataVersion | User defined changes i.e. rules changes to content of data in the data file transfer. Examples: version update to loaders, parsers, or operating system, specification limits etc. | string |
67 | FirstFailSort | Described the sort ID for the first fail on the device. See content of data in sortID tag . | integer |
68 | GLN | Global Location Number (GLN) - A identifier to identify legal entities, trading parties and location. | GLN |
69 | GTIN | Global Trade Identification Number (GTIN). | GTIN |
70 | GlobalLotStatusCode | Describes lot or sublot status. | string |
71 | GlobalWorkInProcessLocationCode | References where fabrication, bond, assembly, test and related activities were performed on a lot or sublot. | string |
72 | GoodDieQuantity | Integer that describes the number of die or packages that are functional in a lot or sublot. | integer |
73 | GrossDiePerWafer | Integer, Describes the number of complete die on a wafer. | integer |
74 | HardSortName | Represents the hard sort name of the Sort Test. | string |
75 | HardSortSymbol | A user defined grouping of hard sort fails on a wafer map. | string |
76 | HardSort | Represents the hard sort ID of the Sort test. | string |
77 | HeadID | Identifies the test head used for wafer sort and final test. | string |
78 | HeaderVersion | The UN/CEFACT version of the document header. | string |
79 | HighLimit | Describes the high limit value for a test specification. | float |
80 | IdSuffix | An alphanumeric string that could be used to identify a lot at a location. The suffix string is user defined. It can be used to identify a lot split, a bond assembly location, wafer sort or final test location. | string |
81 | Identifier | Identifies the role of the contact (i.e. Service Technician, Account Manager) in the Business Process. | string |
82 | Identifier | The specified code to represent an entity (e.g. product, location, partner, etc.). | string |
83 | Identifier | The unique identifier for the document being sent. | string |
84 | Keyword | An optional keyword. | string |
85 | Length | The size of the attachment in bytes (i.e. 1 000 000 bytes) | positiveInteger |
86 | LogicalMax | The logiscal maximum dimensions. For PCM data, units are reticle index steps. For Wafer Sort and Final Test data, units are die index steps. | float |
87 | LogicalMin | The logiscal minimum dimensions. For PCM data, units are reticle index steps. For Wafer Sort and Final Test data, units are die index steps. | float |
88 | LotEndDateTime | Defines the end time of a lot for a test. | dateTime |
89 | LotStartDateTime | Defines the start time of the lot for a test. | dateTime |
90 | LowLimit | Describes the low limit value for a test specification. | float |
91 | ManufacturingID | Alphanumeric string which describes the lot. | string |
92 | MaxX | The maximum X coordinate on a semiconductor wafer. | float |
93 | MaxY | The maximum Y coodinate on a semiconductor wafer. | float |
94 | Maximum | Describes the maximum dimensional measurement for X, Y or Z axis. | float |
95 | Measurement | A data measurement that are collected from each pin measured. | float |
96 | Measurement | Measurement in base units. | float |
97 | MinX | The minimum X coodinate on a semiconductor wafer. | float |
98 | MinY | The minimum Y coodinate on a semiconductor wafer. | float |
99 | Minimum | Describes the minimum dimensional measurement for X, Y or Z axis. | float |
100 | ModulePinName | Alphanumeric string to describe the package pin name. | string |
101 | MultipleType | Indicates whether the manifest contains documents of multiple types. True if yes, and False if no. | boolean |
102 | Name | A string that specifically labels the FEH type. | string |
103 | Name | The name of software type. Examples: AIX, Windows. | string |
104 | NominalSize | Describes the diameter of the wafer in mm, or inches. | float |
105 | NonRepudiableReceipt | The value "true" will indicate that a signed acknowledgement for the business document is necessary. | boolean |
106 | Notch | Describes the orientation of the wafer notch in a tester: Valid options are: 12 o’clock; 3 o’clock, 6 o’clock, 9 o’clock, notch up, notch down, notch right or notch left, Up=U, Down=D, Left=L, or Right=R, 0, 90, 180 or 270 degrees. Reference SEMI G81, Appendix 1. | string |
107 | NumberOfItems | Total number of documents in the message. The physical count of the attachments in the payload plus the RosettaNet Business Message (for Service Content). The value of this field will be at least 1. | positiveInteger |
108 | OtherDefectQuantity | String. User defined Quality Control inspection at wafer sort and final test to identify defects. User defined Valid Values. | string |
109 | PackageDescription | User definable element for package size (default=mm), package type (string), and pin count (Integer). | string |
110 | ParallelTest | Tthe number of devices or parallel tests for wafer sort. | integer |
111 | PartText | String. A user defined comment field to attach additional die information. | string |
112 | PartnerId | The Trading Partner Identification of MNC that is creating this TPIR PIP. | DUNSPlus4 |
113 | PartnerName | The name of the partner’s company/business. | string |
114 | PartnerSecurityID | An optional string that would indicate a project name to restrict access to the data to those employees working on that project. | string |
115 | PassKeyItemDefect | A flag to identify if a failing parameter is PCM or optional. | boolean |
116 | PassVisualInspection | A user defined pass/fail quality control inspection flag of wafer after wafer sort. | boolean |
117 | PersistentEncryption | The value "true" will indicate that the Business Document (including the header) needs to be encrypted when stored or transported. | boolean |
118 | PersistentSignature | The value "true" will indicate that a signature is required to be stored with the document while stored or transported.
| boolean |
119 | Phone | The telephone number for the specified contact. | string |
120 | Pin | A Pin IDs for each pin measured. | integer |
121 | Pins | String. Comma separated list of Pin IDs as defined in PinReport. | string |
122 | PipIdentifier | PIP Identification.[ i.e. PIP3A4] | PipIdentifier |
123 | PipVersion | PIP version number (i.e. 02.02.00). | PipVersion |
124 | PosDirX | The positive direction of the X-axis. Values illustrate Up (U), Down (D), Left (L)and Right (R). | float |
125 | PosDirY | The positive direction of the Y-axis. Values illustrate Up (U), Down (D), Left (L)and Right (R). | float |
126 | PositionID | Integer to reference ID for pin. | integer |
127 | PostOfficeBox | The Post Office Box identifier used to identify a party's post office box. | string |
128 | PostalCode | Identifying geographic location as specified by a national postal code. | string |
129 | PrimaryIdentifier | A reference back to TestSpecificationReport. This identifier references the electrical attributes only once per lot. | integer |
130 | PrimaryIdentifier | An integer used as a reference back to TestSpecificationReport. This identifier references the electrical attributes only once per lot. | integer |
131 | PrimaryIdentifier | Reference to link the test report for a lot. | integer |
132 | PrimaryIdentifier | Reference to link the test report to a lot. | integer |
133 | ProbeName | Describes the probe recipe or pattern file. | string |
134 | ProcessIdentifier | The name of the PIP e.g. Notify of Forecast Reply. | string |
135 | ProcessReference | The URN for the PIP that includes Cluster/Segment/Process pattern used to identify the interface process (such as PIP3A4) | string |
136 | ProcessState | The business process (or service) state of the sender of a document. When a service receives this document, the receiver may use the state as a precondition. | string |
137 | ProductName | A customer defined descriptor or code name for a part being fabricated or tested at a Foundry or Test Service trading partner. Example are Neptune, Big Dog, Antares 6. | string |
138 | ProductName | The name of the product. | string |
139 | ProprietaryLabel | User defined label to uniquely identify a facility that is represented in any of the scenarios. | string |
140 | Quadrant | A user defined division of the wafer into 4 quadrants. Valid values: I, II, III, IV, Q1,Q2, Q3, Q4, Upper Left, Upper Right, Lower Left, Lower Right and User defined labels. Reference SEMI G81, Appendix 1. | string |
141 | QualityCode | Designate a quality condition of a lot. This can be a proprietary label defined by the Foundry of the Test Services trading partner. | string |
142 | RawBits | Raw Bits data in hexadecimal format. | Hexadecimal |
143 | RepairableFlag | A flag to indicate if product (die or module) are repairable based on user definition. | boolean |
144 | RequestingDocumentCreationDateTime | The date-time of the requesting business document. | dateTime |
145 | RequestingDocumentInstanceIdentifier | The Business Document identification number that identifies the requesting Business Document. | string |
146 | ResponseDateTime | The expected time to receive the response. This can not be greater than the PIP TimeToPerform. | dateTime |
147 | RetDieRelationX | The X coordinate of the center die within the center reticle. | float |
148 | RetDieRelationY | The Y coordinate of the center die within the center reticle. | float |
149 | RetDimensionX | The size of the reticle in the X direction , expressed in number of die incements. | float |
150 | RetDimensionY | The size of the reticle in the Y direction , expressed in number of die incements. | float |
151 | RetestSorts | A list of sort numbers from prior pass that will be retested in this pass. | string |
152 | RetestType | Describes how test data should be combined with prior data for the same LotID, test and level. Valid Options are:
First: Replace all previous data for test and level;
Sorts: Removal of module data from prior pass where sort matches a sort in a prior pass;
Chip: Replaces data on a by chip basis; TestReplace: replaces data on a wafer sort test basis (deletes prior data for wafer or parameter having a non-null retest value. | string |
153 | Revision | Referenced the specified product revision. | string |
154 | SampleRate | Describes the percentage of die in wafer sort that are being tested under a characterization test plan. | PercentAmount |
155 | Sequence | An index indicating at which step of the calculation that it failed. | integer |
156 | SerialNumber | An alphanumeric string that uniquely defines the numbering of packaged die. | string |
157 | ServiceName | The name of the Business Activity with the "Request/Confirm" part removed. E.g., for the Activity "Request Purchase Order"==> "Purchase Order". | string |
158 | SetupName | A string that describes test conditions. | string |
159 | SetupVersion | Describes the version for the test conditions specified in setupName. | float |
160 | Signal | Alphanumeric string to describes name of signal pin. | string |
161 | SlotID | Slot Identification Number for a particular wafer. Companies prefer to use a slot id to keep track of which slot in the carrier the wafer is in. | string |
162 | SortCount | A string that describes the number of counts for each sortID during a test. | integer |
163 | SortID | The sortid represents the sort name of the Sort Test for which the firstFailSort and compositeFailSort are related to this sort identification. | string |
164 | SortName | Describes the test in the SortID. | string |
165 | SortSymbol | A user defined grouping of fails on a wafer map. | string |
166 | Standard | Identifies the standard used to submit the business document. (e.g. RosettaNet). | string |
167 | Start | The start date time of a period. | dateTime |
168 | StripTestID | Identify the packaged die numbering on a strip. | string |
169 | StripTestOrientation | Describes the orientation by strip test substrate: Valid values: 0, 90, 180, 270 degrees. Reference SEMI G81, Appendix 2. | integer |
170 | TargetTestTemperature | The targeted temperature value in either Centigrade or Fahrenheit at which a test is performed for lot or sublot. | float |
171 | Target | Describes the expected value for the test. | float |
172 | Technology | An alphanumeric string that is associated with a fabrication technology. Example. CMOS8SF, MOS-11. | string |
173 | TestID | An integer that uniquely identifies a test. | integer |
174 | TestLevel | A string that describes the test in further detail. Label may change. This is user definable. | string |
175 | TestMode | A string which is used to identify the type of test: PCM, Wafer Sort or Final Test. Within each major test type their may be multiple tests undertaken for each lot or sublot. | string |
176 | TestName | A string that describes the test. | string |
177 | TestPass | The number of times a test occurs. The test start and end time needs to be associated with each pass. | integer |
178 | TestProgEC | A string that indicates the version number for the TestProgName (Req. #43) used for testing a lot or sublot. | string |
179 | TestProgramName | A string that describes the test program for either a lot or sublot. | string |
180 | TestQty | Used for calculation of yield for die and packaged die for a lot or sublot tested. | integer |
181 | TestYld | A TPA defined calculation for yield at wafer sort and final test. | PercentAmount |
182 | TesterAlarm | An indicator status flag on whether the tester was in alarm during wafer sort or final test. | boolean |
183 | TesterControlSoftware | Describes the software and its version that control the tester. | string |
184 | TesterType | This object describes the tester model, version and ID number. | string |
185 | TotalFunctionalDie | String. User defined identifier on the level of functionality of die. | string |
186 | TpirBusinessProcessIdentifier | A Business Process Identifier to uniquely define the TPIR-PIP 'role' within a Business Scenario at a company or MNC level. The identifier MUST be composed of alphanumeric characters only and its length MUST be between one and twelve characters. | BusinessProcessIdentifier |
187 | TpirPipVersion | A TPIR-PIP Version Number (i.e., major and minor version number as XX.XX). | VersionIdentifier |
188 | Type | A string that describes the type hardware. It can be an Attachment Sets or FEH (Front End Hardware) that is attached to a tester system. Example: Probe Heads, Sockets, BIB, DIB and user definable attachments. | string |
189 | Type | Alphanumeric string listing the driver/receiver book types. | string |
190 | Type | Name of the Action Message | string |
191 | Type | The type of software described by this item. Valid examples are: Operating system, OEM tool control, Software system, Local Software and user defined. | string |
192 | Units | Special description or code of the units for the measurement value. | string |
193 | UniversalResourceIdentifier | The generic set of all names/addresses that are short strings that refer to resources. | string |
194 | Uri | Describes the destination uri for the TPIR form. | anyURI |
195 | UserSite | A user-defined die coordinate represented as an integer which is often associated with the serial number assigned by the tester or prober executive. | integer |
196 | UserSite | Identifies the corresponding device site number (0-1). | integer |
197 | UserSite | Identifies the corresponding device site number. | integer |
198 | UsingPatternCnts | A flag indicator to whether failing addresses or counts were datalogged. True = using pattern counts; False = datalogging vector addresses. | boolean |
199 | Value | Any character string value necessary for defining ASCI test results off card testers. | string |
200 | VectorLabel | String, Label for failing vector. | string |
201 | Version | PIP3A4v01.00 | string |
202 | Version | The software version being utilized. Example: 4.1.3. | string |
203 | WaferShortID | Alternate identifier for the wafer unique ID. Companies prefer to use a wafer short name as the data key for their data analysis tools versus the wafer unique id. | string |
204 | WaferUniqueID | An alphanumeric string which describes the wafer serial number for traceability in a lot or sublot. | string |
205 | X | Coordinate value for X-axis. | float |
206 | Y | Coordinate value for Y-axis. | float |
207 | Z | Coordinate value for Z-axis. | float |
1 | Axis | Lines: 246 |
---|
Indicate three dimensional direction. |
Entity Instances |
---|
X | X-axis. |
Y | Y-axis. |
Z | Z-axis. |
2 | ComponentType | Lines: 310 433 549 |
---|
Valid component values are: CAG, CHP, COR, CRD, FRM, MCM, MOD, NOD, SCM. |
Entity Instances |
---|
CAG | A cage containing multiple boards or cards. |
CHP | A row chip or die. |
COR | Core, a subcomponent of a chip (e.g. Mult-core processor). |
CRD | A card or board containing multiple module (MCM or SCM). |
FRM | A frame containing multiple cages and user definded. |
MCM | A multi chip module. |
MOD | Module, a single packaged chip (SCM-e.g. Single Chip Module) or set of chips (MCM - e.g. Multi-Chip Module). Use this code when SCM or MCM can not be determined. |
NOD | Node, a grouping of cards within a cage. A node may include cards, memory, and cooling unit systems. |
SCM | A single chip module. |
3 | Confidentiality | Lines: 110 |
---|
A string which describes the level of security associated with the data, as defined by TPA. |
Entity Instances |
---|
CON | Confidential security level. |
NON | No security restriction (None). |
RES | Restricted security level. |
4 | CoordinateFlag | Lines: 244 |
---|
A status flag to indicate the coordinate measurement is for a single die on a reticle or a multi-chip die on a reticle. |
Entity Instances |
---|
MUL | Multi-chip die on a reticle. |
SIN | Single Die on a reticle. |
5 | CountrySubdivision | Lines: 106 129 152 205 696 |
---|
For representation of a Countries subdivisions RosettaNet has adopted ISO 3166-3; 1999. Refer to the following web page to get the latest version of the standard:
http://www.iso.ch/iso/en/prods-services/iso3166ma/02iso-3166-code-lists/index.html
If you need more information about the ISO standard please contact ISO for more details. |
6 | Country | Lines: 105 128 151 204 695 |
---|
For representation of Country name RosettaNet has adopted ISO 3166-3; 1999. Refer to the following web page to get the latest version of the standard:
http://www.iso.ch/iso/en/prods-services/iso3166ma/02iso-3166-code-lists/index.html
If you need more information about the ISO standard please contact ISO for more details. |
7 | FileType | Lines: 22 |
---|
Describes the file type of the TPIR form (PDF, XDP or XML). |
Entity Instances |
---|
PDF | Portable Document Format. |
XDP | XML Data Package. |
XML | eXtensible Markup Language. |
8 | Language | Lines: 32 |
---|
For representation of Language name RosettaNet has adopted ISO 639-2; 1998. Refer to the following web page to get the latest version of the standard:
http://www.loc.gov/standards/iso639-2/iso639jac.html
If you need more information about the ISO standard please contact ISO for more details. |
9 | LotStatusCompletion | Lines: 235 |
---|
Status completion of lot or sublot at the end of testing. |
Entity Instances |
---|
ABO | Aborted: process has been terminated; data is invalid and is purged. |
COM | Completed: all process have been completed; data is valid and can be migrated. |
SUS | Suspend: process is partially done; data is valid and can be migrated. |
10 | LotType | Lines: 180 |
---|
Describes the mode in which product was tested. |
Entity Instances |
---|
DEV | Development. |
ENG | Engineering - State where product is made using test processes on non-production tools or equipment. |
EUH | EUH type. |
MFG | Manufacturing. |
NCL | NonConformingLot - Lots affected by a nonconformity to preset quality characteristics. |
PLT | Pilot - The first lot of the product (never produced at the dedicated subcontractor). |
PPD | Pre-Production. |
PQC | Process Qualification Check - Process to qualify manufacturing processes in preparation for volume manufacturing. |
PRD | Production - State where product is made using all production tools, processes, equipment, environment, facility, and cycle time. |
RND | Research and Development - Process for developing prototype products. |
RWK | Rework - Parts sent back from further down the manufacturing line. |
SVC | Service. |
TST | Test - The manufacturing stage in which the packaged die is tested. |
11 | MimeTypeQualifier | Lines: 34 |
---|
The MIME type as defined by IANA.
Please refer to http://www.iana.org/assignments/media-types/ for a list of types. |
Entity Instances |
---|
application/EDI-Consent | [RFC1767] |
application/EDI-X12 | [RFC1767] |
application/EDIFACT | [RFC1767] |
application/activemessage | [Shapiro] |
application/andrew-inset | [Borenstein] |
application/applefile | [Faltstrom] |
application/atomicmail | [Borenstein] |
application/batch-SMTP | [RFC2442] |
application/beep+xml | [RFC3080] |
application/cals-1840 | [RFC1895] |
application/cnrp+xml | [RFCCNRP] |
application/commonground | [Glazer] |
application/cpl+xml | |
application/cybercash | [Eastlake] |
application/dca-rft | [Campbell] |
application/dec-dx | [Campbell] |
application/dicom | [RFC3240] |
application/dvcs | [RFC3029] |
application/eshop | [Katz] |
application/font-tdpfr | [RFC3073] |
application/http | [RFC2616] |
application/hyperstudio | [Domino] |
application/iges | [Parks] |
application/index | [RFC2652] |
application/index.cmd | [RFC2652] |
application/index.obj | [RFC2652] |
application/index.response | [RFC2652] |
application/index.vnd | [RFC2652] |
application/iotp | [RFC2935] |
application/ipp | [RFC2910] |
application/isup | [RFC3204] |
application/mac-binhex40 | [Faltstrom] |
application/macwriteii | [Lindner] |
application/marc | [RFC2220] |
application/mathematica | [Van Nostern] |
application/msword | [Lindner] |
application/news-message-id | [RFC1036,Spencer] |
application/news-transmission | [RFC1036, Spencer] |
application/ocsp-request | [RFC2560] |
application/ocsp-response | [RFC2560] |
application/octet-stream | [RFC2045,RFC2046] |
application/oda | [RFC2045,RFC2046] |
application/ogg | [RFC-walleij-ogg-mediatype-08.txt] |
application/parityfec | [RFC3009] |
application/pdf | [Lindner] |
application/pgp-encrypted | [RFC3156] |
application/pgp-keys | [RFC3156] |
application/pgp-signature | [RFC3156] |
application/pkcs10 | [RFC2311] |
application/pkcs7-mime | [RFC2311] |
application/pkcs7-signature | [RFC2311] |
application/pkix-cert | [RFC2585] |
application/pkix-crl | [RFC2585] |
application/pkixcmp | [RFC2510] |
application/postscript | [RFC2045,RFC2046] |
application/prs.alvestrand.titrax-sheet | [Alvestrand] |
application/prs.cww | [Rungchavalnont] |
application/prs.nprend | [Doggett] |
application/prs.plucker | [Janssen] |
application/qsig | [RFC3204] |
application/reginfo+xml | [RFC-ietf-sipping-reg-event-00.txt] |
application/remote-printing | [RFC1486,Rose] |
application/riscos | [Smith] |
application/rtf | [Lindner] |
application/sdp | [RFC2327] |
application/set-payment | [Korver] |
application/set-payment-initiation | [Korver] |
application/set-registration | [Korver] |
application/set-registration-initiation | [Korver] |
application/sgml | [RFC1874] |
application/sgml-open-catalog | [Grosso] |
application/sieve | [RFC3028] |
application/slate | [Crowley] |
application/timestamp-query | [RFC3161] |
application/timestamp-reply | [RFC3161] |
application/tve-trigger | [Welsh] |
application/vemmi | [RFC2122] |
application/vnd.3M.Post-it-Notes | [O'Brien] |
application/vnd.3gpp.pic-bw-large | [Meredith] |
application/vnd.3gpp.pic-bw-small | [Meredith] |
application/vnd.3gpp.pic-bw-var | [Meredith] |
application/vnd.3gpp.sms | [Meredith] |
application/vnd.FloGraphIt | [Floersch] |
application/vnd.Mobius.DAF | [Kabayama] |
application/vnd.Mobius.DIS | [Kabayama] |
application/vnd.Mobius.MBK | [Devasia] |
application/vnd.Mobius.MQY | [Devasia] |
application/vnd.Mobius.MSL | [Kabayama] |
application/vnd.Mobius.PLC | [Kabayama] |
application/vnd.Mobius.TXF | [Kabayama] |
application/vnd.Quark.QuarkXPress | [Scheidler] |
application/vnd.accpac.simply.aso | [Leow] |
application/vnd.accpac.simply.imp | [Leow] |
application/vnd.acucobol | [Lubin] |
application/vnd.acucorp | [Lubin] |
application/vnd.adobe.xfdf | [Perelman] |
application/vnd.aether.imp | [Moskowitz] |
application/vnd.amiga.ami | [Blumberg] |
application/vnd.anser-web-certificate-issue-initiation | [Mori] |
application/vnd.anser-web-funds-transfer-initiation | [Mori] |
application/vnd.audiograph | [Slusanschi] |
application/vnd.blueice.multipass | [Holmstrom] |
application/vnd.bmi | [Gotoh] |
application/vnd.businessobjects | [Imoucha] |
application/vnd.canon-cpdl | [Muto] |
application/vnd.canon-lips | [Muto] |
application/vnd.cinderella | [Kortenkamp] |
application/vnd.claymore | [Simpson] |
application/vnd.commerce-battelle | [Applebaum] |
application/vnd.commonspace | [Chandhok] |
application/vnd.contact.cmsg | [Patz] |
application/vnd.cosmocaller | [Dellutri] |
application/vnd.ctc-posml | [Kohlhepp] |
application/vnd.cups-postscript | [Sweet] |
application/vnd.cups-raster | [Sweet] |
application/vnd.cups-raw | [Sweet] |
application/vnd.curl | [Byrnes] |
application/vnd.cybank | [Helmee] |
application/vnd.data-vision.rdz | [Fields] |
application/vnd.dna | [Searcy] |
application/vnd.dpgraph | [Parker] |
application/vnd.dreamfactory | [Appleton] |
application/vnd.dxr | [Duffy] |
application/vnd.ecdis-update | [Buettgenbach] |
application/vnd.ecowin.chart | [Olsson] |
application/vnd.ecowin.filerequest | [Olsson] |
application/vnd.ecowin.fileupdate | [Olsson] |
application/vnd.ecowin.series | [Olsson] |
application/vnd.ecowin.seriesrequest | [Olsson] |
application/vnd.ecowin.seriesupdate | [Olsson] |
application/vnd.enliven | [Santinelli] |
application/vnd.epson.esf | [Hoshina] |
application/vnd.epson.msf | [Hoshina] |
application/vnd.epson.quickanime | [Gu] |
application/vnd.epson.salt | [Nagatomo] |
application/vnd.epson.ssf | [Hoshina] |
application/vnd.ericsson.quickcall | [Tidwell] |
application/vnd.eudora.data | [Resnick] |
application/vnd.fdf | [Zilles] |
application/vnd.ffsns | [Holstage] |
application/vnd.framemaker | [Wexler] |
application/vnd.fsc.weblaunch | [D.Smith] |
application/vnd.fujitsu.oasys | [Togashi] |
application/vnd.fujitsu.oasys2 | [Togashi] |
application/vnd.fujitsu.oasys3 | [Okudaira] |
application/vnd.fujitsu.oasysgp | [Sugimoto] |
application/vnd.fujitsu.oasysprs | [Ogita] |
application/vnd.fujixerox.ddd | [Onda] |
application/vnd.fujixerox.docuworks | [Taguchi] |
application/vnd.fujixerox.docuworks.binder | [Matsumoto] |
application/vnd.fut-misnet | [Pruulmann] |
application/vnd.grafeq | [Tupper] |
application/vnd.groove-account | [Joseph] |
application/vnd.groove-help | [Joseph] |
application/vnd.groove-identity-message | [Joseph] |
application/vnd.groove-injector | [Joseph] |
application/vnd.groove-tool-message | [Joseph] |
application/vnd.groove-tool-template | [Joseph] |
application/vnd.groove-vcard | [Joseph] |
application/vnd.hbci | [Hammann] |
application/vnd.hhe.lesson-player | [Jones] |
application/vnd.hp-HPGL | [Pentecost] |
application/vnd.hp-PCL | [Pentecost] |
application/vnd.hp-PCLXL | [Pentecost] |
application/vnd.hp-hpid | [Gupta] |
application/vnd.hp-hps | [Aubrey] |
application/vnd.httphone | [Lefevre] |
application/vnd.hzn-3d-crossword | [Minnis] |
application/vnd.ibm.MiniPay | [Herzberg] |
application/vnd.ibm.afplinedata | [Buis] |
application/vnd.ibm.electronic-media | [Tantlinger] |
application/vnd.ibm.modcap | [Hohensee] |
application/vnd.ibm.secure-container | [Tantlinger] |
application/vnd.informix-visionary | [Gales] |
application/vnd.intercon.formnet | [Gurak] |
application/vnd.intertrust.digibox | [Tomasello] |
application/vnd.intertrust.nncp | [Tomasello] |
application/vnd.intu.qbo | [Scratchley] |
application/vnd.intu.qfx | [Scratchley] |
application/vnd.irepository.package+xml | [Knowles] |
application/vnd.is-xpr | [Natarajan] |
application/vnd.japannet-directory-service | [Fujii] |
application/vnd.japannet-jpnstore-wakeup | [Yoshitake] |
application/vnd.japannet-payment-wakeup | [Fujii] |
application/vnd.japannet-registration | [Yoshitake] |
application/vnd.japannet-registration-wakeup | [Fujii] |
application/vnd.japannet-setstore-wakeup | [Yoshitake] |
application/vnd.japannet-verification | [Yoshitake] |
application/vnd.japannet-verification-wakeup | [Fujii] |
application/vnd.jisp | [Deckers] |
application/vnd.kde.karbon | [Faure] |
application/vnd.kde.kchart | [Faure] |
application/vnd.kde.kformula | [Faure] |
application/vnd.kde.kivio | [Faure] |
application/vnd.kde.kontour | [Faure] |
application/vnd.kde.kpresenter | [Faure] |
application/vnd.kde.kspread | [Faure] |
application/vnd.kde.kword | [Faure] |
application/vnd.kenameaapp | [DiGiorgio-Haag] |
application/vnd.koan | [Cole] |
application/vnd.liberty-request+xml | [McDowell] |
application/vnd.llamagraphics.life-balance.desktop | [White] |
application/vnd.lotus-1-2-3 | [Wattenberger] |
application/vnd.lotus-approach | [Wattenberger] |
application/vnd.lotus-freelance | [Wattenberger] |
application/vnd.lotus-notes | [Laramie] |
application/vnd.lotus-organizer | [Wattenberger] |
application/vnd.lotus-screencam | [Wattenberger] |
application/vnd.lotus-wordpro | [Wattenberger] |
application/vnd.mcd | [Gotoh] |
application/vnd.mediastation.cdkey | [Flurry] |
application/vnd.meridian-slingshot | [Wedel] |
application/vnd.micrografx.flo | [Prevo] |
application/vnd.micrografx.igx | [Prevo] |
application/vnd.mif | [Wexler] |
application/vnd.minisoft-hp3000-save | [Bartram] |
application/vnd.mitsubishi.misty-guard.trustweb | [Tanaka] |
application/vnd.mophun.application | [Wennerstrom] |
application/vnd.mophun.certificate | [Wennerstrom] |
application/vnd.motorola.flexsuite | [Patton] |
application/vnd.motorola.flexsuite.adsi | [Patton] |
application/vnd.motorola.flexsuite.fis | [Patton] |
application/vnd.motorola.flexsuite.gotap | [Patton] |
application/vnd.motorola.flexsuite.kmr | [Patton] |
application/vnd.motorola.flexsuite.ttc | [Patton] |
application/vnd.motorola.flexsuite.wem | [Patton] |
application/vnd.mozilla.xul+xml | [McDaniel] |
application/vnd.ms-artgalry | [Slawson] |
application/vnd.ms-asf | [Fleischman] |
application/vnd.ms-excel | [Gill] |
application/vnd.ms-lrm | [Ledoux] |
application/vnd.ms-powerpoint | [Gill] |
application/vnd.ms-project | [Gill] |
application/vnd.ms-tnef | [Gill] |
application/vnd.ms-works | [Gill] |
application/vnd.ms-wpl | [Plastina] |
application/vnd.mseq | [Le Bodic] |
application/vnd.msign | [Borcherding] |
application/vnd.music-niff | [Butler] |
application/vnd.musician | [Adams] |
application/vnd.netfpx | [Mutz] |
application/vnd.noblenet-directory | [Solomon] |
application/vnd.noblenet-sealer | [Solomon] |
application/vnd.noblenet-web | [Solomon] |
application/vnd.novadigm.EDM | [Swenson] |
application/vnd.novadigm.EDX | [Swenson] |
application/vnd.novadigm.EXT | [Swenson] |
application/vnd.obn | [Hessling] |
application/vnd.osa.netdeploy | [Klos] |
application/vnd.palm | [Peacock] |
application/vnd.pg.format | [Gandert] |
application/vnd.pg.osasli | [Gandert] |
application/vnd.powerbuilder6 | [Guy] |
application/vnd.powerbuilder6-s | [Guy] |
application/vnd.powerbuilder7 | [Shilts] |
application/vnd.powerbuilder7-s | [Shilts] |
application/vnd.powerbuilder75 | [Shilts] |
application/vnd.powerbuilder75-s | [Shilts] |
application/vnd.previewsystems.box | [Smolgovsky] |
application/vnd.publishare-delta-tree | [Ben-Kiki] |
application/vnd.pvi.ptid1 | [Lamb] |
application/vnd.pwg-multiplexed | [RFC3391] |
application/vnd.pwg-xhtml-print+xml | [Wright] |
application/vnd.rapid | [Szekely] |
application/vnd.s3sms | [Tarkkala] |
application/vnd.sealed.net | [Lambert] |
application/vnd.seemail | [Webb] |
application/vnd.shana.informed.formdata | [Selzler] |
application/vnd.shana.informed.formtemplate | [Selzler] |
application/vnd.shana.informed.interchange | [Selzler] |
application/vnd.shana.informed.package | [Selzler] |
application/vnd.smaf | [Takahashi] |
application/vnd.sss-cod | [Dani] |
application/vnd.sss-dtf | [Bruno] |
application/vnd.sss-ntf | [Bruno] |
application/vnd.street-stream | [Levitt] |
application/vnd.svd | [Becker] |
application/vnd.swiftview-ics | [Widener] |
application/vnd.triscape.mxs | [Simonoff] |
application/vnd.trueapp | [Hepler] |
application/vnd.truedoc | [Chase] |
application/vnd.ufdl | [Manning] |
application/vnd.uplanet.alert | [Martin] |
application/vnd.uplanet.alert-wbxml | [Martin] |
application/vnd.uplanet.bearer-choice | [Martin] |
application/vnd.uplanet.bearer-choice-wbxml | [Martin] |
application/vnd.uplanet.cacheop | [Martin] |
application/vnd.uplanet.cacheop-wbxml | [Martin] |
application/vnd.uplanet.channel | [Martin] |
application/vnd.uplanet.channel-wbxml | [Martin] |
application/vnd.uplanet.list | [Martin] |
application/vnd.uplanet.list-wbxml | [Martin] |
application/vnd.uplanet.listcmd | [Martin] |
application/vnd.uplanet.listcmd-wbxml | [Martin] |
application/vnd.uplanet.signal | [Martin] |
application/vnd.vcx | [T.Sugimoto] |
application/vnd.vectorworks | [Pharr] |
application/vnd.vidsoft.vidconference | [Hess] |
application/vnd.visio | [Sandal] |
application/vnd.visionary | [Aravindakumar] |
application/vnd.vividence.scriptfile | [Risher] |
application/vnd.vsf | [Rowe] |
application/vnd.wap.sic | [WAP-Forum] |
application/vnd.wap.slc | [WAP-Forum] |
application/vnd.wap.wbxml | [Stark] |
application/vnd.wap.wmlc | [Stark] |
application/vnd.wap.wmlscriptc | [Stark] |
application/vnd.webturbo | [Rehem] |
application/vnd.wrq-hp3000-labelled | [Bartram] |
application/vnd.wt.stf | [Wohler] |
application/vnd.wv.csp+wbxml | [Salmi] |
application/vnd.xara | [Matthewman] |
application/vnd.xfdl | [Manning] |
application/vnd.yellowriver-custom-menu | [Yellow] |
application/whoispp-query | [RFC2957] |
application/whoispp-response | [RFC2958] |
application/wita | [Campbell] |
application/wordperfect5.1 | [Lindner] |
application/x400-bp | [RFC1494] |
application/xhtml+xml | [RFC3236] |
application/xml | [RFC3023] |
application/xml-dtd | [RFC3023] |
application/xml-external-parsed-entity | [RFC3023] |
application/zip | [Lindner] |
audio/32kadpcm | [RFC2421,RFC2422] |
audio/AMR | [RFC3267] |
audio/AMR-WB | [RFC3267] |
audio/CN | [RFC3389] |
audio/DAT12 | [RFC3190] |
audio/DVI4 | |
audio/EVRC | [RFC-ietf-avt-evrc-smv-03.txt] |
audio/EVRC0 | [RFC-ietf-avt-evrc-smv-03.txt] |
audio/G.722.1 | [RFC3047] |
audio/G722 | |
audio/G723 | |
audio/G726-16 | |
audio/G726-24 | |
audio/G726-32 | |
audio/G726-40 | |
audio/G728 | |
audio/G729 | |
audio/G729D | |
audio/G729E | |
audio/GSM | |
audio/GSM-EFR | |
audio/L16 | [RFC2586] |
audio/L20 | [RFC3190] |
audio/L24 | [RFC3190] |
audio/L8 | |
audio/LPC | |
audio/MP4A-LATM | [RFC3016] |
audio/MPA | |
audio/PCMA | |
audio/PCMU | |
audio/QCELP | |
audio/RED | |
audio/SMV | [RFC-ietf-avt-evrc-smv-03.txt] |
audio/SMV0 | [RFC-ietf-avt-evrc-smv-03.txt] |
audio/VDVI | |
audio/basic | [RFC2045,RFC2046] |
audio/mpa-robust | [RFC3119] |
audio/mpeg | [RFC3003] |
audio/parityfec | [RFC3009] |
audio/prs.sid | [Walleij] |
audio/telephone-event | [RFC2833] |
audio/tone | [RFC2833] |
audio/vnd.3gpp.iufp | [Belling] |
audio/vnd.cisco.nse | [Kumar] |
audio/vnd.cns.anp1 | [McLaughlin] |
audio/vnd.cns.inf1 | [McLaughlin] |
audio/vnd.digital-winds | [Strazds] |
audio/vnd.everad.plj | [Cicelsky] |
audio/vnd.lucent.voice | [Vaudreuil] |
audio/vnd.nortel.vbk | [Parsons] |
audio/vnd.nuera.ecelp4800 | [Fox] |
audio/vnd.nuera.ecelp7470 | [Fox] |
audio/vnd.nuera.ecelp9600 | [Fox] |
audio/vnd.octel.sbc | [Vaudreuil] |
audio/vnd.qcelp | [Lundblade] |
audio/vnd.rhetorex.32kadpcm | [Vaudreuil] |
audio/vnd.vmx.cvsd | [Vaudreuil] |
image/cgm | Computer Graphics Metafile |
image/g3fax | [RFC1494] |
image/gif | [RFC2045,RFC2046] |
image/ief | [RFC1314] Image Exchange Format |
image/jpeg | [RFC2045,RFC2046] |
image/naplps | [Ferber] |
image/png | [Randers-Pehrson] |
image/prs.btif | [Simon] |
image/prs.pti | [Laun] |
image/t38 | [RFC3362] |
image/tiff | [RFC3302] Tag Image File Format |
image/tiff-fx | [RFC3250] Tag Image File Format Fax eXtended |
image/vnd.cns.inf2 | [McLaughlin] |
image/vnd.djvu | [Bottou] |
image/vnd.dwg | [Moline] |
image/vnd.dxf | [Moline] |
image/vnd.fastbidsheet | [Becker] |
image/vnd.fpx | [Spencer] |
image/vnd.fst | [Fuldseth] |
image/vnd.fujixerox.edmics-mmr | [Onda] |
image/vnd.fujixerox.edmics-rlc | [Onda] |
image/vnd.globalgraphics.pgb | [Bailey] |
image/vnd.mix | [Reddy] |
image/vnd.ms-modi | [Vaughan] |
image/vnd.net-fpx | [Spencer] |
image/vnd.svf | [Moline] |
image/vnd.wap.wbmp | [Stark] |
image/vnd.xiff | [S.Martin] |
message/delivery-status | [RFC1894] |
message/disposition-notification | [RFC2298] |
message/external-body | [RFC2045,RFC2046] |
message/http | [RFC2616] |
message/news | [RFC 1036, H.Spencer] |
message/partial | [RFC2045,RFC2046] |
message/rfc822 | [RFC2045,RFC2046] |
message/s-http | [RFC2660] |
message/sip | [RFC3261] |
message/sipfrag | [RFC3420] |
model/iges | [Parks] |
model/mesh | [RFC2077] |
model/vnd.dwf | [Pratt] |
model/vnd.flatland.3dml | [Powers] |
model/vnd.gdl | [Babits] |
model/vnd.gs-gdl | [Babits] |
model/vnd.gtw | [Ozaki] |
model/vnd.mts | [Rabinovitch] |
model/vnd.parasolid.transmit.binary | [Parasolid] |
model/vnd.parasolid.transmit.text | [Parasolid] |
model/vnd.vtu | [Rabinovitch] |
model/vrml | [RFC2077] |
multipart/alternative | [RFC2045,RFC2046] |
multipart/appledouble | [Faltstrom] |
multipart/byteranges | [RFC2068] |
multipart/digest | [RFC2045,RFC2046] |
multipart/encrypted | [RFC1847] |
multipart/form-data | [RFC2388] |
multipart/header-set | [Crocker] |
multipart/mixed | [RFC2045,RFC2046] |
multipart/parallel | [RFC2045,RFC2046] |
multipart/related | [RFC2387] |
multipart/report | [RFC1892] |
multipart/signed | [RFC1847] |
multipart/voice-message | [RFC2421,RFC2423] |
text/calendar | [RFC2445] |
text/css | [RFC2318] |
text/directory | [RFC2425] |
text/enriched | [RFC1896] |
text/html | [RFC2854] |
text/parityfec | [RFC3009] |
text/plain | [RFC2646,RFC2046] |
text/prs.lines.tag | [Lines] |
text/rfc822-headers | [RFC1892] |
text/richtext | [RFC2045,RFC2046] |
text/rtf | [Lindner] |
text/sgml | [RFC1874] |
text/t140 | [RFC2793] |
text/tab-separated-values | [Lindner] |
text/uri-list | [RFC2483] |
text/vnd.DMClientScript | [Bradley] |
text/vnd.IPTC.NITF | [IPTC] |
text/vnd.IPTC.NewsML | [IPTC] |
text/vnd.abc | [Allen] |
text/vnd.curl | [Byrnes] |
text/vnd.fly | [Gurney] |
text/vnd.fmi.flexstor | [Hurtta] |
text/vnd.in3d.3dml | [Powers] |
text/vnd.in3d.spot | [Powers] |
text/vnd.latex-z | [Lubos] |
text/vnd.motorola.reflex | [Patton] |
text/vnd.ms-mediapackage | [Nelson] |
text/vnd.net2phone.commcenter.command | [Xie] |
text/vnd.sun.j2me.app-descriptor | [G.Adams] |
text/vnd.wap.si | [WAP-Forum] |
text/vnd.wap.sl | [WAP-Forum] |
text/vnd.wap.wml | [Stark] |
text/vnd.wap.wmlscript | [Stark] |
text/xml | [RFC3023] |
text/xml-external-parsed-entity | [RFC3023] |
video/BMPEG | |
video/BT656 | |
video/CelB | |
video/DV | [RFC3189] |
video/H261 | |
video/H263 | |
video/H263-1998 | |
video/H263-2000 | |
video/JPEG | |
video/MP1S | |
video/MP2P | |
video/MP2T | |
video/MP4V-ES | [RFC3016] |
video/MPV | |
video/SMPTE292M | [RFC-avt-smpte292-video-08.txt] |
video/mpeg | [RFC2045,RFC2046] |
video/nv | |
video/parityfec | [RFC3009] |
video/pointer | [RFC2862] |
video/quicktime | [Lindner] |
video/vnd.fvt | [Fuldseth] |
video/vnd.motorola.video | [McGinty] |
video/vnd.motorola.videop | [McGinty] |
video/vnd.mpegurl | [Recktenwald] |
video/vnd.nokia.interleaved-multimedia | [Kangaslampi] |
video/vnd.objectvideo | [Clark] |
video/vnd.vivo | [Wolfe] |
12 | PCMParmType | Lines: 676 |
---|
Used to identify whether a PCM parameter is part of the wafer acceptance test (WAT) or customer specific parameter (CSP) list. The WAT and CSP list is negotiated between the customer and the foundry for a given technology. |
Entity Instances |
---|
CSP | Customer Specific Parameter. |
PSR | Product Specification Limit. |
WAT | Wafer Acceptance Test. |
WLR | Wafer Level Reliability. |
13 | SortWeight | Lines: 231 |
---|
A relative representation of yield for a device or module. |
Entity Instances |
---|
0 | Bad. |
100 | All Good. |
25 | 1/4 Good. |
50 | 1/2 Good. |
75 | 3/4 Good. |
14 | Status | Lines: 361 484 600 |
---|
Describes the Status result for a vector test. |
Entity Instances |
---|
ATH | H=actual H. |
EHD | expect H D=actual Z. |
EHF | expect H F=actual L. |
ELB | expected L B=actual H. |
ELE | expect L E=actual L. |
EUA | expected unknown A=actual H. |
EUL | expect unknown L=actual L. |
EUZ | expect unknown Z=actual Z. |
EZC | expect Z C=actual Z. |
EZZ | expect Z. |
16 | UnitOfMeasure | Lines: 285 399 522 638 675 |
---|
Code identifying a product unit of measure. |
Entity Instances |
---|
10P | 10-pack. |
1BF | 100 Board Feet. |
1FC | 20 Foot Container. |
1GR | Gram/Cubic Centimeter. |
1GT | 10,000 Gallon Tankcar. |
1KB | 25 Kilogram Bulk Bag. |
1KD | 10 Kilogram Drum. |
1KP | 1000-pack. |
1M2 | 1/Square Meter (1/M2). |
1PA | 20-Pack. |
1PB | 50 Pound Bag. |
1PD | 100 Pound Drum. |
1PM | 1/minute (1/min). |
22S | Square Millimeter/Second (mm2/s). |
2FC | 40 Foot Container. |
2GR | Gram/square meter. |
2GT | 20,000 Gallon Tankcar. |
2KB | 300 Kilogram Bulk Bag. |
2KD | 15 Kilogram Drum. |
2PA | 100-Pack. |
3GR | Grams Per 100 Centimeters. |
3KB | 500 Kilogram Bulk Bag. |
3KD | 55 Gallon Drum. |
3MH | Cubic Millimeters/Hour (mm3/hour). |
4GR | Grams Per 100 Grams. |
4KD | 115 Kilogram Drum. |
50P | 50-pack. |
5GR | Grams Per Cubic Centimeter. |
6GR | Grams Per Square Centimeter. |
7GR | Grams Per Square Meter. |
ABC | Absorbance per centimeter (Absorbance per cm). |
ABU | Absorbance per Unit (absorbance per unit). |
ACC | Atoms per Cubic Centimeters (atoms per cu cm). |
ACR | Acre. |
ACS | Acidic strength/concentration. |
ACT | Actual Pounds. |
ACU | Activity unit (Activ.unit). |
ALU | Aluminum Pounds Only. |
AM1 | Ampoule. |
AMN | Ångstroms/Minute (Ångst/min). |
AMP | Ampere. |
ANG | Angstrom (A). |
APB | Atomic Parts per Billion (atomic ppb). |
APG | API Specific Gravity (API Grav). |
APM | Atomic Parts per Million (atomic ppm). |
APT | Atomic Parts per Trillion (atomic ppt). |
APU | APHA Units (apha). |
ASC | Atoms per Square Centimeters (atoms per sq cm). |
ASM | Angstrom. |
ASY | Assembly (ASY). |
ATG | Atmospheric gauge. |
ATM | Atmosphere absolute. |
ATP | Atomic %. |
ATY | Activity. |
BAB | Base Box. |
BAC | Batch. |
BAE | Bale. |
BAG | Bag. |
BAL | Ball. |
BAN | Band. |
BAP | Batting Pound. |
BAR | Bar. |
BAS | Basket. |
BAT | Batt. |
BAW | Base Weight. |
BEA | Beam. |
BEC | Becquerel/kilogram. |
BEL | Belt. |
BHP | Brake HP. |
BIL | Billet. |
BIN | Bin. |
BIT | Bit. |
BKC | Bulk Car Load. |
BLN | Balance. |
BLO | Block. |
BOA | Board. |
BOF | Board Feet. |
BOL | Bolt. |
BOT | Bottle. |
BOX | Box. |
BRB | Bar absolute. |
BRD | Barrels Per Day. |
BRE | Barrel. |
BRI | Barrel (Imperial). |
BRM | Barrels Per Minute. |
BTF | British Thermal Units (BTUs) Per Cubic Foot. |
BTP | British Thermal Units (BTUs) Per Pound. |
BTU | British Thermal Unit (BTU). |
BUB | Bubbler. |
BUC | Bucket. |
BUD | Bushel, Dry Imperial. |
BUK | Bunks. |
BUL | Bulk. |
BUN | Bundle. |
BUP | Bulk Pack. |
BUS | Bushel. |
BYT | Bytes. |
C0W | Counts per Wafer (Counts/wf). |
C3M | Cubic centimeter per minute (cm3/minute). |
CAA | Carat. |
CAB | Carboy. |
CAC | Card. |
CAD | Candela. |
CAG | Cartridge. |
CAK | Cask. |
CAL | Calorie. |
CAN | Can. |
CAO | Carload. |
CAR | Car. |
CAS | Case. |
CAT | Canister. |
CAW | Catchweight. |
CC2 | Centipoises per hour per square centimeters (cps per hr per sq cm). |
CCC | Counts per Square Centimeters (Counts/cm2). |
CD3 | Cubic decimeter (Cubic dec). |
CEL | Cell. |
CEM | Centimeter. |
CEP | Centipoises (CPS). |
CET | Centiliter. |
CGM | Centigram. |
CHA | Chains (Land Survey). |
CHE | Chest. |
CM2 | Square centimeter (cm2). |
CMH | Centimeter/hour (cm/h). |
CML | Colony/Milliliter (col/ml). |
CMS | Centimeter/Second (cm/s). |
CNN | Connector. |
COG | Coil Group. |
COI | Coil. |
COL | Coulomb. |
COM | Composite Product Pounds (Total Weight). |
CON | Cone. |
COT | Container. |
COV | Cover. |
CRA | Crate. |
CRT | Carton. |
CSE | Cassette. |
CST | Centistokes. |
CUB | Cubic centimeter. |
CUC | Cubic centimeter/second. |
CUF | Cubic Foot. |
CUI | Cubic inch. |
CUM | Cubic meter. |
CUP | Cup. |
CUY | Cubic yard. |
CYC | Cycles. |
CYL | Cylinder. |
DAL | Dalton units (dalton). |
DAY | Day. |
DCB | Decibels. |
DCG | Decagram. |
DCL | Deciliter. |
DCM | Defects per Square Centimeters (Defects/cm2). |
DE1 | Defects. |
DE2 | Degrees in Angles. |
DE3 | Degree. |
DEA | Deal. |
DEC | Decimeter. |
DEF | Degree Fahrenheit. |
DEG | Degree Celsius. |
DEP | Dep. Factor. |
DFW | Defects per Wafer (Defects/Wafer). |
DGM | Decigram. |
DIE | Die. |
DIL | Display. |
DIP | Dispenser. |
DNC | Dynes per centimeter (Dynes per cm). |
DOZ | Dozen. |
DPM | Parts per Million per Day (ppm per day). |
DRA | Dram. |
DRU | Drum. |
DRY | Dry Pounds. |
EAC | Each. |
ELE | Electrical Capacitance. |
EML | Enzyme Units/Milliliter (Enzyme/ml). |
ENU | Enzyme Units (Enzy.Units). |
EQ2 | Milliequivalent per 30 Kg (mequ/30Kg). |
EQG | Milliequivalent per gram (milliequivalent per g). |
EQK | Milliequivalent per Kilogram (mequ/Kg). |
EQM | Milliequivalent per Millimeter (milliequivalent per mm). |
FAR | Farads. |
FFA | Femtofarad. |
FIN | 1/32 inch. |
FLO | Fluid Ounce. |
FOI | Fluid Ounce (Imperial). |
FOO | Foot. |
FOU | Fluid Ounce US. |
FPS | Feet per second (Feet/s). |
FRH | Sales FT3 at 60°F per hour (FTR/hour). |
FRM | Sales FT3 at 60°F per minute (FTR/min). |
FTR | Sales FT3 at 60°F, 14.7 psia (SFT3_60F_S). |
FTS | Sales FT3 at 70°F, 14.7 psia (SFT3_70F_S). |
FTT | 1000 FT3 at 60°F, 14.7 psia (KFT3_60F_S). |
FTU | 1000 FT3 at 70°F, 14.7 psia (KFT3_70F_S). |
FUU | Fuel Usage (Gallons). |
G2S | Gram square per second (g²/s). |
GAI | Gram act. ingrd. (g act.ing). |
GAL | Gallon. |
GAS | Gage Systems. |
GAU | Gram Gold. |
GCL | Gardner Color. |
GEG | Keim/Gramm (keim/g). |
GEQ | Gram per Equivalent (g/Eq). |
GGM | Gram per gram mole (g/gmole). |
GHG | Gram per Hectogram (g/hg). |
GIH | Gigahertz. |
GIJ | Gigajoules. |
GIL | Gill (Imperial). |
GM4 | Gram per 100 Milliliters (g/100ml). |
GME | Gram per Mole Equivalent (g/mole Eq). |
GMO | Gram per Mol (g/mol). |
GNL | Gram act.Ingrd per Liter (gai/liter). |
GOB | Gross Barrels. |
GOG | Gross Gallons. |
GOH | Gigaohm (GOhm). |
GOK | Gross Kilogram. |
GOT | Gross Ton. |
GOY | Gross Yard. |
GPN | US Gallon per minute (gpm US). |
GRA | Gram. |
GRG | Great Gross (Dozen Gross). |
GRK | Grams Per Kilogram. |
GRL | Grams Per Liter. |
GRM | Grams Per Milliliter. |
GRN | Grain. |
GRO | Gross. |
GRP | Group. |
HAG | Half Gallon. |
HAH | Half Hour. |
HAL | Half Liter. |
HAN | Hank. |
HEA | Heat lots. |
HEC | Hectare. |
HEL | Hectoliter. |
HEP | Hectopascal. |
HER | Hertz. |
HGM | Hegman. |
HNY | Henry. |
HOS | Hours. |
HOU | Hour. |
HUA | Hundredth of a Carat. |
HUB | Hundred Boxes. |
HUC | Hundred Count. |
HUS | Hundred Sheets. |
HZM | Hertz per Minute (Hertz per min). |
IH2 | Inches of Water Gauge (inH2O-g). |
IHG | Inches of Mercury Gauge (inHg-g). |
ILB | Inch pounds (in.lb). |
IMG | Imperial Gallons. |
INC | Inch. |
IPS | Inch per second (inch / sec). |
JAR | Jar. |
JKG | Joule/Kilogram (J/kg). |
JMO | Joule/Mol (J/mol). |
JOI | Joint. |
JOU | Joule. |
KAI | Kilogram act. Ingrd. (kg ac.ing.). |
KAK | kg act.ingrd. / kg (kai/kg). |
KBY | Kilobyte. |
KCM | Kilogram per cm2 gauge (kg/cm2-g). |
KD3 | Kilogram per Cubic Decimeter (kg/dm3). |
KEG | Keg. |
KEL | Kelvin. |
KGE | Container Fill Weight in Kg/Ea. |
KGH | Kilogram per Hour (kg/h). |
KGL | Kilograms per Liter (kg/L). |
KGM | Kilogram/Mol (kg/mol). |
KGS | Kilogram per Second (kg/s). |
KHO | Kilometer/hour. |
KIC | Kilogram per cubic meter. |
KIE | Kilometer. |
KIG | Kilogram. |
KIH | Kilohertz. |
KIK | Kilobecquerel/Kilogram. |
KIL | Kiloampere. |
KIM | Kilogram/square meter. |
KIO | Kiloohm. |
KIS | Kilogramm pro Sekunde. |
KIT | Kit. |
KIV | Kilovolt. |
KIW | Kilowatt. |
KJK | Kilojoule per kilogram (KJ/kg). |
KJL | Kilojoule. |
KJM | Kilojoule/Mol (KJ/mol). |
KKG | Kilogram/Kilogram. |
KMK | Cubic meter/Cubic meter (m3/m3). |
KMN | Kelvin per Minute (K/min). |
KMS | Kelvin per Second (K/s). |
KNM | Kilonewton per square meter (kN/m2). |
KNT | Kilonewton (ND). |
KPA | Kilopascal (kPa). |
KRU | Kreb Unit. |
KTN | Kilotonne (kt). |
KUD | Kubikdezimeter. |
KUM | Kubikmeter pro Sekunde. |
KVA | Kilovoltampere (kVA). |
KWH | Kilowatt-hour. |
KWR | Kilovolt ampere reactive hours (KVAH reac.). |
LBH | US Pound per Hour (lb/hour). |
LBM | US Pound per minute (lb/min). |
LG2 | Liter per Gram per Centimeter (l/g/cm). |
LGC | Liters per Gram-Centimeters (l/g-cm). |
LHK | Liter per 100 km (l/100 km). |
LIF | Lifts. |
LIM | Link. |
LIQ | Liquid Pounds. |
LIT | Liter. |
LMI | Liter per Minute (l/min). |
LMS | Liter per Molsecond (l/mol.s). |
LOA | Load. |
LOT | Lot. |
LPD | Light Point Defects per Wafer (LPD/Wafer). |
LPH | Liter per hour (l/hr). |
LUG | Lug. |
M15 | Micron per 15 Square Millimeters (mu per 15 sq mm). |
M20 | Micron per 20 Square Millimeters (mu per 20 sq mm). |
M25 | Micron per 25 Square Millimeters (mu per 25 sq mm). |
M26 | Micron per 26 by 8 Millimeters (mu per 26 by 8 mm). |
M2G | Meters square per gram (m sq per gram). |
M3A | Sales m3 at 15 °C, 1 atmos (Sm3_15C_S). |
M3B | Sales m3 at 21 °C, 1 atmos (Sm3_21C_S). |
M3C | Sales m3 at 10 °C, 1 atmos (Sm3_10C_S). |
M3D | Sales m3 at 43 °C, 1 bar (Sm3_43C_D). |
M3E | Sales m3 at 9 °C, 1 bar (Sm3_9C_D). |
M3F | Sales m3 at 15 °C, 1 bar (Sm3_15C_D). |
M3G | Sales m3 at 27 °C, 1 atmos (Sm3_27C_S). |
M3H | Cubic Meter per Hour (m3/h). |
M3J | Sales m3 at 35 °C, 1 atmos (Sm3_35C_S). |
M3K | Cubic Meter/Kilogram (m3/Kg). |
M3M | Milliliter per Cubic Meter (ml/m3). |
M3N | Mol per Cubic Meter (Mol/m3). |
MAM | Milliamps/mm. |
MAT | Mat. |
MBY | Megabyte. |
MBZ | Meterbar per Second (m.bar/s). |
MC2 | Millisecond per Centimeter (mS/cm). |
MCA | Microampere (µA). |
MCG | Microgram. |
MCH | Micromhos (µmhos). |
MCK | Microcuries per Kilogram (µci/kg). |
MCL | Microcuries per Gaseous Liter (µc/l). |
MCM | Milligrams Per Cubic Meter. |
MCN | Metal Can. |
MCP | Manifolded Cylinder Pack. |
MCR | Micron. |
MEG | Megagram. |
MEH | Megahertz. |
MEJ | Megajoule (MJ). |
MEP | Megapascal. |
MET | Meter. |
MEW | Megawatt. |
MFD | Microfarad (µF). |
MGA | Milligram per Amp (mg per amp). |
MGF | Milligram per Square Centimeter (mg/cm2). |
MGG | Milligram per Gram (mg/g). |
MGL | Microgram per Liter (µg/l). |
MGM | Milligram. |
MGO | Megohm (MOhm). |
MGR | Micrograms per Gram (µg/g). |
MGS | Milligram per Second (mg per sec). |
MH1 | Millimeter per Hour (mm/h). |
MHC | Micromhos per Centimeter (µmhos/cm). |
MHR | Meter per Hour (m/h). |
MHV | Megavolt. |
MIB | Million BTU's. |
MIC | Mikrogram/cubic meter. |
MIG | Micrograms Per Cubic Meter. |
MIL | Mile. |
MIM | Micrometer. |
MIN | Minute. |
MIP | Millipascal seconds. |
MIS | Microsecond. |
MIT | Miter. |
MIV | Millivolt. |
MIW | Milliwatt. |
MJM | Wobbe Number (MJ/m3). |
MJO | Millijoule. |
MKG | Milligrams of KOH per Gram (mg KOH per g). |
MKL | Millimol per Gram (mmol/g). |
ML1 | Milliliter per Liter (ml/l). |
ML2 | Milliliter per Liter (ml/l). |
ML3 | Mol per Liter (Mol/Liter). |
ML4 | Millimol per Liter (Millimol/l). |
MLA | Milliampere. |
MLB | Millibar. |
MLC | Milligram/cubic meter. |
MLG | Milliliter per Gallon (ml per gal). |
MLI | Milliliter. |
MLK | Milligram/kilogram. |
MLL | Milligram/Liter. |
MLM | Mole per Mole (mole/mole). |
MLP | Mole Percent (% mole). |
MLR | Microliter (µl). |
MLS | Miles. |
MLW | Milliliter act. Ingr. (ml act.in.). |
MM3 | Cubic Millimeter (mm3). |
MMA | Millimeter per Year (mm/a). |
MME | Millimeter. |
MMG | Millimol/gram (mmol/g). |
MMH | Millimeter H20. |
MMK | Millimol/kilogram. |
MMM | 0.000001 meter (1 millionth of a meter). (Micrometer/Micron). |
MMN | Meter per Minute (m/min). |
MMO | Millimol. |
MMS | Millimeter per Second (mm/s). |
MNM | Millinewton per meter (mN/m). |
MNT | Meganewton (MN). |
MOK | Mol/kilogram. |
MOL | Mol. |
MON | Month. |
MPB | Mass parts per billion (ppb(m)). |
MPG | Miles per Gallon (US) (Mi/Gal(US)). |
MPH | Megagrams Per Hour. |
MPM | Mass Parts per Million (ppm(m)). |
MPT | Mass Parts per Trillion (ppt(m)). |
MPZ | Meterpascal per Second (m.Pa/s). |
MQG | Mircoequivalent per Gram (microeq/g). |
MRF | Millifarad (mF). |
MS1 | MilliSiemen per Centimeter (mS/cm). |
MS2 | Meter per Second Squared (m/s2). |
MS3 | Microsiemens per Centimeter (µS/cm). |
MSC | Millisecond. |
MSM | Milligrams Per Square Meter. |
MTA | Millitesla. |
MTQ | Meter pro Quadratsekunde. |
MTR | Meter (m). |
MTS | Meters per second. |
MUL | Multichip - When 2 or more dies (chips) are merged into one package. |
MVA | Megavoltampere (MVA). |
MVS | Millivolts. |
MVT | Millivolt. |
MWH | Megawatt Hours (mwh). |
MWR | Megavolt Ampere Reactive Hours (MVAH reac.). |
MWT | Molecular Weight (mW). |
MYS | Micro Siemens (mic. Siem.). |
N2M | Newton/Square millimeter (N/mm2). |
NAA | Nanoamps. |
NAM | Nanometer. |
NAS | Nanosecond. |
NEB | Net Barrels. |
NEG | Net Gallons. |
NEI | Net Imperial Gallons. |
NEL | Net Liters. |
NEW | Newton. |
NM2 | Newton per Square Meter (N/m²). |
NM3 | Normal m3 at 0°C, 1 atmos (Normal m3). |
NMH | Newton per Hour (N/h). |
NMM | Newton per Millimeter (N/mm). |
NMR | Normal m3 per Hour (Nm3/h). |
NOL | Normality. |
NPK | Nowpac Container (Nowpac). |
NRG | Bar Gauge. |
NRU | Nanofarad (nF). |
NTU | Nephelometric Turbidity Units (NTU). |
NTY | Equivalents per Liter (equ/l). |
NUM | Numbers. |
NWM | Newton per Meter (N/m). |
NXM | Newton per 25 mm (N/25mm). |
O2P | Percent Oxygen (% Oxygen). |
OCT | Ohm/ct. |
OHC | Ohm-Centimeter (ohm cm). |
OHM | Ohm. |
OMM | Ohm/mm. |
ONE | One. |
OPH | Operating hour (Oper. Hour). |
OSQ | Ohm/sq. |
OTP | One Thousand Pieces. |
OUN | Ounce. |
OVI | Ohm/via. |
OZG | Ounce per Gallon (oz per gal). |
PAC | Parcel. |
PAD | Pad. |
PAG | Package. |
PAI | Pail. |
PAK | Pack (PAK). |
PAL | Pallet. |
PAN | Panel. |
PAR | Pair. |
PAS | Pascal. |
PAT | Packet. |
PBA | PPBA Silicon (ppba Si). |
PBW | Parts Per Billion by Weight (ppbw). |
PC2 | Parts per Square Centimeters (part per sq cm). |
PCA | Percent Active (% Active). |
PCL | Picocuries per Liter (pCi/l). |
PEC | Percent. |
PEG | Percentage. |
PEH | Percent Per 1000 Hours. |
PEN | Pennyweight. |
PER | Per Hundred Pieces. |
PEW | Percent Weight. |
PF3 | Per Cubic Foot (per cu ft). |
PF4 | Particles per Cubic Feet (particles per cu ft). |
PFA | Percent Failed Area (Failed Area %). |
PFR | Picofarad. |
PH | PH Factor (pH). |
PI2 | Parts per Square Inch (part per sq in). |
PID | Pint U.S. Dry. |
PIE | Piece. |
PIL | Pint - US liquid. |
PL1 | Parts per Liter (parts per l). |
PL2 | Parts per Milliliter (parts per ml). |
PL3 | Part per Millilitre (Part/ml). |
PLA | Plate. |
PLI | Pounds per Linear Inch (lb/Lin. In). |
PLL | Pallet (Lift). |
PLR | Per Liter. |
PLT | Palette. |
PLU | Pallet/Unit Load. |
PMA | Percent Mass (%(m)). |
PMI | Per Mille (%0). |
PML | Particles per Milliliter (particles/mL). |
PMO | Per Mille mass (%0(mass)). |
PMP | Parts Per Million Platinum (ppm Pt). |
PMV | Parts Per Million (weight/Vol) (ppm (w/v)). |
PMW | Parts Per Million by Weight (ppmw). |
PNJ | Particles per Injection (particles per inj). |
PNT | Points. |
POF | Pounds Per Foot. |
POG | Pounds Per Gallon. |
PON | Pound. |
POP | Pounds Per Piece of Product. |
POR | Pores. |
POS | Pounds Per 1000 Square Feet. |
POT | Pounds Per Thousand. |
PP3 | Parts per Million mole (ppm mole). |
PP4 | Parts per Billion Mole (ppb mole). |
PPB | Parts per billion (US). |
PPF | Parts per Ft3 (Parts/Ft3). |
PPH | Parts Per Hundred (pph). |
PPM | Parts per million. |
PPP | Pounds Per Pound of Product. |
PPT | Parts per Trillion (ppt). |
PRS | Number of Persons. |
PSA | Pounds per Square Inch Absolute. |
PSC | Picosecond. |
PSG | Pound per Square Inch Gauge (psi gauge). |
PSI | PSI Unit (PSI). |
PSS | Pascal second. |
PSV | Poise. |
PTL | Particles per Liter (Part/Liter). |
PWF | Particles per Wafer (particles/wf). |
QML | Kilomol (kmol). |
QUA | Quart - US liquid. |
RAC | Rack. |
REA | Ream of 500 Sheets. |
REE | Reel. |
RIN | Ring. |
RLU | Relative Light Unit (RLU). |
ROD | Rod. |
ROL | Roll. |
RPM | Revolutions per Minute (Revs/min). |
SAC | Sack. |
SBB | Super Bulk Bag. |
SCL | Scales. |
SEC | Second. |
SET | Set. |
SHE | Sheet. |
SHI | Shipment. |
SHM | Sheet - Metric measure. |
SHO | Shot. |
SID | Disk (Disc). |
SIE | Siemens per Meter (Siemens/m). |
SKE | Skein. |
SKI | Skid. |
SLE | Sleeve. |
SLI | Slip Sheet. |
SMI | Square mile. |
SMM | Square millimeter. |
SPO | Spool. |
SQF | Square foot. |
SQI | Square inch. |
SQK | Square kilometer. |
SQM | Square meter. |
SQS | Square meter/second. |
SQU | Square. |
SQY | Square Yard. |
STI | Stick. |
STM | Statute Mile. |
STP | Steps. |
STR | Strip. |
STU | Stabilizer Units (SU). |
SVU | Say Bolt Viscosity Units (SVU). |
TAB | Tablet. |
TAN | Tank. |
TAR | Target pieces (target). |
TAT | Tank Truck. |
TES | Tesla. |
THO | Thousand. |
TM3 | 1/Cubic Meter (1/m3). |
TNN | Tonne. |
TOM | Ton per Cubic Meter (t/m3). |
TON | Ton. |
TOR | Torr. |
TOT | Tote. |
TPT | Pass Test (Pass). |
TRA | Train. |
TRF | Track Foot. |
TRL | Trailer. |
TRO | Troy. |
TRU | Truckload. |
TRY | Tray. |
TRZ | Troy OZ. |
TUB | Tube. |
ULU | Unitless Unit of Measure. |
UNT | Unit. |
USG | US gallon. |
USP | US pound. |
UST | US ton. |
VAL | VO mat. (Value). |
VAP | Voltampere (VA). |
VHN | Vickers Micro-Hardness (VHN10). |
VIA | Vial. |
VMP | Molar %. |
VOL | Volt. |
VPB | Volume Parts per Billion (ppb(V)). |
VPC | Percent Volume (%(V)). |
VPM | Volume Parts per Million (ppm(V)). |
VPR | Per Mille Volume (%O(V)). |
VPT | Volume parts per Trillion (ppt(V)). |
VTA | Volts (Alternating Current). |
VTD | Volts (Direct Current). |
VTM | Volts Per Meter. |
WAF | Wafer. |
WAR | Watt. |
WEE | Week. |
WPT | Parts Per Trillion by Weight (pptw). |
WRA | Wrap. |
YAR | Yard. |
YEA | Year. |
No | Name | Definition |
---|
1 | anyURI | Represents a URI as defined by RFC 2396. An anyURI value can be absolute or relative, and may have an optional fragment identifier. |
2 | boolean | Represents Boolean values, which are either "true" or "false". |
3 | dateTime | Represents a specific instance of time. The pattern for dateTime is CCYY-MM-DDThh:mm:ss where CC represents the century, YY the year, MM the month, and DD the day, preceded by an optional leading negative (-) character to indicate a negative number. If the negative character is omitted, positive (+) is assumed. The T is the date/time separator and hh, mm, and ss represent hour, minute, and second respectively. Additional digits can be used to increase the precision of fractional seconds if desired. For example, the format ss.ss... with any number of digits after the decimal point is supported. The fractional seconds part is optional. This representation may be immediately followed by a "Z" to indicate Coordinated Universal Time (UTC) or to indicate the time zone. For example, the difference between the local time and Coordinated Universal Time, immediately followed by a sign, + or -, followed by the difference from UTC represented as hh:mm (minutes is required). If the time zone is included, both hours and minutes must be present. |
4 | decimal | A data type that contains decimal numbers scaled by a power of 10. |
5 | float | Represents single-precision 32-bit floating-point numbers. |
6 | integer | Represents a sequence of decimal digits with an optional leading sign (+ or -). This data type is derived from decimal. |
7 | positiveInteger | Represents an integer that is greater than zero. This data type is derived from nonNegativeInteger. |
8 | string | Represents character string. |